The detection of monolayer grain boundary segregations in steels using stem-eds X-ray microanalysis View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1982-08

AUTHORS

P. Doig, P. E. J. Flewitt

ABSTRACT

The detection and measurement of monolayer embrittling segregations to prior austenite grain boundaries in ferritic steels using scanning transmission electron microscopy combined with energy dispersive X-ray microanalysis are considered theoretically. The influence of experimental variables of electron probe size, electron accelerating voltage, and foil thickness on the detectability limits are considered in relation to electron probe spreading within the foil and the resulting X-ray counting statistics. The analysis predicts that a grain boundary coverage of 0.01 and 0.2 of a monolayer of tin and phosphorus, respectively, may be detected in a ferritic steel using a conventional STEM-EDS system. More... »

PAGES

1397-1403

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf02642877

DOI

http://dx.doi.org/10.1007/bf02642877

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1036102063


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