Study of microstructure and strain relaxation on thin InXGa1−xN epilayers with medium and high In contents View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2008

AUTHORS

F. M. Morales , J. G. Lozano , R. García , V. Lebedev , S. Hauguth-Frank , V. Cimalla , O. Ambacher , D. González

ABSTRACT

GaN and InGaN with a high content of Ga became the most important semiconductors for light emission and detection in the visible and the near UV spectral regions. On the other hand, the fabrication of InGaN epilayers with medium and high concentration of In is still not well developed. However, the control of the growth of alloys within this In-rich range would give rise to expand the optical activity of InGaN till the near IR. Recently, the compositional dependencies of photoconductivity and electron transport properties for metal-semiconductor-metal photodetectors based on Inrich InGaN ultra-thin films were studied [1]. There, the electron density profiles and low-field mobilities for different compositions of InGaN were calculated. It was demonstrated that in contrast to bulk InN exhibiting a dominating surface electron accumulation, the free electrons in ultra-thin InxGa1−xN/GaN (0.5 More... »

PAGES

77-78

References to SciGraph publications

Book

TITLE

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

ISBN

978-3-540-85225-4
978-3-540-85226-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_39

DOI

http://dx.doi.org/10.1007/978-3-540-85226-1_39

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1045023836


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of C\u00e1diz", 
          "id": "https://www.grid.ac/institutes/grid.7759.c", 
          "name": [
            "Departamento de Ciencia de los Materiales e Ingenier\u00eda Metal\u00fargica y Qu\u00edmica Inorg\u00e1nica, Facultad de Ciencias, Universidad de C\u00e1diz, 11510\u00a0Puerto Real C\u00e1diz, Spain"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Morales", 
        "givenName": "F. M.", 
        "id": "sg:person.013623270340.30", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013623270340.30"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of C\u00e1diz", 
          "id": "https://www.grid.ac/institutes/grid.7759.c", 
          "name": [
            "Departamento de Ciencia de los Materiales e Ingenier\u00eda Metal\u00fargica y Qu\u00edmica Inorg\u00e1nica, Facultad de Ciencias, Universidad de C\u00e1diz, 11510\u00a0Puerto Real C\u00e1diz, Spain"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lozano", 
        "givenName": "J. G.", 
        "id": "sg:person.014524711227.11", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014524711227.11"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of C\u00e1diz", 
          "id": "https://www.grid.ac/institutes/grid.7759.c", 
          "name": [
            "Departamento de Ciencia de los Materiales e Ingenier\u00eda Metal\u00fargica y Qu\u00edmica Inorg\u00e1nica, Facultad de Ciencias, Universidad de C\u00e1diz, 11510\u00a0Puerto Real C\u00e1diz, Spain"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Garc\u00eda", 
        "givenName": "R.", 
        "id": "sg:person.013121011300.65", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013121011300.65"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ilmenau University of Technology", 
          "id": "https://www.grid.ac/institutes/grid.6553.5", 
          "name": [
            "Institute of Micro- and Nanotechnologies, Technical University Ilmenau, 98693\u00a0Ilmenau, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lebedev", 
        "givenName": "V.", 
        "id": "sg:person.01035634171.31", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01035634171.31"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ilmenau University of Technology", 
          "id": "https://www.grid.ac/institutes/grid.6553.5", 
          "name": [
            "Institute of Micro- and Nanotechnologies, Technical University Ilmenau, 98693\u00a0Ilmenau, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hauguth-Frank", 
        "givenName": "S.", 
        "id": "sg:person.0645051153.59", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0645051153.59"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Ilmenau University of Technology", 
          "id": "https://www.grid.ac/institutes/grid.6553.5", 
          "name": [
            "Institute of Micro- and Nanotechnologies, Technical University Ilmenau, 98693\u00a0Ilmenau, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Cimalla", 
        "givenName": "V.", 
        "id": "sg:person.0672057122.10", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0672057122.10"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Fraunhofer Institute for Applied Solid State Physics, Tullastrasse 72, D-79108\u00a0Freiburg, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ambacher", 
        "givenName": "O.", 
        "id": "sg:person.01352162115.95", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01352162115.95"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of C\u00e1diz", 
          "id": "https://www.grid.ac/institutes/grid.7759.c", 
          "name": [
            "Departamento de Ciencia de los Materiales e Ingenier\u00eda Metal\u00fargica y Qu\u00edmica Inorg\u00e1nica, Facultad de Ciencias, Universidad de C\u00e1diz, 11510\u00a0Puerto Real C\u00e1diz, Spain"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Gonz\u00e1lez", 
        "givenName": "D.", 
        "id": "sg:person.0655552403.67", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0655552403.67"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1038/nmat2037", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1024419280", 
          "https://doi.org/10.1038/nmat2037"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2008", 
    "datePublishedReg": "2008-01-01", 
    "description": "GaN and InGaN with a high content of Ga became the most important semiconductors for light emission and detection in the visible and the near UV spectral regions. On the other hand, the fabrication of InGaN epilayers with medium and high concentration of In is still not well developed. However, the control of the growth of alloys within this In-rich range would give rise to expand the optical activity of InGaN till the near IR. Recently, the compositional dependencies of photoconductivity and electron transport properties for metal-semiconductor-metal photodetectors based on Inrich InGaN ultra-thin films were studied [1]. There, the electron density profiles and low-field mobilities for different compositions of InGaN were calculated. It was demonstrated that in contrast to bulk InN exhibiting a dominating surface electron accumulation, the free electrons in ultra-thin InxGa1\u2212xN/GaN (0.5
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_39'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_39'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_39'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_39'


