Probabilistic Model of Fault Detection in Quantum Circuits View Full Text


Ontology type: schema:Chapter      Open Access: True


Chapter Info

DATE

2010-03-08

AUTHORS

A. Banerjee , A. Pathak

ABSTRACT

Since the introduction of quantum computation, several protocols (such as quantum cryptography, quantum algorithm, quantum teleportation) have established quantum computing as a superior future technology. Each of these processes involves quantum circuits, which are prone to different kinds of faults. Consequently, it is important to verify whether the circuit hardware is defective or not. The systematic procedure to do so is known as fault testing. Normally testing is done by providing a set of valid input states and measuring the corresponding output states and comparing the output states with the expected output states of the perfect (fault less) circuit. This particular set of input vectors are known as test set [6]. If there exists a fault then the next step would be to find the exact location and nature of the defect. This is known as fault localization. A model that explains the logical or functional faults in the circuit is a fault model. Conventional fault models include (i) stuck at faults, (ii) bridge faults, and (iii) delay faults. These fault models have been rigorously studied for conventional irreversible circuit. But with the advent of reversible classical computing and quantum computing it has become important to enlarge the domain of the study on test vectors. More... »

PAGES

297-304

Book

TITLE

Quantum Quenching, Annealing and Computation

ISBN

978-3-642-11469-4
978-3-642-11470-0

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-642-11470-0_15

DOI

http://dx.doi.org/10.1007/978-3-642-11470-0_15

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1034460219


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