On the use of the atomic force microscope to monitor physical degradation of polymeric coating surfaces View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2001-12

AUTHORS

Mark R. VanLandingham, Tinh Nguyen, W. Eric Byrd, Jonathan W. Martin

ABSTRACT

The atomic force microscope (AFM) was used to monitor changes in surface features of an acrylic melamine coating that was exposed to a variety of conditions. Exposure to ultraviolet (UV) radiation and high relative humidity caused general roughening of the surface and the formation of pits. Further, the damage of the coating surface was much more substantial for exposure to high relative humidity compared to exposure to dry environments. This difference in degradation rates correlated with measurements of chemical degradation determined using infrared spectra that were acquired along with the AFM images. More... »

PAGES

43-50

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf02720133

DOI

http://dx.doi.org/10.1007/bf02720133

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041421586


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