Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1999-11

AUTHORS

E. Borchi, M. Bruzzi, M. Menichelli, S. Pirollo

ABSTRACT

Siliconp+/n/n+ detectors with medium resistivities (400–500 cm) have been analyzed as a function of neutron irradiation in the fluence range from 6.4·1011 n/cm2 to 2.5·1015 n/cm2. The changes in the effective carrier concentration have been related to the removal of the shallowlevel concentration induced by irradiation and to the introduction with the fluence of deep levels. The shallow levels have been studied by Thermally Stimulated Current (TSC) in the low-temperature range (10–20 K): a removal of one order of magnitude of the phosphorus concentration has been observed for fluences of the order of 1 · 1014 n/cm2. The presence of deep levels has been investigated by TSC and current-DLTS techniques. More... »

PAGES

1359-1367

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf03185601

DOI

http://dx.doi.org/10.1007/bf03185601

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1026369949


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0907", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Environmental Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "INFM, Largo E. Fermi 2, 50125, Firenze, Italy", 
          "id": "http://www.grid.ac/institutes/grid.157869.4", 
          "name": [
            "Dipartimento di Energetica, Universit\u00e0 di Firenze, Via S. Marta 3, 50139, Firenze, Italy", 
            "INFM, Largo E. Fermi 2, 50125, Firenze, Italy"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Borchi", 
        "givenName": "E.", 
        "id": "sg:person.013616402543.86", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013616402543.86"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "INFM, Largo E. Fermi 2, 50125, Firenze, Italy", 
          "id": "http://www.grid.ac/institutes/grid.157869.4", 
          "name": [
            "Dipartimento di Energetica, Universit\u00e0 di Firenze, Via S. Marta 3, 50139, Firenze, Italy", 
            "INFM, Largo E. Fermi 2, 50125, Firenze, Italy"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bruzzi", 
        "givenName": "M.", 
        "id": "sg:person.016121267023.47", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016121267023.47"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "INFM, Largo E. Fermi 2, 50125, Firenze, Italy", 
          "id": "http://www.grid.ac/institutes/grid.157869.4", 
          "name": [
            "Dipartimento di Energetica, Universit\u00e0 di Firenze, Via S. Marta 3, 50139, Firenze, Italy", 
            "INFM, Largo E. Fermi 2, 50125, Firenze, Italy"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Menichelli", 
        "givenName": "M.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "INFM, Largo E. Fermi 2, 50125, Firenze, Italy", 
          "id": "http://www.grid.ac/institutes/grid.157869.4", 
          "name": [
            "Dipartimento di Energetica, Universit\u00e0 di Firenze, Via S. Marta 3, 50139, Firenze, Italy", 
            "INFM, Largo E. Fermi 2, 50125, Firenze, Italy"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Pirollo", 
        "givenName": "S.", 
        "id": "sg:person.011605775411.79", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011605775411.79"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "1999-11", 
    "datePublishedReg": "1999-11-01", 
    "description": "Siliconp+/n/n+ detectors with medium resistivities (400\u2013500 cm) have been analyzed as a function of neutron irradiation in the fluence range from 6.4\u00b71011 n/cm2 to 2.5\u00b71015 n/cm2. The changes in the effective carrier concentration have been related to the removal of the shallowlevel concentration induced by irradiation and to the introduction with the fluence of deep levels. The shallow levels have been studied by Thermally Stimulated Current (TSC) in the low-temperature range (10\u201320 K): a removal of one order of magnitude of the phosphorus concentration has been observed for fluences of the order of 1 \u00b7 1014 n/cm2. The presence of deep levels has been investigated by TSC and current-DLTS techniques.", 
    "genre": "article", 
    "id": "sg:pub.10.1007/bf03185601", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1336107", 
        "issn": [
          "1826-9869"
        ], 
        "name": "Il Nuovo Cimento A (1971-1996)", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "11", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "112"
      }
    ], 
    "keywords": [
      "levels", 
      "concentration", 
      "irradiation", 
      "changes", 
      "removal", 
      "presence", 
      "medium resistivity", 
      "function", 
      "neutron irradiation", 
      "range", 
      "cm2", 
      "effective carrier concentration", 
      "carrier concentration", 
      "introduction", 
      "low-temperature range", 
      "TSC", 
      "deep-level analysis", 
      "analysis", 
      "resistivity", 
      "fluence range", 
      "fluence", 
      "deep levels", 
      "Thermally", 
      "current", 
      "orders of magnitude", 
      "order", 
      "magnitude", 
      "phosphorus concentrations", 
      "technique", 
      "silicon detectors", 
      "detector", 
      "shallow levels", 
      "shallowlevel concentration", 
      "current-DLTS techniques", 
      "medium-resistivity silicon detectors"
    ], 
    "name": "Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors", 
    "pagination": "1359-1367", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1026369949"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/bf03185601"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/bf03185601", 
      "https://app.dimensions.ai/details/publication/pub.1026369949"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2022-01-01T18:11", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220101/entities/gbq_results/article/article_336.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "https://doi.org/10.1007/bf03185601"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/bf03185601'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/bf03185601'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/bf03185601'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/bf03185601'


 

This table displays all metadata directly associated to this object as RDF triples.

