Spectroscopic analysis of packaging concepts for high-power diode laser bars View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2012-05

AUTHORS

Martin Hempel, Mathias Ziegler, Sandy Schwirzke-Schaaf, Jens W. Tomm, Denny Jankowski, Dominic Schröder

ABSTRACT

Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy. More... »

PAGES

371-377

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s00339-012-6799-4

DOI

http://dx.doi.org/10.1007/s00339-012-6799-4

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1050954012


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0910", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Manufacturing Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy", 
          "id": "https://www.grid.ac/institutes/grid.419569.6", 
          "name": [
            "Max-Born-Institut, Max-Born-Str. 2A, 12489, Berlin, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hempel", 
        "givenName": "Martin", 
        "id": "sg:person.010755654454.78", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010755654454.78"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Federal Institute For Materials Research and Testing", 
          "id": "https://www.grid.ac/institutes/grid.71566.33", 
          "name": [
            "Fachgruppe VIII.4, Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, 12200, Berlin, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ziegler", 
        "givenName": "Mathias", 
        "id": "sg:person.014735450745.10", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014735450745.10"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy", 
          "id": "https://www.grid.ac/institutes/grid.419569.6", 
          "name": [
            "Max-Born-Institut, Max-Born-Str. 2A, 12489, Berlin, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Schwirzke-Schaaf", 
        "givenName": "Sandy", 
        "id": "sg:person.010754101213.46", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010754101213.46"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy", 
          "id": "https://www.grid.ac/institutes/grid.419569.6", 
          "name": [
            "Max-Born-Institut, Max-Born-Str. 2A, 12489, Berlin, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Tomm", 
        "givenName": "Jens W.", 
        "id": "sg:person.013312125473.62", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013312125473.62"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "JENOPTIK Laser GmbH, Goeschwitzer Strasse 29, 07745, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Jankowski", 
        "givenName": "Denny", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "JENOPTIK Laser GmbH, Goeschwitzer Strasse 29, 07745, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Schr\u00f6der", 
        "givenName": "Dominic", 
        "id": "sg:person.011114760457.98", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011114760457.98"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/j.mssp.2006.01.062", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012463982"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1117/12.809997", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023535124"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1117/12.700021", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1042481475"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1049/el:20058180", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056795975"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.125064", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057689187"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1533091", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057717255"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1579567", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057722453"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2089150", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057837463"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2189189", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057844679"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2424644", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057856063"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2917314", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057884354"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.2927497", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057885002"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.3055356", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057901411"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.370870", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058005279"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1109/6144.833048", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1061202173"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1109/lpt.2007.898820", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1061369209"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2012-05", 
    "datePublishedReg": "2012-05-01", 
    "description": "Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s00339-012-6799-4", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1022207", 
        "issn": [
          "0947-8396", 
          "1432-0630"
        ], 
        "name": "Applied Physics A", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "2", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "107"
      }
    ], 
    "name": "Spectroscopic analysis of packaging concepts for high-power diode laser bars", 
    "pagination": "371-377", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "f2ba2adcb0cbb644abfcdc532ed8807767799946b2d7f8cac99532f2e05f87d9"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s00339-012-6799-4"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1050954012"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s00339-012-6799-4", 
      "https://app.dimensions.ai/details/publication/pub.1050954012"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T19:53", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8681_00000491.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007/s00339-012-6799-4"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

