Ultrashort-pulse laser ablation of indium phosphide in air View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2001-01

AUTHORS

J. Bonse, J.M. Wrobel, J. Krüger, W. Kautek

ABSTRACT

Ablation of indium phosphide wafers in air was performed with low repetition rate ultrashort laser pulses (130 fs, 10 Hz) of 800 nm wavelength. The relationships between the dimensions of the craters and the ablation parameters were analyzed. The ablation threshold fluence depends on the number of pulses applied to the same spot. The single-pulse ablation threshold value was estimated to be φth(1)=0.16 J/cm2. The dependence of the threshold fluence on the number of laser pulses indicates an incubation effect. Morphological and chemical changes of the ablated regions were characterized by means of scanning electron microscopy and Auger electron spectroscopy. More... »

PAGES

89-94

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s003390000596

DOI

http://dx.doi.org/10.1007/s003390000596

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1004375490


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0306", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Chemistry (incl. Structural)", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/03", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Chemical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Federal Institute For Materials Research and Testing", 
          "id": "https://www.grid.ac/institutes/grid.71566.33", 
          "name": [
            "Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany (Fax: +49-30/8104-1827, E-mail: joern.bonse@bam.de), DE"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bonse", 
        "givenName": "J.", 
        "id": "sg:person.015321462321.14", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015321462321.14"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Missouri", 
          "id": "https://www.grid.ac/institutes/grid.134936.a", 
          "name": [
            "Department of Physics, University of Missouri \u2013 KC, Kansas City, MO 64110, USA, US"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Wrobel", 
        "givenName": "J.M.", 
        "id": "sg:person.01220577274.11", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01220577274.11"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Federal Institute For Materials Research and Testing", 
          "id": "https://www.grid.ac/institutes/grid.71566.33", 
          "name": [
            "Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany (Fax: +49-30/8104-1827, E-mail: joern.bonse@bam.de), DE"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kr\u00fcger", 
        "givenName": "J.", 
        "id": "sg:person.01313426172.45", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01313426172.45"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Federal Institute For Materials Research and Testing", 
          "id": "https://www.grid.ac/institutes/grid.71566.33", 
          "name": [
            "Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany (Fax: +49-30/8104-1827, E-mail: joern.bonse@bam.de), DE"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kautek", 
        "givenName": "W.", 
        "id": "sg:person.01034457723.23", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01034457723.23"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2001-01", 
    "datePublishedReg": "2001-01-01", 
    "description": "Ablation of indium phosphide wafers in air was performed with low repetition rate ultrashort laser pulses (130 fs, 10 Hz) of 800 nm wavelength. The relationships between the dimensions of the craters and the ablation parameters were analyzed. The ablation threshold fluence depends on the number of pulses applied to the same spot. The single-pulse ablation threshold value was estimated to be \u03c6th(1)=0.16 J/cm2. The dependence of the threshold fluence on the number of laser pulses indicates an incubation effect. Morphological and chemical changes of the ablated regions were characterized by means of scanning electron microscopy and Auger electron spectroscopy.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s003390000596", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1022207", 
        "issn": [
          "0947-8396", 
          "1432-0630"
        ], 
        "name": "Applied Physics A", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "1", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "72"
      }
    ], 
    "name": "Ultrashort-pulse laser ablation of indium phosphide in air", 
    "pagination": "89-94", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "14d944c63ad6b86b717d3268f7aea2115b93074181116838c3b72b4bb31f6331"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s003390000596"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1004375490"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s003390000596", 
      "https://app.dimensions.ai/details/publication/pub.1004375490"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T21:29", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8687_00000479.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007/s003390000596"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

