Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1993-01

AUTHORS

D. Mademann, L. Raupach, P. Weißbrodt, E. Hacker, U. Kaiser, N. Kaiser

ABSTRACT

Impurity contents of loosely packed CaF2 and LaF3 films are analysed by SNMS depth-profiling. On the basis of TEM investigations a quantitative description of the structure of the films is given. The irreversibly incorporated oxygen contents of the films are nearly independent of the film structures. In contrast, the irreversibly incorporated carbon contents are proportional to the inner surfaces of the loosely packed films and to the C-contaminations of appropriate surfaces of compact fluoride samples. It is concluded that the irreversibly incorporated C covers the grain surfaces and the irreversibly incorporated O is located preferably within the grains. More... »

PAGES

173-176

References to SciGraph publications

Journal

TITLE

Journal of Analytical Chemistry

ISSUE

1-3

VOLUME

346

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf00321407

DOI

http://dx.doi.org/10.1007/bf00321407

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1033867830


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "D\u00fcnnschichtzentrum, Jenoptik GmbH, Carl-Zeiss-Strasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Mademann", 
        "givenName": "D.", 
        "id": "sg:person.011271125547.43", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011271125547.43"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "D\u00fcnnschichtzentrum, Jenoptik GmbH, Carl-Zeiss-Strasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Raupach", 
        "givenName": "L.", 
        "id": "sg:person.011034435557.37", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011034435557.37"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "D\u00fcnnschichtzentrum, Jenoptik GmbH, Carl-Zeiss-Strasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Wei\u00dfbrodt", 
        "givenName": "P.", 
        "id": "sg:person.013114020305.10", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013114020305.10"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Jenoptik (Germany)", 
          "id": "https://www.grid.ac/institutes/grid.436091.9", 
          "name": [
            "D\u00fcnnschichtzentrum, Jenoptik GmbH, Carl-Zeiss-Strasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hacker", 
        "givenName": "E.", 
        "id": "sg:person.015607731750.99", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015607731750.99"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Fraunhofer-Einrichtung f\u00fcr Angewandte Optik und Feinmechanik, Schillerstrasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kaiser", 
        "givenName": "U.", 
        "id": "sg:person.01160557301.80", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01160557301.80"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Fraunhofer-Einrichtung f\u00fcr Angewandte Optik und Feinmechanik, Schillerstrasse 1, O-6900, Jena, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kaiser", 
        "givenName": "N.", 
        "id": "sg:person.0666022627.33", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0666022627.33"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1007/bf00321454", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1005145223", 
          "https://doi.org/10.1007/bf00321454"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf00321454", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1005145223", 
          "https://doi.org/10.1007/bf00321454"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(92)90599-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011979590"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(92)90599-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1011979590"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1117/12.941242", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1035989151"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(88)90278-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1036027960"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(88)90278-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1036027960"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1364/ao.24.000496", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065099759"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/3-540-12593-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1109702215", 
          "https://doi.org/10.1007/3-540-12593-0"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/3-540-12593-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1109702215", 
          "https://doi.org/10.1007/3-540-12593-0"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/3-540-12593-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1109702215", 
          "https://doi.org/10.1007/3-540-12593-0"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1993-01", 
    "datePublishedReg": "1993-01-01", 
    "description": "Impurity contents of loosely packed CaF2 and LaF3 films are analysed by SNMS depth-profiling. On the basis of TEM investigations a quantitative description of the structure of the films is given. The irreversibly incorporated oxygen contents of the films are nearly independent of the film structures. In contrast, the irreversibly incorporated carbon contents are proportional to the inner surfaces of the loosely packed films and to the C-contaminations of appropriate surfaces of compact fluoride samples. It is concluded that the irreversibly incorporated C covers the grain surfaces and the irreversibly incorporated O is located preferably within the grains.", 
    "genre": "research_article", 
    "id": "sg:pub.10.1007/bf00321407", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": [
      {
        "id": "sg:journal.1327771", 
        "issn": [
          "0937-0633", 
          "1432-1130"
        ], 
        "name": "Journal of Analytical Chemistry", 
        "type": "Periodical"
      }, 
      {
        "issueNumber": "1-3", 
        "type": "PublicationIssue"
      }, 
      {
        "type": "PublicationVolume", 
        "volumeNumber": "346"
      }
    ], 
    "name": "Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy", 
    "pagination": "173-176", 
    "productId": [
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "a15657a3618c735cd369453e5f10f745f075d2a71bdd1b53be4d16a20599fae4"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/bf00321407"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1033867830"
        ]
      }
    ], 
    "sameAs": [
      "https://doi.org/10.1007/bf00321407", 
      "https://app.dimensions.ai/details/publication/pub.1033867830"
    ], 
    "sdDataset": "articles", 
    "sdDatePublished": "2019-04-11T13:58", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000371_0000000371/records_130823_00000003.jsonl", 
    "type": "ScholarlyArticle", 
    "url": "http://link.springer.com/10.1007/BF00321407"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