149 TRIPLES      21 PREDICATES      43 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s00339-012-6799-4 schema:about anzsrc-for:09
2 anzsrc-for:0910
3 schema:author N5bf4b3e383384086840a635ab64e6d53
4 schema:citation https://doi.org/10.1016/j.mssp.2006.01.062
5 https://doi.org/10.1049/el:20058180
6 https://doi.org/10.1063/1.125064
7 https://doi.org/10.1063/1.1533091
8 https://doi.org/10.1063/1.1579567
9 https://doi.org/10.1063/1.2089150
10 https://doi.org/10.1063/1.2189189
11 https://doi.org/10.1063/1.2424644
12 https://doi.org/10.1063/1.2917314
13 https://doi.org/10.1063/1.2927497
14 https://doi.org/10.1063/1.3055356
15 https://doi.org/10.1063/1.370870
16 https://doi.org/10.1109/6144.833048
17 https://doi.org/10.1109/lpt.2007.898820
18 https://doi.org/10.1117/12.700021
19 https://doi.org/10.1117/12.809997
20 schema:datePublished 2012-05
21 schema:datePublishedReg 2012-05-01
22 schema:description Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy.
23 schema:genre research_article
24 schema:inLanguage en
25 schema:isAccessibleForFree false
26 schema:isPartOf N84d0ec5ee2fe4e92a160db8496799963
27 Ncc62427b4da34afe8ebbab24406cf374
28 sg:journal.1022207
29 schema:name Spectroscopic analysis of packaging concepts for high-power diode laser bars
30 schema:pagination 371-377
31 schema:productId N250c4be78c2c48078b5222d741cabf7c
32 N2c768b0afcd14447b601b6177db69949
33 N9e21c9c1e9c1435a89a2dbb7ada60826
34 schema:sameAs https://app.dimensions.ai/details/publication/pub.1050954012
35 https://doi.org/10.1007/s00339-012-6799-4
36 schema:sdDatePublished 2019-04-10T19:53
37 schema:sdLicense https://scigraph.springernature.com/explorer/license/
38 schema:sdPublisher N4f469810b06d4ffca9abc956903d6de6
39 schema:url http://link.springer.com/10.1007/s00339-012-6799-4
40 sgo:license sg:explorer/license/
41 sgo:sdDataset articles
42 rdf:type schema:ScholarlyArticle
43 N145b4e1efffa4d4f9844a7be0d49b9b5 rdf:first sg:person.014735450745.10
44 rdf:rest N5d39f1e098914d09bf778b11094d1ee2
45 N250c4be78c2c48078b5222d741cabf7c schema:name readcube_id
46 schema:value f2ba2adcb0cbb644abfcdc532ed8807767799946b2d7f8cac99532f2e05f87d9
47 rdf:type schema:PropertyValue
48 N2c768b0afcd14447b601b6177db69949 schema:name dimensions_id
49 schema:value pub.1050954012
50 rdf:type schema:PropertyValue
51 N4f469810b06d4ffca9abc956903d6de6 schema:name Springer Nature - SN SciGraph project
52 rdf:type schema:Organization
53 N5bf4b3e383384086840a635ab64e6d53 rdf:first sg:person.010755654454.78
54 rdf:rest N145b4e1efffa4d4f9844a7be0d49b9b5
55 N5d39f1e098914d09bf778b11094d1ee2 rdf:first sg:person.010754101213.46
56 rdf:rest N5d559626f85b413081ee118b905a4ed5
57 N5d559626f85b413081ee118b905a4ed5 rdf:first sg:person.013312125473.62
58 rdf:rest N72592a592be04372b2691e86dd5f1db4
59 N72592a592be04372b2691e86dd5f1db4 rdf:first N7ba0e249d9d1462789d8418a49258f7c
60 rdf:rest N9b19835666994157a1fcf23bb8ac492a
61 N7ba0e249d9d1462789d8418a49258f7c schema:affiliation https://www.grid.ac/institutes/grid.436091.9
62 schema:familyName Jankowski
63 schema:givenName Denny
64 rdf:type schema:Person
65 N84d0ec5ee2fe4e92a160db8496799963 schema:volumeNumber 107
66 rdf:type schema:PublicationVolume
67 N9b19835666994157a1fcf23bb8ac492a rdf:first sg:person.011114760457.98
68 rdf:rest rdf:nil
69 N9e21c9c1e9c1435a89a2dbb7ada60826 schema:name doi
70 schema:value 10.1007/s00339-012-6799-4
71 rdf:type schema:PropertyValue
72 Ncc62427b4da34afe8ebbab24406cf374 schema:issueNumber 2
73 rdf:type schema:PublicationIssue
74 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
75 schema:name Engineering
76 rdf:type schema:DefinedTerm
77 anzsrc-for:0910 schema:inDefinedTermSet anzsrc-for:
78 schema:name Manufacturing Engineering
79 rdf:type schema:DefinedTerm
80 sg:journal.1022207 schema:issn 0947-8396
81 1432-0630
82 schema:name Applied Physics A
83 rdf:type schema:Periodical
84 sg:person.010754101213.46 schema:affiliation https://www.grid.ac/institutes/grid.419569.6
85 schema:familyName Schwirzke-Schaaf
86 schema:givenName Sandy