85 TRIPLES      20 PREDICATES      27 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s003390000596 schema:about anzsrc-for:03
2 anzsrc-for:0306
3 schema:author N4b564882833f4ef3bb51421bf8348e37
4 schema:datePublished 2001-01
5 schema:datePublishedReg 2001-01-01
6 schema:description Ablation of indium phosphide wafers in air was performed with low repetition rate ultrashort laser pulses (130 fs, 10 Hz) of 800 nm wavelength. The relationships between the dimensions of the craters and the ablation parameters were analyzed. The ablation threshold fluence depends on the number of pulses applied to the same spot. The single-pulse ablation threshold value was estimated to be φth(1)=0.16 J/cm2. The dependence of the threshold fluence on the number of laser pulses indicates an incubation effect. Morphological and chemical changes of the ablated regions were characterized by means of scanning electron microscopy and Auger electron spectroscopy.
7 schema:genre research_article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N0ac8f44c07bd48c79c96d4cf0d115443
11 N98837ee27a26468bb5ea7e617612c341
12 sg:journal.1022207
13 schema:name Ultrashort-pulse laser ablation of indium phosphide in air
14 schema:pagination 89-94
15 schema:productId N195a599e13724323a60fe2c45c31efef
16 N3b583eabfa2f4d72b868981fb9ac3336
17 N59726699211f4e9f9a4a6a4d09c3506d
18 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004375490
19 https://doi.org/10.1007/s003390000596
20 schema:sdDatePublished 2019-04-10T21:29
21 schema:sdLicense https://scigraph.springernature.com/explorer/license/
22 schema:sdPublisher Ncdf363b57f264efd9bbbf0bbe1c40090
23 schema:url http://link.springer.com/10.1007/s003390000596
24 sgo:license sg:explorer/license/
25 sgo:sdDataset articles
26 rdf:type schema:ScholarlyArticle
27 N0ac8f44c07bd48c79c96d4cf0d115443 schema:volumeNumber 72
28 rdf:type schema:PublicationVolume
29 N195a599e13724323a60fe2c45c31efef schema:name readcube_id
30 schema:value 14d944c63ad6b86b717d3268f7aea2115b93074181116838c3b72b4bb31f6331
31 rdf:type schema:PropertyValue
32 N3b583eabfa2f4d72b868981fb9ac3336 schema:name dimensions_id
33 schema:value pub.1004375490
34 rdf:type schema:PropertyValue
35 N4b564882833f4ef3bb51421bf8348e37 rdf:first sg:person.015321462321.14
36 rdf:rest Nbe1b4e4b5b0c45b084b3606db84ad05b
37 N592be603584e4507a1ba83514140acbc rdf:first sg:person.01313426172.45
38 rdf:rest N67b2138f22bb43a3b59735f109b90a4f
39 N59726699211f4e9f9a4a6a4d09c3506d schema:name doi
40 schema:value 10.1007/s003390000596
41 rdf:type schema:PropertyValue
42 N67b2138f22bb43a3b59735f109b90a4f rdf:first sg:person.01034457723.23
43 rdf:rest rdf:nil
44 N98837ee27a26468bb5ea7e617612c341 schema:issueNumber 1
45 rdf:type schema:PublicationIssue
46 Nbe1b4e4b5b0c45b084b3606db84ad05b rdf:first sg:person.01220577274.11
47 rdf:rest N592be603584e4507a1ba83514140acbc
48 Ncdf363b57f264efd9bbbf0bbe1c40090 schema:name Springer Nature - SN SciGraph project
49 rdf:type schema:Organization
50 anzsrc-for:03 schema:inDefinedTermSet anzsrc-for:
51 schema:name Chemical Sciences
52 rdf:type schema:DefinedTerm
53 anzsrc-for:0306 schema:inDefinedTermSet anzsrc-for:
54 schema:name Physical Chemistry (incl. Structural)
55 rdf:type schema:DefinedTerm
56 sg:journal.1022207 schema:issn 0947-8396
57 1432-0630
58 schema:name Applied Physics A
59 rdf:type schema:Periodical
60 sg:person.01034457723.23 schema:affiliation https://www.grid.ac/institutes/grid.71566.33
61 schema:familyName Kautek
62 schema:givenName W.
63 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01034457723.23
64 rdf:type schema:Person
65 sg:person.01220577274.11 schema:affiliation https://www.grid.ac/institutes/grid.134936.a
66 schema:familyName Wrobel
67 schema:givenName J.M.
68 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01220577274.11
69 rdf:type schema:Person
70 sg:person.01313426172.45 schema:affiliation https://www.grid.ac/institutes/grid.71566.33
71 schema:familyName Krüger
72 schema:givenName J.
73 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01313426172.45
74 rdf:type schema:Person
75 sg:person.015321462321.14 schema:affiliation https://www.grid.ac/institutes/grid.71566.33
76 schema:familyName Bonse
77 schema:givenName J.
78 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015321462321.14
79 rdf:type schema:Person
80 https://www.grid.ac/institutes/grid.134936.a schema:alternateName University of Missouri
81 schema:name Department of Physics, University of Missouri – KC, Kansas City, MO 64110, USA, US
82 rdf:type schema:Organization
83 https://www.grid.ac/institutes/grid.71566.33 schema:alternateName Federal Institute For Materials Research and Testing
84 schema:name Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin, Germany (Fax: +49-30/8104-1827, E-mail: joern.bonse@bam.de), DE
85 rdf:type schema:Organization
 




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