Some Simulation Techniques for Surface Analysis View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2007-01-01

AUTHORS

Umpei Nagashima , Tohru Sasaki , Masaru Tsukada

ABSTRACT

STM (Scanning Tunneling Microscopy) is a kind of Scanning Probing Microscopy such as AFM, KFM etc, and they are powerful tools for surface analysis. Especially STM can observe the surface electronic structure of sample. But it does not directly observe atoms on the surface. Therefore it is important that STM images are compared with simulation images.In view of this situation, we are developing STM simulator, which calculates the tunnel current in Tip-Surface system on each pixel point with given bias voltage.The STM simulator is implemented with LCAO scheme, and we have another plan with Plane Wave basis scheme as CP (Car-Parrinello) method. In the latter case, large scale 3D-FFT calculation is necessary. Then we have made a prototype of reconfigurable hardware acceleration engine.We introduce the outline of STM simulator and a 3D-FFT accelerator for CP method in this paper. More... »

PAGES

352-356

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-4-431-49022-7_71

DOI

http://dx.doi.org/10.1007/978-4-431-49022-7_71

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1037166015


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information and Computing Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0801", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Artificial Intelligence and Image Processing", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Research Institute for Computational Sciences, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, 305-8568, Tsukuba, Ibaraki, Japan", 
          "id": "http://www.grid.ac/institutes/grid.208504.b", 
          "name": [
            "Research Institute for Computational Sciences, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, 305-8568, Tsukuba, Ibaraki, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Nagashima", 
        "givenName": "Umpei", 
        "id": "sg:person.0643621411.69", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0643621411.69"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "A Priori Microsystems, Inc, 1102, 4-51-1 Nakasaiwai-cho, Saiwai-ku, 212-0012, Kawasaki, Kanagawa, Japan", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "A Priori Microsystems, Inc, 1102, 4-51-1 Nakasaiwai-cho, Saiwai-ku, 212-0012, Kawasaki, Kanagawa, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Sasaki", 
        "givenName": "Tohru", 
        "id": "sg:person.011007420463.39", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011007420463.39"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Department of Nano-science and Nano-engineering, Graduate School of Science and Engineering Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, 162-0041, Tokyo, Japan", 
          "id": "http://www.grid.ac/institutes/grid.5290.e", 
          "name": [
            "Department of Nano-science and Nano-engineering, Graduate School of Science and Engineering Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, 162-0041, Tokyo, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Tsukada", 
        "givenName": "Masaru", 
        "id": "sg:person.016242434421.06", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016242434421.06"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2007-01-01", 
    "datePublishedReg": "2007-01-01", 
    "description": "STM (Scanning Tunneling Microscopy) is a kind of Scanning Probing Microscopy such as AFM, KFM etc, and they are powerful tools for surface analysis. Especially STM can observe the surface electronic structure of sample. But it does not directly observe atoms on the surface. Therefore it is important that STM images are compared with simulation images.In view of this situation, we are developing STM simulator, which calculates the tunnel current in Tip-Surface system on each pixel point with given bias voltage.The STM simulator is implemented with LCAO scheme, and we have another plan with Plane Wave basis scheme as CP (Car-Parrinello) method. In the latter case, large scale 3D-FFT calculation is necessary. Then we have made a prototype of reconfigurable hardware acceleration engine.We introduce the outline of STM simulator and a 3D-FFT accelerator for CP method in this paper.", 
    "editor": [
      {
        "familyName": "Koyamada", 
        "givenName": "Koji", 
        "type": "Person"
      }, 
      {
        "familyName": "Tamura", 
        "givenName": "Shinsuke", 
        "type": "Person"
      }, 
      {
        "familyName": "Ono", 
        "givenName": "Osamu", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-4-431-49022-7_71", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-4-431-49021-0", 
        "978-4-431-49022-7"
      ], 
      "name": "Systems Modeling and Simulation", 
      "type": "Book"
    }, 
    "keywords": [
      "acceleration engine", 
      "kind of scanning", 
      "pixel points", 
      "simulation images", 
      "FFT calculation", 
      "simulator", 
      "simulation techniques", 
      "CP method", 
      "images", 
      "scheme", 
      "large scale", 
      "powerful tool", 
      "prototype", 
      "engine", 
      "accelerator", 
      "tool", 
      "basis scheme", 
      "method", 
      "system", 
      "technique", 
      "kind", 
      "tip-surface system", 
      "situation", 
      "surface analysis", 
      "view", 
      "plan", 
      "outline", 
      "bias voltage", 
      "point", 
      "analysis", 
      "tunnel current", 
      "scanning", 
      "latter case", 
      "surface electronic structure", 
      "KFM", 
      "structure", 
      "voltage", 
      "cases", 
      "AFM", 
      "current", 
      "scale", 
      "LCAO scheme", 
      "surface", 
      "microscopy", 
      "STM", 
      "electronic structure", 
      "calculations", 
      "STM images", 
      "samples", 
      "atoms", 
      "paper"
    ], 
    "name": "Some Simulation Techniques for Surface Analysis", 
    "pagination": "352-356", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1037166015"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-4-431-49022-7_71"
        ]
      }
    ], 
    "publisher": {
      "name": "Springer Nature", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-4-431-49022-7_71", 
      "https://app.dimensions.ai/details/publication/pub.1037166015"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2022-05-20T07:46", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/chapter/chapter_330.jsonl", 
    "type": "Chapter", 
    "url": "https://doi.org/10.1007/978-4-431-49022-7_71"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

