Some Simulation Techniques for Surface Analysis View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2007-01-01

AUTHORS

Umpei Nagashima , Tohru Sasaki , Masaru Tsukada

ABSTRACT

STM (Scanning Tunneling Microscopy) is a kind of Scanning Probing Microscopy such as AFM, KFM etc, and they are powerful tools for surface analysis. Especially STM can observe the surface electronic structure of sample. But it does not directly observe atoms on the surface. Therefore it is important that STM images are compared with simulation images.In view of this situation, we are developing STM simulator, which calculates the tunnel current in Tip-Surface system on each pixel point with given bias voltage.The STM simulator is implemented with LCAO scheme, and we have another plan with Plane Wave basis scheme as CP (Car-Parrinello) method. In the latter case, large scale 3D-FFT calculation is necessary. Then we have made a prototype of reconfigurable hardware acceleration engine.We introduce the outline of STM simulator and a 3D-FFT accelerator for CP method in this paper. More... »

PAGES

352-356

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-4-431-49022-7_71

DOI

http://dx.doi.org/10.1007/978-4-431-49022-7_71

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1037166015


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