Electron Microscopy of Interfaces in New Materials View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1991

AUTHORS

G. Van Tendeloo , C. Goessens , D. Schryvers , J. Van Havenbergh , A. De Veirman , J. Van Landuyt

ABSTRACT

Electron microscopy and electron diffraction are shown to be most useful for the characterisation of different interfaces in new materials. High resolution microscopy provides atomic scale information on the local structure of such interfaces. These structural characteristics strongly influence the physical properties of the materials. We will study planar interfaces in the high Tc superconductor YBa2Cu3O7-δ, in silverhalogenides such as AgC1, in the luminescent Y1-x(Sr,Li)xTa04 and in semiconductor devices. More... »

PAGES

200-209

Book

TITLE

Interfaces in New Materials

ISBN

978-1-85166-693-5
978-94-011-3680-8

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-94-011-3680-8_20

DOI

http://dx.doi.org/10.1007/978-94-011-3680-8_20

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1010381914


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Van Tendeloo", 
        "givenName": "G.", 
        "id": "sg:person.0642063214.31", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0642063214.31"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Goessens", 
        "givenName": "C.", 
        "id": "sg:person.010456220671.05", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010456220671.05"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Schryvers", 
        "givenName": "D.", 
        "id": "sg:person.013773701247.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013773701247.34"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Agfa-Gevaert (Belgium)", 
          "id": "https://www.grid.ac/institutes/grid.423787.d", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium", 
            "AGFA GEVAERT N.V., Mortsel, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Van Havenbergh", 
        "givenName": "J.", 
        "id": "sg:person.014522177047.01", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014522177047.01"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "De Veirman", 
        "givenName": "A.", 
        "id": "sg:person.011665564261.31", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011665564261.31"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Van Landuyt", 
        "givenName": "J.", 
        "id": "sg:person.016415413307.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016415413307.34"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0921-4534(90)90682-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1005025858"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0921-4534(90)90682-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1005025858"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1149/1.2119609", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012707836"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/pssa.2211050122", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1017006989"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/jemt.1060080307", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1022310284"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(89)90045-4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1030278102"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(89)90045-4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1030278102"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-5088(90)90203-v", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1033142823"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0022-5088(90)90203-v", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1033142823"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/pssa.2211040216", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1033244982"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1209/0295-5075/4/2/013", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1064230867"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1991", 
    "datePublishedReg": "1991-01-01", 
    "description": "Electron microscopy and electron diffraction are shown to be most useful for the characterisation of different interfaces in new materials. High resolution microscopy provides atomic scale information on the local structure of such interfaces. These structural characteristics strongly influence the physical properties of the materials. We will study planar interfaces in the high Tc superconductor YBa2Cu3O7-\u03b4, in silverhalogenides such as AgC1, in the luminescent Y1-x(Sr,Li)xTa04 and in semiconductor devices.", 
    "editor": [
      {
        "familyName": "Grange", 
        "givenName": "P.", 
        "type": "Person"
      }, 
      {
        "familyName": "Delmon", 
        "givenName": "B.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-94-011-3680-8_20", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-1-85166-693-5", 
        "978-94-011-3680-8"
      ], 
      "name": "Interfaces in New Materials", 
      "type": "Book"
    }, 
    "name": "Electron Microscopy of Interfaces in New Materials", 
    "pagination": "200-209", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1010381914"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-94-011-3680-8_20"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "3175df4c642237f3825036a216c8f7ffec16729365ac58857279ce25fe92f582"
        ]
      }
    ], 
    "publisher": {
      "location": "Dordrecht", 
      "name": "Springer Netherlands", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-94-011-3680-8_20", 
      "https://app.dimensions.ai/details/publication/pub.1010381914"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-16T08:55", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000369_0000000369/records_68950_00000000.jsonl", 
    "type": "Chapter", 
    "url": "https://link.springer.com/10.1007%2F978-94-011-3680-8_20"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-94-011-3680-8_20'


 

This table displays all metadata directly associated to this object as RDF triples.

