Scanning Probe Microscopes and their Applications View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1997

AUTHORS

L. L. Sohn , C. T. Black , M. Eriksson , M. Crommie , H. Hess

ABSTRACT

Recent advances in nanofabrication technology have provided access to continually smaller length scales. Consequently, a number of novel quantum phenomena—some of which have already been highlighted in this book— have been observed in fabricated structures of length scale ∾50–100 nm. Because of the clear possibility that additional novel effects will become manifest at even smaller dimensions, there is strong motivation to develop: (1) fabrication techniques which can routinely access sub-50 nm length scales in a variety of materials and (2) measurement techniques which can spectroscopically probe the local electronic properties of “ultra” nanometer-scale devices. More... »

PAGES

503-547

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-94-015-8839-3_14

DOI

http://dx.doi.org/10.1007/978-94-015-8839-3_14

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041164715


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