 

This table displays all metadata directly associated to this object as RDF triples.

128 TRIPLES      23 PREDICATES      28 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-540-85226-1_39 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N85781509f35540cd9c5c27df2085a4ca
4 schema:citation sg:pub.10.1038/nmat2037
5 schema:datePublished 2008
6 schema:datePublishedReg 2008-01-01
7 schema:description GaN and InGaN with a high content of Ga became the most important semiconductors for light emission and detection in the visible and the near UV spectral regions. On the other hand, the fabrication of InGaN epilayers with medium and high concentration of In is still not well developed. However, the control of the growth of alloys within this In-rich range would give rise to expand the optical activity of InGaN till the near IR. Recently, the compositional dependencies of photoconductivity and electron transport properties for metal-semiconductor-metal photodetectors based on Inrich InGaN ultra-thin films were studied [1]. There, the electron density profiles and low-field mobilities for different compositions of InGaN were calculated. It was demonstrated that in contrast to bulk InN exhibiting a dominating surface electron accumulation, the free electrons in ultra-thin InxGa1−xN/GaN (0.5<x<1) heterostructures tend to accumulate mostly at the buried InGaN/GaN interface.
8 schema:editor Nb29c02716a244e0fae598c384058d668
9 schema:genre chapter
10 schema:inLanguage en
11 schema:isAccessibleForFree false
12 schema:isPartOf Nddf93367ee5b4df38aadf42c78928f0d
13 schema:name Study of microstructure and strain relaxation on thin InXGa1−xN epilayers with medium and high In contents
14 schema:pagination 77-78
15 schema:productId N0dce381887b341cd962fd0d6fa5a410d
16 N3179963720544f39a01ac2d9463c8533
17 Na7523d1f70a04486abc62134dde3eb08
18 schema:publisher N6c9c5f9827e04ee8a7c2c99360189242
19 schema:sameAs https://app.dimensions.ai/details/publication/pub.1045023836
20 https://doi.org/10.1007/978-3-540-85226-1_39
21 schema:sdDatePublished 2019-04-15T15:23
22 schema:sdLicense https://scigraph.springernature.com/explorer/license/
23 schema:sdPublisher Nd799839ae53641dcb19d80a6aecc0e01
24 schema:url http://link.springer.com/10.1007/978-3-540-85226-1_39
25 sgo:license sg:explorer/license/
26 sgo:sdDataset chapters
27 rdf:type schema:Chapter
28 N0dce381887b341cd962fd0d6fa5a410d schema:name doi
29 schema:value 10.1007/978-3-540-85226-1_39
30 rdf:type schema:PropertyValue
31 N19aed95b9afc4d1d915af6eee9f9269a rdf:first sg:person.014524711227.11
32 rdf:rest N42ddad0f353248edad2f831457a338ac
33 N3179963720544f39a01ac2d9463c8533 schema:name readcube_id
34 schema:value d676597260c9c4316d7eb8dbfe71aad9ad626b98a7df0a620b5a92780691a9a1
35 rdf:type schema:PropertyValue
36 N3423e7166414451299ad637b685e8111 rdf:first sg:person.0672057122.10
37 rdf:rest N883fae1dd43949eeb6957605f86fbab2
38 N3ed69a08c7394b7291573ad1b03f6d56 schema:familyName Schwedt
39 schema:givenName Alexander
40 rdf:type schema:Person
41 N42ddad0f353248edad2f831457a338ac rdf:first sg:person.013121011300.65
42 rdf:rest N973dc301398a46e6bca94e2e58f1cf17
43 N6c9c5f9827e04ee8a7c2c99360189242 schema:location Berlin, Heidelberg
44 schema:name Springer Berlin Heidelberg
45 rdf:type schema:Organisation
46 N85781509f35540cd9c5c27df2085a4ca rdf:first sg:person.013623270340.30
47 rdf:rest N19aed95b9afc4d1d915af6eee9f9269a
48 N883fae1dd43949eeb6957605f86fbab2 rdf:first sg:person.01352162115.95
49 rdf:rest N9c72c3f5cc8b405c81505f88f4bd130c
50 N973dc301398a46e6bca94e2e58f1cf17 rdf:first sg:person.01035634171.31
51 rdf:rest Nfb0e4956cc264928a1a4574174e69cf8
52 N9c72c3f5cc8b405c81505f88f4bd130c rdf:first sg:person.0655552403.67
53 rdf:rest rdf:nil
54 Na7523d1f70a04486abc62134dde3eb08 schema:name dimensions_id
55 schema:value pub.1045023836
56 rdf:type schema:PropertyValue