133 TRIPLES      23 PREDICATES      35 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-94-011-3680-8_20 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author Nd142324a3257434e87b51580536f7075
4 schema:citation https://doi.org/10.1002/jemt.1060080307
5 https://doi.org/10.1002/pssa.2211040216
6 https://doi.org/10.1002/pssa.2211050122
7 https://doi.org/10.1016/0022-5088(90)90203-v
8 https://doi.org/10.1016/0304-3991(89)90045-4
9 https://doi.org/10.1016/0921-4534(90)90682-5
10 https://doi.org/10.1149/1.2119609
11 https://doi.org/10.1209/0295-5075/4/2/013
12 schema:datePublished 1991
13 schema:datePublishedReg 1991-01-01
14 schema:description Electron microscopy and electron diffraction are shown to be most useful for the characterisation of different interfaces in new materials. High resolution microscopy provides atomic scale information on the local structure of such interfaces. These structural characteristics strongly influence the physical properties of the materials. We will study planar interfaces in the high Tc superconductor YBa2Cu3O7-δ, in silverhalogenides such as AgC1, in the luminescent Y1-x(Sr,Li)xTa04 and in semiconductor devices.
15 schema:editor Ne4f31e5d6a89444fa2f89432a66ff6dc
16 schema:genre chapter
17 schema:inLanguage en
18 schema:isAccessibleForFree false
19 schema:isPartOf N967c96fb12ed455db50c0fd9d71bf7cc
20 schema:name Electron Microscopy of Interfaces in New Materials
21 schema:pagination 200-209
22 schema:productId N86348be30c2041609a0e0166f3e2d75c
23 Na822fafe78cb4496b3a23b4ca2cfa89b
24 Nd7d804af9acf4c6e967bc97f7a33a5dd
25 schema:publisher N3bf0672d5754485dbc4055cdb0cb9d07
26 schema:sameAs https://app.dimensions.ai/details/publication/pub.1010381914
27 https://doi.org/10.1007/978-94-011-3680-8_20
28 schema:sdDatePublished 2019-04-16T08:55
29 schema:sdLicense https://scigraph.springernature.com/explorer/license/
30 schema:sdPublisher N3741f6cb04774fd4b7696554611d81d8
31 schema:url https://link.springer.com/10.1007%2F978-94-011-3680-8_20
32 sgo:license sg:explorer/license/
33 sgo:sdDataset chapters
34 rdf:type schema:Chapter
35 N0986ddbe988a4e7ab10e04492e5f0f99 rdf:first sg:person.011665564261.31
36 rdf:rest N7a08417f8b99466d894a237418b5f378
37 N3741f6cb04774fd4b7696554611d81d8 schema:name Springer Nature - SN SciGraph project
38 rdf:type schema:Organization
39 N3bf0672d5754485dbc4055cdb0cb9d07 schema:location Dordrecht
40 schema:name Springer Netherlands
41 rdf:type schema:Organisation
42 N6bd5d9a3656d45049d04bacd1df01822 schema:familyName Grange
43 schema:givenName P.
44 rdf:type schema:Person
45 N7a08417f8b99466d894a237418b5f378 rdf:first sg:person.016415413307.34
46 rdf:rest rdf:nil
47 N86348be30c2041609a0e0166f3e2d75c schema:name dimensions_id
48 schema:value pub.1010381914
49 rdf:type schema:PropertyValue
50 N967c96fb12ed455db50c0fd9d71bf7cc schema:isbn 978-1-85166-693-5
51 978-94-011-3680-8
52 schema:name Interfaces in New Materials
53 rdf:type schema:Book
54 Na822fafe78cb4496b3a23b4ca2cfa89b schema:name doi
55 schema:value 10.1007/978-94-011-3680-8_20
56 rdf:type schema:PropertyValue
57 Nb0521b7f3435461daf79853ac3d6442c rdf:first sg:person.013773701247.34
58 rdf:rest Nf34cece276e04c74bab50b60458b3dfa
59 Nb6a12337120d4bcb9cc2313e95b2f883 rdf:first Nc3b9f2e55194439bab2e6f87c8e0b30d
60 rdf:rest rdf:nil
61 Nb7df6e98063844779364191c74c4a661 rdf:first sg:person.010456220671.05
62 rdf:rest Nb0521b7f3435461daf79853ac3d6442c
63 Nc3b9f2e55194439bab2e6f87c8e0b30d schema:familyName Delmon
64 schema:givenName B.
65 rdf:type schema:Person
66 Nd142324a3257434e87b51580536f7075 rdf:first sg:person.0642063214.31
67 rdf:rest Nb7df6e98063844779364191c74c4a661
68 Nd7d804af9acf4c6e967bc97f7a33a5dd schema:name readcube_id