120 TRIPLES      21 PREDICATES      33 URIs      19 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/bf00321407 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author Nc6d666e8b5934e6996c27094ddfe3b16
4 schema:citation sg:pub.10.1007/3-540-12593-0
5 sg:pub.10.1007/bf00321454
6 https://doi.org/10.1016/0040-6090(88)90278-7
7 https://doi.org/10.1016/0040-6090(92)90599-7
8 https://doi.org/10.1117/12.941242
9 https://doi.org/10.1364/ao.24.000496
10 schema:datePublished 1993-01
11 schema:datePublishedReg 1993-01-01
12 schema:description Impurity contents of loosely packed CaF2 and LaF3 films are analysed by SNMS depth-profiling. On the basis of TEM investigations a quantitative description of the structure of the films is given. The irreversibly incorporated oxygen contents of the films are nearly independent of the film structures. In contrast, the irreversibly incorporated carbon contents are proportional to the inner surfaces of the loosely packed films and to the C-contaminations of appropriate surfaces of compact fluoride samples. It is concluded that the irreversibly incorporated C covers the grain surfaces and the irreversibly incorporated O is located preferably within the grains.
13 schema:genre research_article
14 schema:inLanguage en
15 schema:isAccessibleForFree false
16 schema:isPartOf N511904139bf14f0b887fd7032753920d
17 Nbab697446a8144ae8e7d58a8fbafdbca
18 sg:journal.1327771
19 schema:name Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy
20 schema:pagination 173-176
21 schema:productId N439d21e87b4f4a03961191a63dc018c1
22 N4cb2a0a5807b4f66a2f6731712fc8ba5
23 Ne55e886d43f04337ab2d51da4f3236ab
24 schema:sameAs https://app.dimensions.ai/details/publication/pub.1033867830
25 https://doi.org/10.1007/bf00321407
26 schema:sdDatePublished 2019-04-11T13:58
27 schema:sdLicense https://scigraph.springernature.com/explorer/license/
28 schema:sdPublisher Na73d608533d24b70b53685bd0776cc1d
29 schema:url http://link.springer.com/10.1007/BF00321407
30 sgo:license sg:explorer/license/
31 sgo:sdDataset articles
32 rdf:type schema:ScholarlyArticle
33 N106ca2880b854082bf3f8f71cdb9bc39 rdf:first sg:person.011034435557.37
34 rdf:rest N228f84c942f94d4498ddc1623df6972d
35 N228f84c942f94d4498ddc1623df6972d rdf:first sg:person.013114020305.10
36 rdf:rest N989ed9e5a9b344dca6080bea015f1fc0
37 N439d21e87b4f4a03961191a63dc018c1 schema:name doi
38 schema:value 10.1007/bf00321407
39 rdf:type schema:PropertyValue
40 N4cb2a0a5807b4f66a2f6731712fc8ba5 schema:name readcube_id
41 schema:value a15657a3618c735cd369453e5f10f745f075d2a71bdd1b53be4d16a20599fae4
42 rdf:type schema:PropertyValue
43 N511904139bf14f0b887fd7032753920d schema:issueNumber 1-3
44 rdf:type schema:PublicationIssue
45 N607f1394457a4868823a47ea5ca7f561 schema:name Fraunhofer-Einrichtung für Angewandte Optik und Feinmechanik, Schillerstrasse 1, O-6900, Jena, Germany
46 rdf:type schema:Organization
47 N77d84e4d20074ba9a925e759ece0c88d schema:name Fraunhofer-Einrichtung für Angewandte Optik und Feinmechanik, Schillerstrasse 1, O-6900, Jena, Germany
48 rdf:type schema:Organization
49 N87cfc207c3e9425d934d6a4fea44b7e8 rdf:first sg:person.01160557301.80
50 rdf:rest Nbb055ed473c64004b04403cd36cc1b32
51 N989ed9e5a9b344dca6080bea015f1fc0 rdf:first sg:person.015607731750.99
52 rdf:rest N87cfc207c3e9425d934d6a4fea44b7e8
53 Na73d608533d24b70b53685bd0776cc1d schema:name Springer Nature - SN SciGraph project
54 rdf:type schema:Organization
