Multifractal analysis of elemental distributions in SEM/EDX images of palladium conditioned ET-AAS platforms View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1995-03

AUTHORS

Thomas Klenke

ABSTRACT

A tool of non-linear physics, the multifractal analysis of density distributions, is applied to the analysis of elemental dot maps imaged by scanning electron microscopy coupled with energy dispersive X-ray spectroscopy (SEM/EDX). This example concerns distribution patterns of palladium modifier deposits on the graphite platform of an electrothermal atomic absorption spectrometer (ET-AAS). The geometries of palladium distributions were quantitatively determined by multifractal analysis for two types of modifiers: (i) 0.1% (w/v) tetraamminepalladium (II) chloride and (ii) 0.1% (w/v) tetraamminepalladium (II) chloride with 1% (w/v) ammonium oxalate. The multifractal spectra of the generalized fractal dimensions (Db(q)) do not differ forq = 0 (Db(0) ≈ 1.80±0.08), which reflects the surface topography of the graphite platform. For higher moments ofq significant differences occur (e.g.,Db(10) ≈ 1.35±0.13 without ammonium oxalate andDb(10) ≈ 1.55±0.10 in the presence of ammonium oxalate). These multifractal characteristics, which are due to different probabilities of deposition processes, were observed over a spatial range around 0.01–1 mm. The quantitative assessment of the geometrical distributions substantiate that ammonium oxalate promotes processes which lead to a more homogeneous distribution of palladium, thus enhancing the stabilizing effect. More... »

PAGES

91-100

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf01244423

DOI

http://dx.doi.org/10.1007/bf01244423

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1050089926


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