Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy View Full Text


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Article Info

DATE

2001-03

AUTHORS

N. Sasaki, M. Tsukada

ABSTRACT

. An exact analytical formula of the frequency shift and dissipated power in noncontact atomic force microscopy (nc-AFM) is obtained, in the case of a tip–surface interaction force with an inverse power law. The frequency shift for various tip shapes is evaluated. It is confirmed that the tip-height dependence of the analytical frequency shift shows very good agreement with that of the experimental one. The tip-height dependence of the dissipated power derived from a Langevin equation approach is also evaluated. More... »

PAGES

s39-s42

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s003390100632

DOI

http://dx.doi.org/10.1007/s003390100632

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1038224417


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