Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1998

AUTHORS

Denis Joyeux , François Polack

ABSTRACT

After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness. More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given. More... »

PAGES

207-216

Book

TITLE

X-Ray Microscopy and Spectromicroscopy

ISBN

978-3-642-72108-3
978-3-642-72106-9

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-72106-9_22

DOI

http://dx.doi.org/10.1007/978-3-642-72106-9_22

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1018982884


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