Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy View Full Text


Ontology type: schema:ScholarlyArticle     


Article Info

DATE

1993-01

AUTHORS

D. Mademann, L. Raupach, P. Weißbrodt, E. Hacker, U. Kaiser, N. Kaiser

ABSTRACT

Impurity contents of loosely packed CaF2 and LaF3 films are analysed by SNMS depth-profiling. On the basis of TEM investigations a quantitative description of the structure of the films is given. The irreversibly incorporated oxygen contents of the films are nearly independent of the film structures. In contrast, the irreversibly incorporated carbon contents are proportional to the inner surfaces of the loosely packed films and to the C-contaminations of appropriate surfaces of compact fluoride samples. It is concluded that the irreversibly incorporated C covers the grain surfaces and the irreversibly incorporated O is located preferably within the grains. More... »

PAGES

173-176

Journal

TITLE

Journal of Analytical Chemistry

ISSUE

1-3

VOLUME

346

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/bf00321407

DOI

http://dx.doi.org/10.1007/bf00321407

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1033867830


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