Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1998

AUTHORS

Denis Joyeux , François Polack

ABSTRACT

After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness. More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given. More... »

PAGES

207-216

Book

TITLE

X-Ray Microscopy and Spectromicroscopy

ISBN

978-3-642-72108-3
978-3-642-72106-9

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-72106-9_22

DOI

http://dx.doi.org/10.1007/978-3-642-72106-9_22

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1018982884


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Institut d\u2019Optique Graduate School", 
          "id": "https://www.grid.ac/institutes/grid.425181.b", 
          "name": [
            "Institut d\u2019Optique Th\u00e9orique et Appliqu\u00e9e (IOTA), BP 147, 91403\u00a0Orsay cedex, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Joyeux", 
        "givenName": "Denis", 
        "id": "sg:person.01057467207.77", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01057467207.77"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Laboratoire pour l\u2019Utilisation du Rayonnement Synchrotron (LURE), Campus d\u2019Orsay, bat 209d, 91405\u00a0Orsay cedex, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Polack", 
        "givenName": "Fran\u00e7ois", 
        "id": "sg:person.01033147151.02", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0895-3996(89)90034-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1017595083"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0969-806x(93)90323-m", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023708970"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0969-806x(93)90323-m", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1023708970"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0168-9002(94)91876-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1031045680"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0168-9002(94)91876-7", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1031045680"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1145698", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057673792"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.74.3991", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060811034"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.74.3991", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060811034"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1364/ao.29.000019", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065104367"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1364/ol.18.001367", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065214585"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1998", 
    "datePublishedReg": "1998-01-01", 
    "description": "After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moir\u00e9-based detection system, which provides a quick, nearly \u201creal-time\u201c measurement of the sample optical thickness. More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.", 
    "editor": [
      {
        "familyName": "Thieme", 
        "givenName": "J\u00fcrgen", 
        "type": "Person"
      }, 
      {
        "familyName": "Schmahl", 
        "givenName": "G\u00fcnter", 
        "type": "Person"
      }, 
      {
        "familyName": "Rudolph", 
        "givenName": "Dietbert", 
        "type": "Person"
      }, 
      {
        "familyName": "Umbach", 
        "givenName": "Eberhard", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-642-72106-9_22", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-642-72108-3", 
        "978-3-642-72106-9"
      ], 
      "name": "X-Ray Microscopy and Spectromicroscopy", 
      "type": "Book"
    }, 
    "name": "Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection", 
    "pagination": "207-216", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-642-72106-9_22"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "5a72731cc61111e1ff77190d6e33317c9748752b708e9f211d0dca1ea9c6942a"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1018982884"
        ]
      }
    ], 
    "publisher": {
      "location": "Berlin, Heidelberg", 
      "name": "Springer Berlin Heidelberg", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-642-72106-9_22", 
      "https://app.dimensions.ai/details/publication/pub.1018982884"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-16T00:48", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8700_00000254.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-3-642-72106-9_22"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