87 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010754101213.46
88 rdf:type schema:Person
89 sg:person.010755654454.78 schema:affiliation https://www.grid.ac/institutes/grid.419569.6
90 schema:familyName Hempel
91 schema:givenName Martin
92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010755654454.78
93 rdf:type schema:Person
94 sg:person.011114760457.98 schema:affiliation https://www.grid.ac/institutes/grid.436091.9
95 schema:familyName Schröder
96 schema:givenName Dominic
97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011114760457.98
98 rdf:type schema:Person
99 sg:person.013312125473.62 schema:affiliation https://www.grid.ac/institutes/grid.419569.6
100 schema:familyName Tomm
101 schema:givenName Jens W.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013312125473.62
103 rdf:type schema:Person
104 sg:person.014735450745.10 schema:affiliation https://www.grid.ac/institutes/grid.71566.33
105 schema:familyName Ziegler
106 schema:givenName Mathias
107 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014735450745.10
108 rdf:type schema:Person
109 https://doi.org/10.1016/j.mssp.2006.01.062 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012463982
110 rdf:type schema:CreativeWork
111 https://doi.org/10.1049/el:20058180 schema:sameAs https://app.dimensions.ai/details/publication/pub.1056795975
112 rdf:type schema:CreativeWork
113 https://doi.org/10.1063/1.125064 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057689187
114 rdf:type schema:CreativeWork
115 https://doi.org/10.1063/1.1533091 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057717255
116 rdf:type schema:CreativeWork
117 https://doi.org/10.1063/1.1579567 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057722453
118 rdf:type schema:CreativeWork
119 https://doi.org/10.1063/1.2089150 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057837463
120 rdf:type schema:CreativeWork
121 https://doi.org/10.1063/1.2189189 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057844679
122 rdf:type schema:CreativeWork
123 https://doi.org/10.1063/1.2424644 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057856063
124 rdf:type schema:CreativeWork
125 https://doi.org/10.1063/1.2917314 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057884354
126 rdf:type schema:CreativeWork
127 https://doi.org/10.1063/1.2927497 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057885002
128 rdf:type schema:CreativeWork
129 https://doi.org/10.1063/1.3055356 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057901411
130 rdf:type schema:CreativeWork
131 https://doi.org/10.1063/1.370870 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058005279
132 rdf:type schema:CreativeWork
133 https://doi.org/10.1109/6144.833048 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061202173
134 rdf:type schema:CreativeWork
135 https://doi.org/10.1109/lpt.2007.898820 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061369209
136 rdf:type schema:CreativeWork
137 https://doi.org/10.1117/12.700021 schema:sameAs https://app.dimensions.ai/details/publication/pub.1042481475
138 rdf:type schema:CreativeWork
139 https://doi.org/10.1117/12.809997 schema:sameAs https://app.dimensions.ai/details/publication/pub.1023535124
140 rdf:type schema:CreativeWork
141 https://www.grid.ac/institutes/grid.419569.6 schema:alternateName Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy
142 schema:name Max-Born-Institut, Max-Born-Str. 2A, 12489, Berlin, Germany
143 rdf:type schema:Organization
144 https://www.grid.ac/institutes/grid.436091.9 schema:alternateName Jenoptik (Germany)
145 schema:name JENOPTIK Laser GmbH, Goeschwitzer Strasse 29, 07745, Jena, Germany
146 rdf:type schema:Organization
147 https://www.grid.ac/institutes/grid.71566.33 schema:alternateName Federal Institute For Materials Research and Testing
148 schema:name Fachgruppe VIII.4, Bundesanstalt für Materialforschung und -prüfung, 12200, Berlin, Germany
149 rdf:type schema:Organization
 




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