149 TRIPLES      23 PREDICATES      78 URIs      69 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-4-431-49022-7_71 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 anzsrc-for:08
4 anzsrc-for:0801
5 schema:author Nbf46bca1e0d543d5b0f881614750ddd8
6 schema:datePublished 2007-01-01
7 schema:datePublishedReg 2007-01-01
8 schema:description STM (Scanning Tunneling Microscopy) is a kind of Scanning Probing Microscopy such as AFM, KFM etc, and they are powerful tools for surface analysis. Especially STM can observe the surface electronic structure of sample. But it does not directly observe atoms on the surface. Therefore it is important that STM images are compared with simulation images.In view of this situation, we are developing STM simulator, which calculates the tunnel current in Tip-Surface system on each pixel point with given bias voltage.The STM simulator is implemented with LCAO scheme, and we have another plan with Plane Wave basis scheme as CP (Car-Parrinello) method. In the latter case, large scale 3D-FFT calculation is necessary. Then we have made a prototype of reconfigurable hardware acceleration engine.We introduce the outline of STM simulator and a 3D-FFT accelerator for CP method in this paper.
9 schema:editor N2aad3ad3af6f4730aa569a0297a14019
10 schema:genre chapter
11 schema:inLanguage en
12 schema:isAccessibleForFree false
13 schema:isPartOf N9712c92a393c413d9cedbbacc5ce4a89
14 schema:keywords AFM
15 CP method
16 FFT calculation
17 KFM
18 LCAO scheme
19 STM
20 STM images
21 acceleration engine
22 accelerator
23 analysis
24 atoms
25 basis scheme
26 bias voltage
27 calculations
28 cases
29 current
30 electronic structure
31 engine
32 images
33 kind
34 kind of scanning
35 large scale
36 latter case
37 method
38 microscopy
39 outline
40 paper
41 pixel points
42 plan
43 point
44 powerful tool
45 prototype
46 samples
47 scale
48 scanning
49 scheme
50 simulation images
51 simulation techniques
52 simulator
53 situation
54 structure
55 surface
56 surface analysis
57 surface electronic structure
58 system
59 technique
60 tip-surface system
61 tool
62 tunnel current
63 view
64 voltage
65 schema:name Some Simulation Techniques for Surface Analysis
66 schema:pagination 352-356
67 schema:productId N86ec06106eb94fe0926d71b427bdbd68
68 Ne5ce7760876948ca9be0945ba6bfb99e
69 schema:publisher Nd8b85a68bbaa48dfbea3d70afefc8efe
70 schema:sameAs https://app.dimensions.ai/details/publication/pub.1037166015
71 https://doi.org/10.1007/978-4-431-49022-7_71
72 schema:sdDatePublished 2022-05-20T07:46
73 schema:sdLicense https://scigraph.springernature.com/explorer/license/
74 schema:sdPublisher Ne3cb33d55d86427cb7ea0e739cd4250f
75 schema:url https://doi.org/10.1007/978-4-431-49022-7_71
76 sgo:license sg:explorer/license/
77 sgo:sdDataset chapters
78 rdf:type schema:Chapter
79 N0c243483e71b4623ad69ff007af0b6d6 rdf:first sg:person.016242434421.06
80 rdf:rest rdf:nil
81 N1d743862c3184f33b84e75fba85bc58d schema:familyName Ono
82 schema:givenName Osamu
83 rdf:type schema:Person
84 N28c5d9f049ac4331ba52b158e3adbeb6 rdf:first N1d743862c3184f33b84e75fba85bc58d
85 rdf:rest rdf:nil
86 N2aad3ad3af6f4730aa569a0297a14019 rdf:first N86c3476bff634a9a9977f03b0d5e4ed4
87 rdf:rest N7614e883676445aaa8eb6d8b1c627aab
88 N50d61171f5454db4aba70727a3fc70ce schema:familyName Tamura
89 schema:givenName Shinsuke
90 rdf:type schema:Person
91 N7614e883676445aaa8eb6d8b1c627aab rdf:first N50d61171f5454db4aba70727a3fc70ce
