Structural study of degraded ZnMgSSe blue light emitters View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1996-02

AUTHORS

K. Nakano, S. Tomiya, M. Ukita, H. Yoshida, S. Itoh, E. Morita, M. Ikeda, A. Ishibashi

ABSTRACT

Using electroluminescence (EL) topography and transmission electron microscopy (TEM), we investigated the nonluminescent regions which form while current is being injected into ZnMgSSe/ZnSSe/ZnCdSe-based blue light emitters. Small dark spots were observed just after turn-on and spread out forming rough nonluminescent triangles in the <100> directions in the EL image of the active region. TEM studies showed that the small dark spots are pre-existing stacking faults originating at the substrate/epitaxial layer interface. The nonluminescent triangles were found to be a dense region of dislocation dipoles and dislocation loops. Each dipole was aligned along two <110> directions in the {111} planes. The Burgers vectors were of the type a/2<011> inclined at 45° to the (001) junction plane. More... »

PAGES

213-216

References to SciGraph publications

Journal

TITLE

Journal of Electronic Materials

ISSUE

2

VOLUME

25

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf02666246

DOI

http://dx.doi.org/10.1007/bf02666246

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041748018


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