A TEM study of nanoparticles in lustre glazes View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2004-07

AUTHORS

P. Fredrickx, D. Hélary, D. Schryvers, E. Darque-Ceretti

ABSTRACT

Transmission electron microscopy (TEM) has been used to investigate the nanoscale morphology of some contemporary lustre glazes. High-resolution TEM, electron energy-loss spectroscopy and energy-dispersive X-ray analysis data imply that two kinds of nanoparticles are present in the lustre layer, namely metallic Ag and metallic Cu particles. Moreover, these particles appear separated in the material. The dense top layer consists of Ag particles and the particles occurring below this upper layer are metallic Cu. A depth profile of the sizes of the nanoparticles with respect to their penetration depths has been drawn. The particle sizes are mainly situated in the range of 5 nm to 15 nm, though smaller and larger particles occur frequently. More... »

PAGES

283-288

References to SciGraph publications

Journal

TITLE

Applied Physics A

ISSUE

2

VOLUME

79

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/s00339-004-2515-3

DOI

http://dx.doi.org/10.1007/s00339-004-2515-3

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1032847136


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