92 rdf:rest N28c5d9f049ac4331ba52b158e3adbeb6
93 N86c3476bff634a9a9977f03b0d5e4ed4 schema:familyName Koyamada
94 schema:givenName Koji
95 rdf:type schema:Person
96 N86ec06106eb94fe0926d71b427bdbd68 schema:name dimensions_id
97 schema:value pub.1037166015
98 rdf:type schema:PropertyValue
99 N9712c92a393c413d9cedbbacc5ce4a89 schema:isbn 978-4-431-49021-0
100 978-4-431-49022-7
101 schema:name Systems Modeling and Simulation
102 rdf:type schema:Book
103 Nb7d84cff15034718a58c4b61a96d5b65 rdf:first sg:person.011007420463.39
104 rdf:rest N0c243483e71b4623ad69ff007af0b6d6
105 Nbf46bca1e0d543d5b0f881614750ddd8 rdf:first sg:person.0643621411.69
106 rdf:rest Nb7d84cff15034718a58c4b61a96d5b65
107 Nd8b85a68bbaa48dfbea3d70afefc8efe schema:name Springer Nature
108 rdf:type schema:Organisation
109 Ne3cb33d55d86427cb7ea0e739cd4250f schema:name Springer Nature - SN SciGraph project
110 rdf:type schema:Organization
111 Ne5ce7760876948ca9be0945ba6bfb99e schema:name doi
112 schema:value 10.1007/978-4-431-49022-7_71
113 rdf:type schema:PropertyValue
114 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
115 schema:name Physical Sciences
116 rdf:type schema:DefinedTerm
117 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
118 schema:name Other Physical Sciences
119 rdf:type schema:DefinedTerm
120 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
121 schema:name Information and Computing Sciences
122 rdf:type schema:DefinedTerm
123 anzsrc-for:0801 schema:inDefinedTermSet anzsrc-for:
124 schema:name Artificial Intelligence and Image Processing
125 rdf:type schema:DefinedTerm
126 sg:person.011007420463.39 schema:affiliation grid-institutes:None
127 schema:familyName Sasaki
128 schema:givenName Tohru
129 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011007420463.39
130 rdf:type schema:Person
131 sg:person.016242434421.06 schema:affiliation grid-institutes:grid.5290.e
132 schema:familyName Tsukada
133 schema:givenName Masaru
134 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016242434421.06
135 rdf:type schema:Person
136 sg:person.0643621411.69 schema:affiliation grid-institutes:grid.208504.b
137 schema:familyName Nagashima
138 schema:givenName Umpei
139 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0643621411.69
140 rdf:type schema:Person
141 grid-institutes:None schema:alternateName A Priori Microsystems, Inc, 1102, 4-51-1 Nakasaiwai-cho, Saiwai-ku, 212-0012, Kawasaki, Kanagawa, Japan
142 schema:name A Priori Microsystems, Inc, 1102, 4-51-1 Nakasaiwai-cho, Saiwai-ku, 212-0012, Kawasaki, Kanagawa, Japan
143 rdf:type schema:Organization
144 grid-institutes:grid.208504.b schema:alternateName Research Institute for Computational Sciences, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, 305-8568, Tsukuba, Ibaraki, Japan
145 schema:name Research Institute for Computational Sciences, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, 305-8568, Tsukuba, Ibaraki, Japan
146 rdf:type schema:Organization
147 grid-institutes:grid.5290.e schema:alternateName Department of Nano-science and Nano-engineering, Graduate School of Science and Engineering Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, 162-0041, Tokyo, Japan
148 schema:name Department of Nano-science and Nano-engineering, Graduate School of Science and Engineering Waseda University, 513 Waseda Tsurumaki-cho, Shinjuku-ku, 162-0041, Tokyo, Japan
149 rdf:type schema:Organization
 




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