New Experiments Elucidating the Current Limiting Mechanisms of Ag-Sheathed (Bi,Pb)2Sr2Ca2Cu3Ox Tapes View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1999

AUTHORS

D. C. Larbalestier , J. Wa. Anderson , S. E. Babcock , X. Y. Cai , S. E. Dorris , M. Feldmann , J. Jiang , Q. Li , J. A. Parrell , R. Parrella , M. Polak , A. Polyanskii , G. N. Riley , M. Rupich , Y. Wu

ABSTRACT

Multiple current limiting mechanisms exist from the nanometer to millimeter scale in Ag-sheathed (Bi,Pb)-2223 tapes. Recent studies of the zero-field critical current density (Jc (0T, 77K)), the irreversibility field (H*) and the crack microstructure elucidate these properties. We show that H*(77K) can vary significantly over the range ∼120–260 mT, independently of Jc (0T, 77K). Cracks, actual or incipient, exist on the sub to several hundred micron scale. Surface magneto optical imaging of whole tapes, correlated to subsequent ultrasonic fracture analysis of the bare 2223 filaments extracted by dissolving away the Ag shows that even composites having Jc (0T, 77K) values of 60 kA/cm2 exhibit strong signs of unhealed rolling damage. These combined studies show that today’s very best 2223 tapes are still far from full optimization. More... »

PAGES

805-810

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-4-431-66874-9_187

DOI

http://dx.doi.org/10.1007/978-4-431-66874-9_187

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1038510322


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