112 TRIPLES      21 PREDICATES      61 URIs      53 LITERALS      6 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/bf03185601 schema:about anzsrc-for:09
2 anzsrc-for:0907
3 schema:author Nfbf05317b4d94745a7516bbd9c2e3221
4 schema:datePublished 1999-11
5 schema:datePublishedReg 1999-11-01
6 schema:description Siliconp+/n/n+ detectors with medium resistivities (400–500 cm) have been analyzed as a function of neutron irradiation in the fluence range from 6.4·1011 n/cm2 to 2.5·1015 n/cm2. The changes in the effective carrier concentration have been related to the removal of the shallowlevel concentration induced by irradiation and to the introduction with the fluence of deep levels. The shallow levels have been studied by Thermally Stimulated Current (TSC) in the low-temperature range (10–20 K): a removal of one order of magnitude of the phosphorus concentration has been observed for fluences of the order of 1 · 1014 n/cm2. The presence of deep levels has been investigated by TSC and current-DLTS techniques.
7 schema:genre article
8 schema:inLanguage en
9 schema:isAccessibleForFree false
10 schema:isPartOf N169bb8bcd4444e639b76a5f15e2f72a6
11 N9516952c81ff4f919e1401e52aa1f84a
12 sg:journal.1336107
13 schema:keywords TSC
14 Thermally
15 analysis
16 carrier concentration
17 changes
18 cm2
19 concentration
20 current
21 current-DLTS techniques
22 deep levels
23 deep-level analysis
24 detector
25 effective carrier concentration
26 fluence
27 fluence range
28 function
29 introduction
30 irradiation
31 levels
32 low-temperature range
33 magnitude
34 medium resistivity
35 medium-resistivity silicon detectors
36 neutron irradiation
37 order
38 orders of magnitude
39 phosphorus concentrations
40 presence
41 range
42 removal
43 resistivity
44 shallow levels
45 shallowlevel concentration
46 silicon detectors
47 technique
48 schema:name Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors
49 schema:pagination 1359-1367
50 schema:productId N1a6cd1b37181441096c760af3fbadf22
51 N2192691c29f74af1b9a37f74d60143b7
52 schema:sameAs https://app.dimensions.ai/details/publication/pub.1026369949
53 https://doi.org/10.1007/bf03185601
54 schema:sdDatePublished 2022-01-01T18:11
55 schema:sdLicense https://scigraph.springernature.com/explorer/license/
56 schema:sdPublisher N62a79323c6cc4b98906261c17d67d78b
57 schema:url https://doi.org/10.1007/bf03185601
58 sgo:license sg:explorer/license/
59 sgo:sdDataset articles
60 rdf:type schema:ScholarlyArticle
61 N169bb8bcd4444e639b76a5f15e2f72a6 schema:volumeNumber 112
62 rdf:type schema:PublicationVolume
63 N1a6cd1b37181441096c760af3fbadf22 schema:name doi
64 schema:value 10.1007/bf03185601
65 rdf:type schema:PropertyValue
66 N2192691c29f74af1b9a37f74d60143b7 schema:name dimensions_id
67 schema:value pub.1026369949
68 rdf:type schema:PropertyValue
69 N36e65e08dded461ba1886d2713432756 schema:affiliation grid-institutes:grid.157869.4
70 schema:familyName Menichelli
71 schema:givenName M.
72 rdf:type schema:Person
73 N5029935b94684c7287ac4c522f2d93fb rdf:first N36e65e08dded461ba1886d2713432756
74 rdf:rest N65b6f8be37124560900e320acbb05db3
75 N62a79323c6cc4b98906261c17d67d78b schema:name Springer Nature - SN SciGraph project
76 rdf:type schema:Organization
77 N65b6f8be37124560900e320acbb05db3 rdf:first sg:person.011605775411.79
78 rdf:rest rdf:nil
79 N9516952c81ff4f919e1401e52aa1f84a schema:issueNumber 11
80 rdf:type schema:PublicationIssue
81 Nce27c9dc84e44ed69e8fbc618325daa1 rdf:first sg:person.016121267023.47
82 rdf:rest N5029935b94684c7287ac4c522f2d93fb
83 Nfbf05317b4d94745a7516bbd9c2e3221 rdf:first sg:person.013616402543.86
84 rdf:rest Nce27c9dc84e44ed69e8fbc618325daa1
85 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
86 schema:name Engineering
87 rdf:type schema:DefinedTerm
88 anzsrc-for:0907 schema:inDefinedTermSet anzsrc-for:
89 schema:name Environmental Engineering
90 rdf:type schema:DefinedTerm
91 sg:journal.1336107 schema:issn 1826-9869
92 schema:name Il Nuovo Cimento A (1971-1996)
93 rdf:type schema:Periodical
94 sg:person.011605775411.79 schema:affiliation grid-institutes:grid.157869.4
95 schema:familyName Pirollo
96 schema:givenName S.
97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011605775411.79
98 rdf:type schema:Person
99 sg:person.013616402543.86 schema:affiliation grid-institutes:grid.157869.4
100 schema:familyName Borchi
101 schema:givenName E.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013616402543.86
103 rdf:type schema:Person
104 sg:person.016121267023.47 schema:affiliation grid-institutes:grid.157869.4
105 schema:familyName Bruzzi
106 schema:givenName M.
107 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016121267023.47
108 rdf:type schema:Person
109 grid-institutes:grid.157869.4 schema:alternateName INFM, Largo E. Fermi 2, 50125, Firenze, Italy
110 schema:name Dipartimento di Energetica, Università di Firenze, Via S. Marta 3, 50139, Firenze, Italy
111 INFM, Largo E. Fermi 2, 50125, Firenze, Italy
112 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...