Imaging ToF-SIMS as a Chemical Metrology Tool to Support Material and Analytical Science View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2016

AUTHORS

Gerald Holzlechner , Oded Sobol , Thomas Böllinghaus , Wolfgang Unger

ABSTRACT

As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms. More... »

PAGES

63-72

Book

TITLE

Materials for Energy Infrastructure

ISBN

978-981-287-723-9
978-981-287-724-6

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-981-287-724-6_7

DOI

http://dx.doi.org/10.1007/978-981-287-724-6_7

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1006942506


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