Precision Measurement of the Charged Pion Mass by High Resolution X-Ray Spectroscopy View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2001

AUTHORS

G. L. Borchert , B. Manil , D. Anagnostopoulos , J. P. Egger , D. Gotta , M. Hennebach , P. Indelicato , Y. W. Liu , N. Nelms , L. M. Simons

ABSTRACT

A new experiment for a high-precision measurement of the pion mass at a 1 ppm level is presented. It combines an improved cyclotron trap that produces pionic and muonic atoms in a small volume with a doubly focusing crystal spectrometer to measure the corresponding exotic X-ray transitions with high accuracy and a novel type of CCD detector. The muonic X-rays lines serve as highly accurate calibration lines. The measurement has been accomplished recently. A detailed analysis of the data is on the way. More... »

PAGES

195-207

Book

TITLE

Atomic Physics at Accelerators: Mass Spectrometry

ISBN

978-90-481-5825-6
978-94-015-1270-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-94-015-1270-1_15

DOI

http://dx.doi.org/10.1007/978-94-015-1270-1_15

DIMENSIONS

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