Boundary Condition Models for Terminal Current Fluctuations View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2001

AUTHORS

M. Nedjalkov , T. Grasser , H. Kosina , S. Selberherr

ABSTRACT

A stochastic approach to a recently proposed model of terminal current fluctuations is presented. Two kinds of boundary conditions suitable for noise simulations in semiconductor devices are proposed. The properties and the domain of application of the two models are investigated and the conclusions are drawn from numerical experiments.

PAGES

152-155

Book

TITLE

Simulation of Semiconductor Processes and Devices 2001

ISBN

978-3-7091-7278-0
978-3-7091-6244-6

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-7091-6244-6_34

DOI

http://dx.doi.org/10.1007/978-3-7091-6244-6_34

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1041110780


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/01", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Mathematical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0104", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Statistics", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Nedjalkov", 
        "givenName": "M.", 
        "id": "sg:person.011142023427.48", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011142023427.48"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Grasser", 
        "givenName": "T.", 
        "id": "sg:person.011270114610.10", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011270114610.10"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kosina", 
        "givenName": "H.", 
        "id": "sg:person.016550513317.72", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016550513317.72"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria", 
          "id": "http://www.grid.ac/institutes/None", 
          "name": [
            "Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Selberherr", 
        "givenName": "S.", 
        "id": "sg:person.013033344117.92", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013033344117.92"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2001", 
    "datePublishedReg": "2001-01-01", 
    "description": "A stochastic approach to a recently proposed model of terminal current fluctuations is presented. Two kinds of boundary conditions suitable for noise simulations in semiconductor devices are proposed. The properties and the domain of application of the two models are investigated and the conclusions are drawn from numerical experiments.", 
    "editor": [
      {
        "familyName": "Tsoukalas", 
        "givenName": "Dimitris", 
        "type": "Person"
      }, 
      {
        "familyName": "Tsamis", 
        "givenName": "Christos", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-7091-6244-6_34", 
    "inLanguage": "en", 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-7091-7278-0", 
        "978-3-7091-6244-6"
      ], 
      "name": "Simulation of Semiconductor Processes and Devices 2001", 
      "type": "Book"
    }, 
    "keywords": [
      "current fluctuations", 
      "stochastic approach", 
      "semiconductor devices", 
      "numerical experiments", 
      "boundary condition model", 
      "noise simulation", 
      "boundary conditions", 
      "domain of application", 
      "condition model", 
      "fluctuations", 
      "model", 
      "simulations", 
      "devices", 
      "properties", 
      "applications", 
      "conditions", 
      "experiments", 
      "approach", 
      "kind", 
      "domain", 
      "conclusion"
    ], 
    "name": "Boundary Condition Models for Terminal Current Fluctuations", 
    "pagination": "152-155", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1041110780"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-7091-6244-6_34"
        ]
      }
    ], 
    "publisher": {
      "name": "Springer Nature", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-7091-6244-6_34", 
      "https://app.dimensions.ai/details/publication/pub.1041110780"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2022-05-20T07:45", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220519/entities/gbq_results/chapter/chapter_286.jsonl", 
    "type": "Chapter", 
    "url": "https://doi.org/10.1007/978-3-7091-6244-6_34"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-3-7091-6244-6_34'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-3-7091-6244-6_34'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-3-7091-6244-6_34'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-3-7091-6244-6_34'


 

This table displays all metadata directly associated to this object as RDF triples.