69 schema:value 3175df4c642237f3825036a216c8f7ffec16729365ac58857279ce25fe92f582
70 rdf:type schema:PropertyValue
71 Ne4f31e5d6a89444fa2f89432a66ff6dc rdf:first N6bd5d9a3656d45049d04bacd1df01822
72 rdf:rest Nb6a12337120d4bcb9cc2313e95b2f883
73 Nf34cece276e04c74bab50b60458b3dfa rdf:first sg:person.014522177047.01
74 rdf:rest N0986ddbe988a4e7ab10e04492e5f0f99
75 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
76 schema:name Engineering
77 rdf:type schema:DefinedTerm
78 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
79 schema:name Materials Engineering
80 rdf:type schema:DefinedTerm
81 sg:person.010456220671.05 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
82 schema:familyName Goessens
83 schema:givenName C.
84 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010456220671.05
85 rdf:type schema:Person
86 sg:person.011665564261.31 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
87 schema:familyName De Veirman
88 schema:givenName A.
89 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011665564261.31
90 rdf:type schema:Person
91 sg:person.013773701247.34 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
92 schema:familyName Schryvers
93 schema:givenName D.
94 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013773701247.34
95 rdf:type schema:Person
96 sg:person.014522177047.01 schema:affiliation https://www.grid.ac/institutes/grid.423787.d
97 schema:familyName Van Havenbergh
98 schema:givenName J.
99 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014522177047.01
100 rdf:type schema:Person
101 sg:person.016415413307.34 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
102 schema:familyName Van Landuyt
103 schema:givenName J.
104 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016415413307.34
105 rdf:type schema:Person
106 sg:person.0642063214.31 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
107 schema:familyName Van Tendeloo
108 schema:givenName G.
109 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0642063214.31
110 rdf:type schema:Person
111 https://doi.org/10.1002/jemt.1060080307 schema:sameAs https://app.dimensions.ai/details/publication/pub.1022310284
112 rdf:type schema:CreativeWork
113 https://doi.org/10.1002/pssa.2211040216 schema:sameAs https://app.dimensions.ai/details/publication/pub.1033244982
114 rdf:type schema:CreativeWork
115 https://doi.org/10.1002/pssa.2211050122 schema:sameAs https://app.dimensions.ai/details/publication/pub.1017006989
116 rdf:type schema:CreativeWork
117 https://doi.org/10.1016/0022-5088(90)90203-v schema:sameAs https://app.dimensions.ai/details/publication/pub.1033142823
118 rdf:type schema:CreativeWork
119 https://doi.org/10.1016/0304-3991(89)90045-4 schema:sameAs https://app.dimensions.ai/details/publication/pub.1030278102
120 rdf:type schema:CreativeWork
121 https://doi.org/10.1016/0921-4534(90)90682-5 schema:sameAs https://app.dimensions.ai/details/publication/pub.1005025858
122 rdf:type schema:CreativeWork
123 https://doi.org/10.1149/1.2119609 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012707836
124 rdf:type schema:CreativeWork
125 https://doi.org/10.1209/0295-5075/4/2/013 schema:sameAs https://app.dimensions.ai/details/publication/pub.1064230867
126 rdf:type schema:CreativeWork
127 https://www.grid.ac/institutes/grid.423787.d schema:alternateName Agfa-Gevaert (Belgium)
128 schema:name AGFA GEVAERT N.V., Mortsel, Belgium
129 University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium
130 rdf:type schema:Organization
131 https://www.grid.ac/institutes/grid.5284.b schema:alternateName University of Antwerp
132 schema:name University of Antwerp (RUCA), Groenenborgerlaan 171, B2020, Antwerp, Belgium
133 rdf:type schema:Organization
 




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