110 TRIPLES      23 PREDICATES      34 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-642-72106-9_22 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author Nfe68bec238bc44a7b00aae33aada58f9
4 schema:citation https://doi.org/10.1016/0168-9002(94)91876-7
5 https://doi.org/10.1016/0895-3996(89)90034-7
6 https://doi.org/10.1016/0969-806x(93)90323-m
7 https://doi.org/10.1063/1.1145698
8 https://doi.org/10.1103/physrevlett.74.3991
9 https://doi.org/10.1364/ao.29.000019
10 https://doi.org/10.1364/ol.18.001367
11 schema:datePublished 1998
12 schema:datePublishedReg 1998-01-01
13 schema:description After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness. More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.
14 schema:editor N894a4e1db3a5430082daa14f29e3737c
15 schema:genre chapter
16 schema:inLanguage en
17 schema:isAccessibleForFree false
18 schema:isPartOf N9b85b07cc34f427aacf534d9771fb148
19 schema:name Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection
20 schema:pagination 207-216
21 schema:productId N0bb554957d7f468c8f4f2f6a56266b0d
22 Nc9dee77c029e4e3898e781d3578e9336
23 Nd178fd9316454d65a557b749ddd2b283
24 schema:publisher N907f5a2725ee42f8b6086d11a46139db
25 schema:sameAs https://app.dimensions.ai/details/publication/pub.1018982884
26 https://doi.org/10.1007/978-3-642-72106-9_22
27 schema:sdDatePublished 2019-04-16T00:48
28 schema:sdLicense https://scigraph.springernature.com/explorer/license/
29 schema:sdPublisher N7cad1701364844518cfd6c47afb6bcde
30 schema:url http://link.springer.com/10.1007/978-3-642-72106-9_22
31 sgo:license sg:explorer/license/
32 sgo:sdDataset chapters
33 rdf:type schema:Chapter
34 N0bb554957d7f468c8f4f2f6a56266b0d schema:name readcube_id
35 schema:value 5a72731cc61111e1ff77190d6e33317c9748752b708e9f211d0dca1ea9c6942a
36 rdf:type schema:PropertyValue
37 N28dd659fab8e45e1bf59fb3845189650 schema:familyName Thieme
38 schema:givenName Jürgen
39 rdf:type schema:Person
40 N292c83c2e59c4d4b9448ead633332ec1 rdf:first Ncc81b00de6ae4791864a58d5412f31cd
41 rdf:rest rdf:nil
42 N39a8760137f04d47b41d8940a566b8ab schema:name Laboratoire pour l’Utilisation du Rayonnement Synchrotron (LURE), Campus d’Orsay, bat 209d, 91405 Orsay cedex, France
43 rdf:type schema:Organization
44 N4b350f8dbe5e41fb824670c286b9b680 rdf:first Ne52dc18525c2485da0b931472b2d6fb8
45 rdf:rest Nb3d3ea7af0ff47fdb153c6e0d5fef9d3
46 N6e5f8119502946499d5adb8f3591afc8 rdf:first sg:person.01033147151.02
47 rdf:rest rdf:nil
48 N7cad1701364844518cfd6c47afb6bcde schema:name Springer Nature - SN SciGraph project
49 rdf:type schema:Organization
50 N894a4e1db3a5430082daa14f29e3737c rdf:first N28dd659fab8e45e1bf59fb3845189650
51 rdf:rest N4b350f8dbe5e41fb824670c286b9b680
52 N907f5a2725ee42f8b6086d11a46139db schema:location Berlin, Heidelberg
53 schema:name Springer Berlin Heidelberg
54 rdf:type schema:Organisation
55 N9555246ab64e496c961c65212f3c0b15 schema:familyName Rudolph
56 schema:givenName Dietbert
57 rdf:type schema:Person
58 N9b85b07cc34f427aacf534d9771fb148 schema:isbn 978-3-642-72106-9
59 978-3-642-72108-3
60 schema:name X-Ray Microscopy and Spectromicroscopy
61 rdf:type schema:Book
62 Nb3d3ea7af0ff47fdb153c6e0d5fef9d3 rdf:first N9555246ab64e496c961c65212f3c0b15
63 rdf:rest N292c83c2e59c4d4b9448ead633332ec1
64 Nc9dee77c029e4e3898e781d3578e9336 schema:name dimensions_id
65 schema:value pub.1018982884
66 rdf:type schema:PropertyValue
67 Ncc81b00de6ae4791864a58d5412f31cd schema:familyName Umbach
68 schema:givenName Eberhard
69 rdf:type schema:Person
70 Nd178fd9316454d65a557b749ddd2b283 schema:name doi
71 schema:value 10.1007/978-3-642-72106-9_22
72 rdf:type schema:PropertyValue
73 Ne52dc18525c2485da0b931472b2d6fb8 schema:familyName Schmahl
74 schema:givenName Günter
75 rdf:type schema:Person
76 Nfe68bec238bc44a7b00aae33aada58f9 rdf:first sg:person.01057467207.77
77 rdf:rest N6e5f8119502946499d5adb8f3591afc8
78 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
79 schema:name Physical Sciences
80 rdf:type schema:DefinedTerm
81 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
82 schema:name Other Physical Sciences
83 rdf:type schema:DefinedTerm
84 sg:person.01033147151.02 schema:affiliation N39a8760137f04d47b41d8940a566b8ab
85 schema:familyName Polack
86 schema:givenName François
87 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02
88 rdf:type schema:Person
89 sg:person.01057467207.77 schema:affiliation https://www.grid.ac/institutes/grid.425181.b
90 schema:familyName Joyeux
91 schema:givenName Denis
92 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01057467207.77
93 rdf:type schema:Person
94 https://doi.org/10.1016/0168-9002(94)91876-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1031045680
95 rdf:type schema:CreativeWork
96 https://doi.org/10.1016/0895-3996(89)90034-7 schema:sameAs https://app.dimensions.ai/details/publication/pub.1017595083
97 rdf:type schema:CreativeWork
98 https://doi.org/10.1016/0969-806x(93)90323-m schema:sameAs https://app.dimensions.ai/details/publication/pub.1023708970
99 rdf:type schema:CreativeWork
100 https://doi.org/10.1063/1.1145698 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057673792
101 rdf:type schema:CreativeWork
102 https://doi.org/10.1103/physrevlett.74.3991 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060811034
103 rdf:type schema:CreativeWork
104 https://doi.org/10.1364/ao.29.000019 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065104367
105 rdf:type schema:CreativeWork
106 https://doi.org/10.1364/ol.18.001367 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065214585
107 rdf:type schema:CreativeWork
108 https://www.grid.ac/institutes/grid.425181.b schema:alternateName Institut d’Optique Graduate School
109 schema:name Institut d’Optique Théorique et Appliquée (IOTA), BP 147, 91403 Orsay cedex, France
110 rdf:type schema:Organization
 




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