Ontology type: schema:Chapter
2011-03-23
AUTHORSIvan Kaban , P. Jóvári , T. Petkova , Plamen Petkov , A. Stoilova , B. Beuneu , W. Hoyer , N. Mattern , J. Eckert
ABSTRACTThe atomic structure of (Ge0.2Se0.8)85B15 and (Ge0.2Se0.8)85In15 chalcogenide glasses has been studied with X-ray diffraction, neutron diffraction and extended X-ray absorption fine structure measurements. The reverse Monte Carlo simulation technique has been used for the generation of atomic configurations satisfying the experimental data sets and some constraints. The models obtained are analyzed in terms of partial pair distribution functions, most probable interatomic distances and coordination numbers. More... »
PAGES195-202
Nanotechnological Basis for Advanced Sensors
ISBN
978-94-007-0902-7
978-94-007-0903-4
http://scigraph.springernature.com/pub.10.1007/978-94-007-0903-4_20
DOIhttp://dx.doi.org/10.1007/978-94-007-0903-4_20
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