On Local Handling of Inner Equations in Compact Models View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2010-05-14

AUTHORS

Uwe Feldmann , Masataka Miyake , Takahiro Kajiwara , Mitiko Miura-Mattausch

ABSTRACT

The burden of solving inner equations in compact models of semiconductor devices (such as transistors) is often shifted to the host circuit simulator. Schur complement techniques for local handling of these equations may help to reduce the size of the model stamp, which – depending on the host simulator – may have a positive impact on CPU time and memory needs. Some practical aspects of applying these concepts in compact modeling are discussed. A formulation is presented which accounts for the specific way of model evaluation in circuit simulation. It can be realized in a standard code for flat model evaluation by adding a software shell around the model core function itself.First tests with an advanced high voltage MOS model demonstrate the feasibility of this approach in terms of accuracy, iterations and runtimes. More... »

PAGES

143-150

Book

TITLE

Scientific Computing in Electrical Engineering SCEE 2008

ISBN

978-3-642-12293-4
978-3-642-12294-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-12294-1_19

DOI

http://dx.doi.org/10.1007/978-3-642-12294-1_19

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1052455008


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information and Computing Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0803", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Computer Software", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan", 
          "id": "http://www.grid.ac/institutes/grid.257022.0", 
          "name": [
            "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Feldmann", 
        "givenName": "Uwe", 
        "id": "sg:person.010662756515.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010662756515.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan", 
          "id": "http://www.grid.ac/institutes/grid.257022.0", 
          "name": [
            "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Miyake", 
        "givenName": "Masataka", 
        "id": "sg:person.013330437353.94", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013330437353.94"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan", 
          "id": "http://www.grid.ac/institutes/grid.257022.0", 
          "name": [
            "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Kajiwara", 
        "givenName": "Takahiro", 
        "id": "sg:person.015452645553.77", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015452645553.77"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan", 
          "id": "http://www.grid.ac/institutes/grid.257022.0", 
          "name": [
            "HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Miura-Mattausch", 
        "givenName": "Mitiko", 
        "id": "sg:person.015610203677.04", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015610203677.04"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2010-05-14", 
    "datePublishedReg": "2010-05-14", 
    "description": "The burden of solving inner equations in compact models of semiconductor devices (such as transistors) is often shifted to the host circuit simulator. Schur complement techniques for local handling of these equations may help to reduce the size of the model stamp, which \u2013 depending on the host simulator \u2013 may have a positive impact on CPU time and memory needs. Some practical aspects of applying these concepts in compact modeling are discussed. A formulation is presented which accounts for the specific way of model evaluation in circuit simulation. It can be realized in a standard code for flat model evaluation by adding a software shell around the model core function itself.First tests with an advanced high voltage MOS model demonstrate the feasibility of this approach in terms of accuracy, iterations and runtimes.", 
    "editor": [
      {
        "familyName": "Roos", 
        "givenName": "Janne", 
        "type": "Person"
      }, 
      {
        "familyName": "Costa", 
        "givenName": "Luis R.J.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-642-12294-1_19", 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-642-12293-4", 
        "978-3-642-12294-1"
      ], 
      "name": "Scientific Computing in Electrical Engineering SCEE 2008", 
      "type": "Book"
    }, 
    "keywords": [
      "inner equations", 
      "Schur complement technique", 
      "compact model", 
      "local handling", 
      "complement technique", 
      "CPU time", 
      "semiconductor devices", 
      "model evaluation", 
      "equations", 
      "terms of accuracy", 
      "circuit simulator", 
      "Compact Modeling", 
      "MOS model", 
      "circuit simulation", 
      "software shell", 
      "memory needs", 
      "practical aspects", 
      "iteration", 
      "model", 
      "devices", 
      "simulator", 
      "shell", 
      "formulation", 
      "simulations", 
      "modeling", 
      "stamp", 
      "standard code", 
      "accuracy", 
      "size", 
      "terms", 
      "core functions", 
      "code", 
      "runtime", 
      "technique", 
      "handling", 
      "function", 
      "approach", 
      "feasibility", 
      "concept", 
      "first test", 
      "way", 
      "time", 
      "specific ways", 
      "evaluation", 
      "aspects", 
      "need", 
      "test", 
      "impact", 
      "burden", 
      "positive impact"
    ], 
    "name": "On Local Handling of Inner Equations in Compact Models", 
    "pagination": "143-150", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1052455008"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-642-12294-1_19"
        ]
      }
    ], 
    "publisher": {
      "name": "Springer Nature", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-642-12294-1_19", 
      "https://app.dimensions.ai/details/publication/pub.1052455008"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2022-10-01T06:54", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20221001/entities/gbq_results/chapter/chapter_188.jsonl", 
    "type": "Chapter", 
    "url": "https://doi.org/10.1007/978-3-642-12294-1_19"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

