Ontology type: schema:ScholarlyArticle
1993-01
AUTHORSS. Uhlemann, P. Weißbrodt, D. Mademann
ABSTRACTOptimization of SNMS depth profiling using the direct bombardment mode (DBM) is possible by improvement of the ion current density distribution, reduction of bombardment energy and independent choice of current density. A model for primary ion extraction is presented and ion current density distributions have been calculated for different sample holder arrangements. Using the simulation procedure optimal extraction conditions can be predicted for conventional arrangements and suggestions for new ones can be made. The best depth resolution has been obtained using a new extraction arrangement with an additional aperture. More... »
PAGES374-379
http://scigraph.springernature.com/pub.10.1007/bf00321454
DOIhttp://dx.doi.org/10.1007/bf00321454
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