Minimized thermal conductivity in highly stable thermal barrier W/ZrO2 multilayers View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2016-10

AUTHORS

Florian Döring, Anna Major, Christian Eberl, Hans-Ulrich Krebs

ABSTRACT

Nanoscale thin-film multilayer materials are of great research interest since their large number of interfaces can strongly hinder phonon propagation and lead to a minimized thermal conductivity. When such materials provide a sufficiently small thermal conductivity and feature in addition also a high thermal stability, they would be possible candidates for high-temperature applications such as thermal barrier coatings. For this article, we have used pulsed laser deposition in order to fabricate thin multilayers out of the thermal barrier material ZrO2 in combination with W, which has both a high melting point and high density. Layer thicknesses were designed such that bulk thermal conductivity is governed by the low value of ZrO2, while ultrathin W blocking layers provide a high number of interfaces. By this phonon scattering, reflection and shortening of mean free path lead to a significant reduction in overall thermal conductivity even below the already low value of ZrO2. In addition to this, X-ray reflectivity measurements were taken showing strong Bragg peaks even after annealing such multilayers at 1300 K. Those results identify W/ZrO2 multilayers as desired thermally stable, low-conductivity materials. More... »

PAGES

872

References to SciGraph publications

Journal

TITLE

Applied Physics A

ISSUE

10

VOLUME

122

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s00339-016-0405-0

DOI

http://dx.doi.org/10.1007/s00339-016-0405-0

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1005052276


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