Examination of several selected fungi by scanning electron microscope View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1970-11

AUTHORS

Yuki Ito, Yoshinori Nozawa, Takao Setoguti

ABSTRACT

Scanning electron microscopy with high resolution and great depth of focus has been known to be able to show the fine features of surface ornamentation of fungi, and with this technique we could obtain the interesting results about the surface structures of the selected fungi,Penicillium chrysogenum, Aspergillus niger, Aspergillus oryzae andCandida utilis. More... »

PAGES

299-305

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf02051109

DOI

http://dx.doi.org/10.1007/bf02051109

DIMENSIONS

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PUBMED

https://www.ncbi.nlm.nih.gov/pubmed/5493701


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