Viscous flow and ablation pressure phenomena in nanosecond UV laser irradiation of polymers View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2004-09

AUTHORS

V.N. Tokarev, S. Lazare, C. Belin, D. Debarre

ABSTRACT

Acceleration and expulsion of a laser-induced melt layer in laser ablation of polymers is studied based on a combination of a quantitative theoretical modeling of ablation pressure and viscous melt flow with an experimental technique of a precise nanoscale measurement of the resulting surface profile. For two particular examples corresponding to so-called ‘stationary’ and ‘non-stationary’ liquid layer flows the following results are obtained: (i) the kinematic viscosity of the laser-induced melt layer on the surface of poly(ethylene terephthalate) at extreme conditions of KrF laser ablation is found for the first time and (ii) a new form of material removal in laser ablation is explained – expulsion of long (up to 1 mm) nanofibers with a radius of about 150–200 nm when a poly(methyl methacrylate) target is irradiated with a single pulse of a KrF excimer laser. More... »

PAGES

717-720

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s00339-004-2693-z

DOI

http://dx.doi.org/10.1007/s00339-004-2693-z

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1013046498


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0202", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Atomic, Molecular, Nuclear, Particle and Plasma Physics", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "name": [
            "Laboratoire de Physico-Chimie Mol\u00e9culaire, CNRS UMR-5803, 351 cours de la Lib\u00e9ration, 33\u2009405, Talence, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Tokarev", 
        "givenName": "V.N.", 
        "id": "sg:person.013706070411.29", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013706070411.29"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Laboratoire de Physico-Chimie Mol\u00e9culaire, CNRS UMR-5803, 351 cours de la Lib\u00e9ration, 33\u2009405, Talence, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lazare", 
        "givenName": "S.", 
        "id": "sg:person.015337120722.95", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015337120722.95"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Laboratoire de Physico-Chimie Mol\u00e9culaire, CNRS UMR-5803, 351 cours de la Lib\u00e9ration, 33\u2009405, Talence, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Belin", 
        "givenName": "C.", 
        "id": "sg:person.01002564471.71", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01002564471.71"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institut d'Electronique Fondamentale", 
          "id": "https://www.grid.ac/institutes/grid.462111.1", 
          "name": [
            "Institut d\u2019Electronique Fondamentale (IEF), UMR 8622, Universit\u00e9 Paris XI, 91\u2009405, Orsay, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Debarre", 
        "givenName": "D.", 
        "id": "sg:person.011440004061.62", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011440004061.62"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1088/0022-3727/32/13/314", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012657446"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/s00339-002-2050-z", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020324103", 
          "https://doi.org/10.1007/s00339-002-2050-z"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0169-4332(01)00595-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023244935"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0377-0257(03)00013-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1050029214"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/s0377-0257(03)00013-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1050029214"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1021/ma00157a074", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056180650"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.354333", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057971059"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.359177", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057980733"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1364/ao.35.004471", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065111232"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2004-09", 
    "datePublishedReg": "2004-09-01", 
    "description": "Acceleration and expulsion of a laser-induced melt layer in laser ablation of polymers is studied based on a combination of a quantitative theoretical modeling of ablation pressure and viscous melt flow with an experimental technique of a precise nanoscale measurement of the resulting surface profile. For two particular examples corresponding to so-called \u2018stationary\u2019 and \u2018non-stationary\u2019 liquid layer flows the following results are obtained: (i) the kinematic viscosity of the laser-induced melt layer on the surface of poly(ethylene terephthalate) at extreme conditions of KrF laser ablation is found for the first time and (ii) a new form of material removal in laser ablation is explained \u2013 expulsion of long (up to 1 mm) nanofibers with a radius of about 150\u2013200 nm when a poly(methyl methacrylate) target is irradiated with a single pulse of a KrF excimer laser.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/s00339-004-2693-z", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1022207", 
        "issn": [
          "0947-8396", 
          "1432-0630"
        ], 
        "name": "Applied Physics A", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "4-6", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "79"
      }
    ], 
    "name": "Viscous flow and ablation pressure phenomena in nanosecond UV laser irradiation of polymers", 
    "pagination": "717-720", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "3e271b973d1deb62fcb947486128f3eac70678f30ed93ad65b41c79d17a46091"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/s00339-004-2693-z"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1013046498"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/s00339-004-2693-z", 
      "https://app.dimensions.ai/details/publication/pub.1013046498"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-10T18:14", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8675_00000487.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007/s00339-004-2693-z"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/s00339-004-2693-z'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/s00339-004-2693-z'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/s00339-004-2693-z'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/s00339-004-2693-z'


 

This table displays all metadata directly associated to this object as RDF triples.