57 Nb29c02716a244e0fae598c384058d668 rdf:first Ne3e1b3f226a84fdd98b6a4fb784281ab
58 rdf:rest Nd230f25d2d9047d186f61c02d541ac08
59 Nbc4e8f87803146caa238a89395020e9f schema:name Fraunhofer Institute for Applied Solid State Physics, Tullastrasse 72, D-79108 Freiburg, Germany
60 rdf:type schema:Organization
61 Nd230f25d2d9047d186f61c02d541ac08 rdf:first N3ed69a08c7394b7291573ad1b03f6d56
62 rdf:rest rdf:nil
63 Nd799839ae53641dcb19d80a6aecc0e01 schema:name Springer Nature - SN SciGraph project
64 rdf:type schema:Organization
65 Nddf93367ee5b4df38aadf42c78928f0d schema:isbn 978-3-540-85225-4
66 978-3-540-85226-1
67 schema:name EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
68 rdf:type schema:Book
69 Ne3e1b3f226a84fdd98b6a4fb784281ab schema:familyName Richter
70 schema:givenName Silvia
71 rdf:type schema:Person
72 Nfb0e4956cc264928a1a4574174e69cf8 rdf:first sg:person.0645051153.59
73 rdf:rest N3423e7166414451299ad637b685e8111
74 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
75 schema:name Engineering
76 rdf:type schema:DefinedTerm
77 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
78 schema:name Materials Engineering
79 rdf:type schema:DefinedTerm
80 sg:person.01035634171.31 schema:affiliation https://www.grid.ac/institutes/grid.6553.5
81 schema:familyName Lebedev
82 schema:givenName V.
83 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01035634171.31
84 rdf:type schema:Person
85 sg:person.013121011300.65 schema:affiliation https://www.grid.ac/institutes/grid.7759.c
86 schema:familyName García
87 schema:givenName R.
88 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013121011300.65
89 rdf:type schema:Person
90 sg:person.01352162115.95 schema:affiliation Nbc4e8f87803146caa238a89395020e9f
91 schema:familyName Ambacher
92 schema:givenName O.
93 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01352162115.95
94 rdf:type schema:Person
95 sg:person.013623270340.30 schema:affiliation https://www.grid.ac/institutes/grid.7759.c
96 schema:familyName Morales
97 schema:givenName F. M.
98 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013623270340.30
99 rdf:type schema:Person
100 sg:person.014524711227.11 schema:affiliation https://www.grid.ac/institutes/grid.7759.c
101 schema:familyName Lozano
102 schema:givenName J. G.
103 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014524711227.11
104 rdf:type schema:Person
105 sg:person.0645051153.59 schema:affiliation https://www.grid.ac/institutes/grid.6553.5
106 schema:familyName Hauguth-Frank
107 schema:givenName S.
108 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0645051153.59
109 rdf:type schema:Person
110 sg:person.0655552403.67 schema:affiliation https://www.grid.ac/institutes/grid.7759.c
111 schema:familyName González
112 schema:givenName D.
113 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0655552403.67
114 rdf:type schema:Person
115 sg:person.0672057122.10 schema:affiliation https://www.grid.ac/institutes/grid.6553.5
116 schema:familyName Cimalla
117 schema:givenName V.
118 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0672057122.10
119 rdf:type schema:Person
120 sg:pub.10.1038/nmat2037 schema:sameAs https://app.dimensions.ai/details/publication/pub.1024419280
121 https://doi.org/10.1038/nmat2037
122 rdf:type schema:CreativeWork
123 https://www.grid.ac/institutes/grid.6553.5 schema:alternateName Ilmenau University of Technology
124 schema:name Institute of Micro- and Nanotechnologies, Technical University Ilmenau, 98693 Ilmenau, Germany
125 rdf:type schema:Organization
126 https://www.grid.ac/institutes/grid.7759.c schema:alternateName University of Cádiz
127 schema:name Departamento de Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Facultad de Ciencias, Universidad de Cádiz, 11510 Puerto Real Cádiz, Spain
128 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...