Theory of Non-Contact Atomic Force Microscopy View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2002

AUTHORS

Masaru Tsukada , Naruo Sasaki , Michel Gauthier , Katsunori Tagami , Satoshi Watanabe

ABSTRACT

In spite of the rich potential of non-contact atomic force microscopy, a valid theoretical base for the analysis of experimental data has not yet been provided. The force and dissipation involved in NC-AFM include more complicated atomic processes than in the case of scanning tunneling microscopy (STM). In this chapter, several fundamental problems related to NC-AFM are discussed from the theoretical viewpoint. First we discuss the nonlinear dynamics of the cantilever, which transfers microscopic information to macroscopic observables of the cantilever oscillation. Then on this basis, numerical simulation methods for NC-AFM images are presented and applied to some typical surfaces. The remarkable influence of the tip—surface interaction for imaging the dynamic surface is discussed for the case of the Si(111) surface. The effects of the tip chemical state and structural details are presented for some surface and tip combinations. The irreversible surface atomic processes induced by the tip are studied for the Si(100) surface, and its effect on dissipation mechanisms and images is considered. More... »

PAGES

257-278

Book

TITLE

Noncontact Atomic Force Microscopy

ISBN

978-3-642-62772-9
978-3-642-56019-4

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-56019-4_15

DOI

http://dx.doi.org/10.1007/978-3-642-56019-4_15

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1029110668


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