113 TRIPLES      21 PREDICATES      35 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/s00339-004-2693-z schema:about anzsrc-for:02
2 anzsrc-for:0202
3 schema:author Nedbc6f23d5654120b93246de206f4f2c
4 schema:citation sg:pub.10.1007/s00339-002-2050-z
5 https://doi.org/10.1016/s0169-4332(01)00595-5
6 https://doi.org/10.1016/s0377-0257(03)00013-2
7 https://doi.org/10.1021/ma00157a074
8 https://doi.org/10.1063/1.354333
9 https://doi.org/10.1063/1.359177
10 https://doi.org/10.1088/0022-3727/32/13/314
11 https://doi.org/10.1364/ao.35.004471
12 schema:datePublished 2004-09
13 schema:datePublishedReg 2004-09-01
14 schema:description Acceleration and expulsion of a laser-induced melt layer in laser ablation of polymers is studied based on a combination of a quantitative theoretical modeling of ablation pressure and viscous melt flow with an experimental technique of a precise nanoscale measurement of the resulting surface profile. For two particular examples corresponding to so-called ‘stationary’ and ‘non-stationary’ liquid layer flows the following results are obtained: (i) the kinematic viscosity of the laser-induced melt layer on the surface of poly(ethylene terephthalate) at extreme conditions of KrF laser ablation is found for the first time and (ii) a new form of material removal in laser ablation is explained – expulsion of long (up to 1 mm) nanofibers with a radius of about 150–200 nm when a poly(methyl methacrylate) target is irradiated with a single pulse of a KrF excimer laser.
15 schema:genre research_article
16 schema:inLanguage en
17 schema:isAccessibleForFree false
18 schema:isPartOf N84126fff39eb4d8aa5050ba9501fdd19
19 Ne7d26d03b7c24ccebad6b8ab527da0c6
20 sg:journal.1022207
21 schema:name Viscous flow and ablation pressure phenomena in nanosecond UV laser irradiation of polymers
22 schema:pagination 717-720
23 schema:productId N0b09881f241b4dd8a3a7106f9f7aaeb2
24 N1045b5bc1a2f4e319e49522bde0355f1
25 N91b5f51553a4434e8725a94fc547dd6a
26 schema:sameAs https://app.dimensions.ai/details/publication/pub.1013046498
27 https://doi.org/10.1007/s00339-004-2693-z
28 schema:sdDatePublished 2019-04-10T18:14
29 schema:sdLicense https://scigraph.springernature.com/explorer/license/
30 schema:sdPublisher N39a1844b9f1340e896f4d27b3e1cb132
31 schema:url http://link.springer.com/10.1007/s00339-004-2693-z
32 sgo:license sg:explorer/license/
33 sgo:sdDataset articles
34 rdf:type schema:ScholarlyArticle
35 N0b09881f241b4dd8a3a7106f9f7aaeb2 schema:name readcube_id
36 schema:value 3e271b973d1deb62fcb947486128f3eac70678f30ed93ad65b41c79d17a46091
37 rdf:type schema:PropertyValue
38 N0fa3084b42dd424b8962a1e47817399c rdf:first sg:person.011440004061.62
39 rdf:rest rdf:nil
40 N1045b5bc1a2f4e319e49522bde0355f1 schema:name dimensions_id
41 schema:value pub.1013046498
42 rdf:type schema:PropertyValue
43 N222a75b776ca489cad7632852516b17d schema:name Laboratoire de Physico-Chimie Moléculaire, CNRS UMR-5803, 351 cours de la Libération, 33 405, Talence, France
44 rdf:type schema:Organization
45 N39a1844b9f1340e896f4d27b3e1cb132 schema:name Springer Nature - SN SciGraph project
46 rdf:type schema:Organization
47 N49e2b227fc90488fb13ed81c09dd3c52 schema:name Laboratoire de Physico-Chimie Moléculaire, CNRS UMR-5803, 351 cours de la Libération, 33 405, Talence, France
48 rdf:type schema:Organization
49 N730790e9aeaa420bbe9a67d093db1595 rdf:first sg:person.01002564471.71
50 rdf:rest N0fa3084b42dd424b8962a1e47817399c
51 N84126fff39eb4d8aa5050ba9501fdd19 schema:issueNumber 4-6
