In-depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS View Full Text


Ontology type: schema:ScholarlyArticle      Open Access: True


Article Info

DATE

1990-01

AUTHORS

Lambertus J. Hanekamp, Albert H. J. van den Berg, Henny J. M. Bouwmeester, Antonius G. B. M. Sasse, Henk Kruidhof

ABSTRACT

The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer. More... »

PAGES

189-194

References to SciGraph publications

Journal

TITLE

Microchimica Acta

ISSUE

1-6

VOLUME

101

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf01244171

DOI

http://dx.doi.org/10.1007/bf01244171

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1033619671


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