A Mathematical Model for Detection of Back-Scattered Radiation during Diagnostic Scanning with a Narrow X-Ray Beam View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2009-09

AUTHORS

A. A. Buckley, L. V. Vladimirov, A. A. Kozlov

ABSTRACT

A mathematical model for detection of foreign impurities in the inspected object with the use of a narrow scanning X-ray beam is suggested. A generalized expression for signal/noise ratio for the diagnostic system with a detector of the back-scattered radiation was derived.

PAGES

221-224

Journal

TITLE

Biomedical Engineering

ISSUE

5

VOLUME

43

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s10527-010-9129-1

DOI

http://dx.doi.org/10.1007/s10527-010-9129-1

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1048862196


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