Production of projectile and targetK X-rays by single and multiple electron-capture in collisions of Si14+ and Si13+ ions with argon ... View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1984-10

AUTHORS

S. Andriamonje, J. F. Chemin, J. Roturier, B. Saboya, J. N. Scheurer, R. Gayet, A. Salin, H. Laurent, P. Aguer, J. P. Thibaud

ABSTRACT

Projectile and target X-ray cross-sections have been measured in collisions of bare and hydrogenlike Silicon ions with argon atoms. Projectile energies are 125 MeV and 153 MeV, i.e. the intermediate velocity region forK-shell capture. Coincidence measurements between X-ray photons and the scattered Sin+ projectiles with charge statesn-1,n-2 andn-3 have been made. The relative contribution of charge exchange and direct ionization (or excitation) of the targetK-shell has been obtained directly by this new method. DoubleK-shell electron transfer is demonstrated to be very large in the case of fully stripped Si ions. A thorough theoretical analysis of the data is carried out and multiple capture processes are evaluated using an independent electron model. More... »

PAGES

251-265

References to SciGraph publications

  • 1982-06. K-Ionization probability across the 460-keV12C(p, p0) resonance in ZEITSCHRIFT FÜR PHYSIK A HADRONS AND NUCLEI
  • Identifiers

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    http://scigraph.springernature.com/pub.10.1007/bf01438357

    DOI

    http://dx.doi.org/10.1007/bf01438357

    DIMENSIONS

    https://app.dimensions.ai/details/publication/pub.1040837644


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