Microstructure — Electrical properties relationship of YSZ thin films reactively sputter-deposited at different pressures View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

2005-05

AUTHORS

P. Briois, E. Gourba, A. Billard, A. Ringuedé, M. Cassir

ABSTRACT

In order to decrease the operating temperature of Solid Oxide Fuel Cells (SOFC) from about 1000 °C to around 700 °C, the thickness of commonly used electrolytes such as Yttria Stabilised Zirconia (YSZ) must be decreased for about one order of magnitude in the range 1–10 µm. In this paper, we investigate the suitability of reactive magnetron sputtering for deposition of about 1 µm-thick YSZ films dedicated to SOFC.The coatings are synthesised by sputtering a metallic Zr-16 at.%Y target in the presence of a reactive argon-oxygen discharge. The deposition stage is controlled by Optical Transmission Interferometry (OTI) in order to guarantee the film transparency and its thickness. The influence of the deposition pressure on the chemical, structural and morphological properties of the coatings is studied in order to establish relationships with their ionic conductivity, determined by impedance spectroscopy. More... »

PAGES

301-305

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf02430393

DOI

http://dx.doi.org/10.1007/bf02430393

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1022746228


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