55 Nbab697446a8144ae8e7d58a8fbafdbca schema:volumeNumber 346
56 rdf:type schema:PublicationVolume
57 Nbb055ed473c64004b04403cd36cc1b32 rdf:first sg:person.0666022627.33
58 rdf:rest rdf:nil
59 Nc6d666e8b5934e6996c27094ddfe3b16 rdf:first sg:person.011271125547.43
60 rdf:rest N106ca2880b854082bf3f8f71cdb9bc39
61 Ne55e886d43f04337ab2d51da4f3236ab schema:name dimensions_id
62 schema:value pub.1033867830
63 rdf:type schema:PropertyValue
64 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
65 schema:name Engineering
66 rdf:type schema:DefinedTerm
67 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
68 schema:name Materials Engineering
69 rdf:type schema:DefinedTerm
70 sg:journal.1327771 schema:issn 0937-0633
71 1432-1130
72 schema:name Journal of Analytical Chemistry
73 rdf:type schema:Periodical
74 sg:person.011034435557.37 schema:affiliation https://www.grid.ac/institutes/grid.436091.9
75 schema:familyName Raupach
76 schema:givenName L.
77 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011034435557.37
78 rdf:type schema:Person
79 sg:person.011271125547.43 schema:affiliation https://www.grid.ac/institutes/grid.436091.9
80 schema:familyName Mademann
81 schema:givenName D.
82 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011271125547.43
83 rdf:type schema:Person
84 sg:person.01160557301.80 schema:affiliation N77d84e4d20074ba9a925e759ece0c88d
85 schema:familyName Kaiser
86 schema:givenName U.
87 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01160557301.80
88 rdf:type schema:Person
89 sg:person.013114020305.10 schema:affiliation https://www.grid.ac/institutes/grid.436091.9
90 schema:familyName Weißbrodt
91 schema:givenName P.
92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013114020305.10
93 rdf:type schema:Person
94 sg:person.015607731750.99 schema:affiliation https://www.grid.ac/institutes/grid.436091.9
95 schema:familyName Hacker
96 schema:givenName E.
97 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015607731750.99
98 rdf:type schema:Person
99 sg:person.0666022627.33 schema:affiliation N607f1394457a4868823a47ea5ca7f561
100 schema:familyName Kaiser
101 schema:givenName N.
102 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0666022627.33
103 rdf:type schema:Person
104 sg:pub.10.1007/3-540-12593-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1109702215
105 https://doi.org/10.1007/3-540-12593-0
106 rdf:type schema:CreativeWork
107 sg:pub.10.1007/bf00321454 schema:sameAs https://app.dimensions.ai/details/publication/pub.1005145223
108 https://doi.org/10.1007/bf00321454
109 rdf:type schema:CreativeWork
110 https://doi.org/10.1016/0040-6090(88)90278-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1036027960
111 rdf:type schema:CreativeWork
112 https://doi.org/10.1016/0040-6090(92)90599-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1011979590
113 rdf:type schema:CreativeWork
114 https://doi.org/10.1117/12.941242 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035989151
115 rdf:type schema:CreativeWork
116 https://doi.org/10.1364/ao.24.000496 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065099759
117 rdf:type schema:CreativeWork
118 https://www.grid.ac/institutes/grid.436091.9 schema:alternateName Jenoptik (Germany)
119 schema:name Dünnschichtzentrum, Jenoptik GmbH, Carl-Zeiss-Strasse 1, O-6900, Jena, Germany
120 rdf:type schema:Organization
 




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