52 rdf:type schema:PublicationIssue
53 N91b5f51553a4434e8725a94fc547dd6a schema:name doi
54 schema:value 10.1007/s00339-004-2693-z
55 rdf:type schema:PropertyValue
56 N95cfdaf8ad7a4dc59f7fa7b0842d1e5f schema:name Laboratoire de Physico-Chimie Moléculaire, CNRS UMR-5803, 351 cours de la Libération, 33 405, Talence, France
57 rdf:type schema:Organization
58 Nc6ef7a62a9914a39a6039592af3fdafa rdf:first sg:person.015337120722.95
59 rdf:rest N730790e9aeaa420bbe9a67d093db1595
60 Ne7d26d03b7c24ccebad6b8ab527da0c6 schema:volumeNumber 79
61 rdf:type schema:PublicationVolume
62 Nedbc6f23d5654120b93246de206f4f2c rdf:first sg:person.013706070411.29
63 rdf:rest Nc6ef7a62a9914a39a6039592af3fdafa
64 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
65 schema:name Physical Sciences
66 rdf:type schema:DefinedTerm
67 anzsrc-for:0202 schema:inDefinedTermSet anzsrc-for:
68 schema:name Atomic, Molecular, Nuclear, Particle and Plasma Physics
69 rdf:type schema:DefinedTerm
70 sg:journal.1022207 schema:issn 0947-8396
71 1432-0630
72 schema:name Applied Physics A
73 rdf:type schema:Periodical
74 sg:person.01002564471.71 schema:affiliation N95cfdaf8ad7a4dc59f7fa7b0842d1e5f
75 schema:familyName Belin
76 schema:givenName C.
77 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01002564471.71
78 rdf:type schema:Person
79 sg:person.011440004061.62 schema:affiliation https://www.grid.ac/institutes/grid.462111.1
80 schema:familyName Debarre
81 schema:givenName D.
82 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011440004061.62
83 rdf:type schema:Person
84 sg:person.013706070411.29 schema:affiliation N222a75b776ca489cad7632852516b17d
85 schema:familyName Tokarev
86 schema:givenName V.N.
87 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013706070411.29
88 rdf:type schema:Person
89 sg:person.015337120722.95 schema:affiliation N49e2b227fc90488fb13ed81c09dd3c52
90 schema:familyName Lazare
91 schema:givenName S.
92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015337120722.95
93 rdf:type schema:Person
94 sg:pub.10.1007/s00339-002-2050-z schema:sameAs https://app.dimensions.ai/details/publication/pub.1020324103
95 https://doi.org/10.1007/s00339-002-2050-z
96 rdf:type schema:CreativeWork
97 https://doi.org/10.1016/s0169-4332(01)00595-5 schema:sameAs https://app.dimensions.ai/details/publication/pub.1023244935
98 rdf:type schema:CreativeWork
99 https://doi.org/10.1016/s0377-0257(03)00013-2 schema:sameAs https://app.dimensions.ai/details/publication/pub.1050029214
100 rdf:type schema:CreativeWork
101 https://doi.org/10.1021/ma00157a074 schema:sameAs https://app.dimensions.ai/details/publication/pub.1056180650
102 rdf:type schema:CreativeWork
103 https://doi.org/10.1063/1.354333 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057971059
104 rdf:type schema:CreativeWork
105 https://doi.org/10.1063/1.359177 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057980733
106 rdf:type schema:CreativeWork
107 https://doi.org/10.1088/0022-3727/32/13/314 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012657446
108 rdf:type schema:CreativeWork
109 https://doi.org/10.1364/ao.35.004471 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065111232
110 rdf:type schema:CreativeWork
111 https://www.grid.ac/institutes/grid.462111.1 schema:alternateName Institut d'Electronique Fondamentale
112 schema:name Institut d’Electronique Fondamentale (IEF), UMR 8622, Université Paris XI, 91 405, Orsay, France
113 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...