Atomic Force Acoustic Microscopy View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2013

AUTHORS

U. Rabe , M. Kopycinska-Müller , S. Hirsekorn

ABSTRACT

This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), the basic theoretical models, the experimental techniques to obtain quantitative values of local elastic constants, and non-linear AFAM. Analytical and finite element models describing transverse flexural vibrations of AFM cantilevers with and without tip-surface contact are recapitulated. The models are suitable for micro fabricated silicon cantilevers of approximately rectangular cross section which are typically used in AFAM. Experimental methods to obtain single-point as well as array measurements and full spectroscopy images are discussed in combination with the respective reference methods for calibration. In a non-linear AFAM experiment, the vibration amplitudes of the sample surface and the cantilever are measured quantitatively with an interferometer at different excitation amplitudes, and the full tip-sample interaction force curve is reconstructed using a frequency dependent transfer function. More... »

PAGES

123-153

References to SciGraph publications

Book

TITLE

Acoustic Scanning Probe Microscopy

ISBN

978-3-642-27493-0
978-3-642-27494-7

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-27494-7_5

DOI

http://dx.doi.org/10.1007/978-3-642-27494-7_5

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1019067110


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