Ontology type: schema:Chapter
1998
AUTHORSDenis Joyeux , François Polack
ABSTRACTAfter discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness. More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given. More... »
PAGES207-216
X-Ray Microscopy and Spectromicroscopy
ISBN
978-3-642-72108-3
978-3-642-72106-9
http://scigraph.springernature.com/pub.10.1007/978-3-642-72106-9_22
DOIhttp://dx.doi.org/10.1007/978-3-642-72106-9_22
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