135 TRIPLES      22 PREDICATES      74 URIs      67 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-642-12294-1_19 schema:about anzsrc-for:08
2 anzsrc-for:0803
3 schema:author N1813473b198d48469962d4d16f58be09
4 schema:datePublished 2010-05-14
5 schema:datePublishedReg 2010-05-14
6 schema:description The burden of solving inner equations in compact models of semiconductor devices (such as transistors) is often shifted to the host circuit simulator. Schur complement techniques for local handling of these equations may help to reduce the size of the model stamp, which – depending on the host simulator – may have a positive impact on CPU time and memory needs. Some practical aspects of applying these concepts in compact modeling are discussed. A formulation is presented which accounts for the specific way of model evaluation in circuit simulation. It can be realized in a standard code for flat model evaluation by adding a software shell around the model core function itself.First tests with an advanced high voltage MOS model demonstrate the feasibility of this approach in terms of accuracy, iterations and runtimes.
7 schema:editor N3bb77310ec4b411c9d20cd93ff5fe9e7
8 schema:genre chapter
9 schema:isAccessibleForFree false
10 schema:isPartOf N1204517718b54118b8493e44657e1b19
11 schema:keywords CPU time
12 Compact Modeling
13 MOS model
14 Schur complement technique
15 accuracy
16 approach
17 aspects
18 burden
19 circuit simulation
20 circuit simulator
21 code
22 compact model
23 complement technique
24 concept
25 core functions
26 devices
27 equations
28 evaluation
29 feasibility
30 first test
31 formulation
32 function
33 handling
34 impact
35 inner equations
36 iteration
37 local handling
38 memory needs
39 model
40 model evaluation
41 modeling
42 need
43 positive impact
44 practical aspects
45 runtime
46 semiconductor devices
47 shell
48 simulations
49 simulator
50 size
51 software shell
52 specific ways
53 stamp
54 standard code
55 technique
56 terms
57 terms of accuracy
58 test
59 time
60 way
61 schema:name On Local Handling of Inner Equations in Compact Models
62 schema:pagination 143-150
63 schema:productId Nb8867d0d8c1c44cabc9da299f619715d
64 Nf707122a682c43ab832d66ef5f571a19
65 schema:publisher Na83919d584134bcf9b97c3299e613275
66 schema:sameAs https://app.dimensions.ai/details/publication/pub.1052455008
67 https://doi.org/10.1007/978-3-642-12294-1_19
68 schema:sdDatePublished 2022-10-01T06:54
69 schema:sdLicense https://scigraph.springernature.com/explorer/license/
70 schema:sdPublisher N939ea1b41fcd43f1a54e47c4d179a31c
71 schema:url https://doi.org/10.1007/978-3-642-12294-1_19
72 sgo:license sg:explorer/license/
73 sgo:sdDataset chapters
74 rdf:type schema:Chapter
75 N1204517718b54118b8493e44657e1b19 schema:isbn 978-3-642-12293-4
76 978-3-642-12294-1
77 schema:name Scientific Computing in Electrical Engineering SCEE 2008
78 rdf:type schema:Book
79 N1813473b198d48469962d4d16f58be09 rdf:first sg:person.010662756515.87
80 rdf:rest N57ba6fa1ffb246aea603438c032c7763
81 N3bb77310ec4b411c9d20cd93ff5fe9e7 rdf:first N571ad9a386b44ca7bd2d8190484fcf37
82 rdf:rest Nab133a8285ce47b0a1c40d09f7b7a474
83 N571ad9a386b44ca7bd2d8190484fcf37 schema:familyName Roos
84 schema:givenName Janne
85 rdf:type schema:Person
86 N57ba6fa1ffb246aea603438c032c7763 rdf:first sg:person.013330437353.94
87 rdf:rest Ndf7ac3c1c634462ca0ca7c13b299ce79
88 N939ea1b41fcd43f1a54e47c4d179a31c schema:name Springer Nature - SN SciGraph project
89 rdf:type schema:Organization
90 Na83919d584134bcf9b97c3299e613275 schema:name Springer Nature
91 rdf:type schema:Organisation
92 Nab133a8285ce47b0a1c40d09f7b7a474 rdf:first Nb78b43c4c4254a24815dfe682531a744
93 rdf:rest rdf:nil
94 Nb78b43c4c4254a24815dfe682531a744 schema:familyName Costa
95 schema:givenName Luis R.J.
96 rdf:type schema:Person
97 Nb8867d0d8c1c44cabc9da299f619715d schema:name doi
98 schema:value 10.1007/978-3-642-12294-1_19
99 rdf:type schema:PropertyValue
100 Ndf7ac3c1c634462ca0ca7c13b299ce79 rdf:first sg:person.015452645553.77
101 rdf:rest Ne6732900ad674410aab4b3778016b31c
102 Ne6732900ad674410aab4b3778016b31c rdf:first sg:person.015610203677.04
103 rdf:rest rdf:nil
104 Nf707122a682c43ab832d66ef5f571a19 schema:name dimensions_id
105 schema:value pub.1052455008
106 rdf:type schema:PropertyValue
107 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
108 schema:name Information and Computing Sciences
109 rdf:type schema:DefinedTerm
110 anzsrc-for:0803 schema:inDefinedTermSet anzsrc-for:
111 schema:name Computer Software
112 rdf:type schema:DefinedTerm
113 sg:person.010662756515.87 schema:affiliation grid-institutes:grid.257022.0
114 schema:familyName Feldmann
115 schema:givenName Uwe
116 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010662756515.87
117 rdf:type schema:Person
118 sg:person.013330437353.94 schema:affiliation grid-institutes:grid.257022.0
119 schema:familyName Miyake
120 schema:givenName Masataka
121 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013330437353.94
122 rdf:type schema:Person
123 sg:person.015452645553.77 schema:affiliation grid-institutes:grid.257022.0
124 schema:familyName Kajiwara
125 schema:givenName Takahiro
126 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015452645553.77
127 rdf:type schema:Person
128 sg:person.015610203677.04 schema:affiliation grid-institutes:grid.257022.0
129 schema:familyName Miura-Mattausch
130 schema:givenName Mitiko
131 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015610203677.04
132 rdf:type schema:Person
133 grid-institutes:grid.257022.0 schema:alternateName HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan
134 schema:name HiSIM Research Center, Hiroshima-University, 1-3-1 Kagamiyama, 739-0046, Higashi-Hiroshima, Japan
135 rdf:type schema:Organization
 




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