107 TRIPLES      23 PREDICATES      47 URIs      40 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-7091-6244-6_34 schema:about anzsrc-for:01
2 anzsrc-for:0104
3 schema:author N651eb69448d1442a966de50f74b6904b
4 schema:datePublished 2001
5 schema:datePublishedReg 2001-01-01
6 schema:description A stochastic approach to a recently proposed model of terminal current fluctuations is presented. Two kinds of boundary conditions suitable for noise simulations in semiconductor devices are proposed. The properties and the domain of application of the two models are investigated and the conclusions are drawn from numerical experiments.
7 schema:editor N4921a154a5c04f6d908b54a39281ead4
8 schema:genre chapter
9 schema:inLanguage en
10 schema:isAccessibleForFree false
11 schema:isPartOf Nb6156cc12aff40a38c2d9f71f32b36af
12 schema:keywords applications
13 approach
14 boundary condition model
15 boundary conditions
16 conclusion
17 condition model
18 conditions
19 current fluctuations
20 devices
21 domain
22 domain of application
23 experiments
24 fluctuations
25 kind
26 model
27 noise simulation
28 numerical experiments
29 properties
30 semiconductor devices
31 simulations
32 stochastic approach
33 schema:name Boundary Condition Models for Terminal Current Fluctuations
34 schema:pagination 152-155
35 schema:productId N500658ecf1c04d2ca9e9a0cb0a8f27be
36 N6dde1c49ef724062b9b44ee6e0e6bfca
37 schema:publisher N2238354ab5c243ca8582408c1edb99af
38 schema:sameAs https://app.dimensions.ai/details/publication/pub.1041110780
39 https://doi.org/10.1007/978-3-7091-6244-6_34
40 schema:sdDatePublished 2022-05-20T07:45
41 schema:sdLicense https://scigraph.springernature.com/explorer/license/
42 schema:sdPublisher Nd924632471514b5f8446a145a97a2121
43 schema:url https://doi.org/10.1007/978-3-7091-6244-6_34
44 sgo:license sg:explorer/license/
45 sgo:sdDataset chapters
46 rdf:type schema:Chapter
47 N1eebf3e2e6a94aecb753266db9aae6dc rdf:first N69cb3b356027482aa56ab640fd64c495
48 rdf:rest rdf:nil
49 N2238354ab5c243ca8582408c1edb99af schema:name Springer Nature
50 rdf:type schema:Organisation
51 N3aefaa1f923b48918f250508e7d92188 rdf:first sg:person.016550513317.72
52 rdf:rest N7e661faddcae4ab1a3eaee0c82715e1e
53 N4921a154a5c04f6d908b54a39281ead4 rdf:first N9143e3ea553a48128ca0b424b8dbea88
54 rdf:rest N1eebf3e2e6a94aecb753266db9aae6dc
55 N500658ecf1c04d2ca9e9a0cb0a8f27be schema:name dimensions_id
56 schema:value pub.1041110780
57 rdf:type schema:PropertyValue
58 N651eb69448d1442a966de50f74b6904b rdf:first sg:person.011142023427.48
59 rdf:rest Na948934369194b7bbb83a6715b7339e1
60 N69cb3b356027482aa56ab640fd64c495 schema:familyName Tsamis
61 schema:givenName Christos
62 rdf:type schema:Person
63 N6dde1c49ef724062b9b44ee6e0e6bfca schema:name doi
64 schema:value 10.1007/978-3-7091-6244-6_34
65 rdf:type schema:PropertyValue
66 N7e661faddcae4ab1a3eaee0c82715e1e rdf:first sg:person.013033344117.92
67 rdf:rest rdf:nil
68 N9143e3ea553a48128ca0b424b8dbea88 schema:familyName Tsoukalas
69 schema:givenName Dimitris
70 rdf:type schema:Person
71 Na948934369194b7bbb83a6715b7339e1 rdf:first sg:person.011270114610.10
72 rdf:rest N3aefaa1f923b48918f250508e7d92188
73 Nb6156cc12aff40a38c2d9f71f32b36af schema:isbn 978-3-7091-6244-6
74 978-3-7091-7278-0
75 schema:name Simulation of Semiconductor Processes and Devices 2001
76 rdf:type schema:Book
77 Nd924632471514b5f8446a145a97a2121 schema:name Springer Nature - SN SciGraph project
78 rdf:type schema:Organization
79 anzsrc-for:01 schema:inDefinedTermSet anzsrc-for:
80 schema:name Mathematical Sciences
81 rdf:type schema:DefinedTerm
82 anzsrc-for:0104 schema:inDefinedTermSet anzsrc-for:
83 schema:name Statistics
84 rdf:type schema:DefinedTerm
85 sg:person.011142023427.48 schema:affiliation grid-institutes:None
86 schema:familyName Nedjalkov
87 schema:givenName M.
88 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011142023427.48
89 rdf:type schema:Person
90 sg:person.011270114610.10 schema:affiliation grid-institutes:None
91 schema:familyName Grasser
92 schema:givenName T.
93 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011270114610.10
94 rdf:type schema:Person
95 sg:person.013033344117.92 schema:affiliation grid-institutes:None
96 schema:familyName Selberherr
97 schema:givenName S.
98 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013033344117.92
99 rdf:type schema:Person
100 sg:person.016550513317.72 schema:affiliation grid-institutes:None
101 schema:familyName Kosina
102 schema:givenName H.
103 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016550513317.72
104 rdf:type schema:Person
105 grid-institutes:None schema:alternateName Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria
106 schema:name Institute for Microelectronics, TU Vienna, A-1040, Gusshausstrasse 27-29Vienna, Austria
107 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...