Parallel simulation of electron-solid interactions for electron microscopy modeling View Full Text


Ontology type: schema:ScholarlyArticle      Open Access: True


Article Info

DATE

1992-06

AUTHORS

S. J. Plimpton, J. R. Michael, A. D. Romig

ABSTRACT

A parallel implementation of a Monte Carlo algorithm for modeling the scattering of electrons in solids and the resulting X-ray production is described. Two important issues for accurate and fast parallel simulation are discussed-random number generation and load-balancing. Timing results for the parallel simulation are given which show even modest-sized parallel machines can be competitive with conventional vector supercomputers for Monte Carlo trajectory simulations. Examples of parallel calculations performed to analyze specimen composition data and to characterize electron microscope performance are briefly highlighted. More... »

PAGES

139-151

References to SciGraph publications

  • 1986. Electron Beam-Specimen Interactions in the Analytical Electron Microscope in PRINCIPLES OF ANALYTICAL ELECTRON MICROSCOPY
  • Identifiers

    URI

    http://scigraph.springernature.com/pub.10.1007/bf00129775

    DOI

    http://dx.doi.org/10.1007/bf00129775

    DIMENSIONS

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