TEM study of the NiTi shape memory thin film View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2008

AUTHORS

B. Wang , A. Safi , T. Pardoen , A. Boe , J. P. Raskin , X. Wang , J. J. Vlassak , D. Schryvers

ABSTRACT

Recently, NiTi thin films have received a growing interest owing to the large stress induced transformation strain and the high work density involved in that transformation

PAGES

509-510

Book

TITLE

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

ISBN

978-3-540-85225-4
978-3-540-85226-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255

DOI

http://dx.doi.org/10.1007/978-3-540-85226-1_255

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1027706426


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Wang", 
        "givenName": "B.", 
        "id": "sg:person.0732603266.25", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0732603266.25"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Universit\u00e9 Catholique de Louvain", 
          "id": "https://www.grid.ac/institutes/grid.7942.8", 
          "name": [
            "Department of Materials Science and Processes, Universit\u00e9 catholique de Louvain (UCL), IMAP, Place Sainte Barbe 2, B-1348, Louvain-la-Neuve, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Safi", 
        "givenName": "A.", 
        "id": "sg:person.013444360675.33", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013444360675.33"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Universit\u00e9 Catholique de Louvain", 
          "id": "https://www.grid.ac/institutes/grid.7942.8", 
          "name": [
            "Department of Materials Science and Processes, Universit\u00e9 catholique de Louvain (UCL), IMAP, Place Sainte Barbe 2, B-1348, Louvain-la-Neuve, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Pardoen", 
        "givenName": "T.", 
        "id": "sg:person.01163260266.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01163260266.87"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Department of Electrical Engineering, ELEC, Universit\u00e9 catholique de Louvain (UCL), B-1348, Louvain-la-Neuve, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Boe", 
        "givenName": "A.", 
        "id": "sg:person.015360360641.26", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015360360641.26"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Department of Electrical Engineering, ELEC, Universit\u00e9 catholique de Louvain (UCL), B-1348, Louvain-la-Neuve, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Raskin", 
        "givenName": "J. P.", 
        "id": "sg:person.01330112061.00", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01330112061.00"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Harvard University", 
          "id": "https://www.grid.ac/institutes/grid.38142.3c", 
          "name": [
            "Division of Engineering and Applied Sciences, Harvard University, 02138-2901, Cambridge, MA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Wang", 
        "givenName": "X.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Harvard University", 
          "id": "https://www.grid.ac/institutes/grid.38142.3c", 
          "name": [
            "Division of Engineering and Applied Sciences, Harvard University, 02138-2901, Cambridge, MA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Vlassak", 
        "givenName": "J. J.", 
        "id": "sg:person.0706715721.58", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0706715721.58"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Antwerp", 
          "id": "https://www.grid.ac/institutes/grid.5284.b", 
          "name": [
            "EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020, Antwerp, Belgium"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Schryvers", 
        "givenName": "D.", 
        "id": "sg:person.013773701247.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013773701247.34"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/j.msea.2003.10.338", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1017605678"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/j.msea.2007.04.101", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049450404"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1049/mnl:20065068", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056886120"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1049/mnl:20065068", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1056886120"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "2008", 
    "datePublishedReg": "2008-01-01", 
    "description": "Recently, NiTi thin films have received a growing interest owing to the large stress induced transformation strain and the high work density involved in that transformation", 
    "editor": [
      {
        "familyName": "Richter", 
        "givenName": "Silvia", 
        "type": "Person"
      }, 
      {
        "familyName": "Schwedt", 
        "givenName": "Alexander", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-540-85226-1_255", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-540-85225-4", 
        "978-3-540-85226-1"
      ], 
      "name": "EMC 2008 14th European Microscopy Congress 1\u20135 September 2008, Aachen, Germany", 
      "type": "Book"
    }, 
    "name": "TEM study of the NiTi shape memory thin film", 
    "pagination": "509-510", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-540-85226-1_255"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "83fce42fb1333f078255a4e82a2db6c55d2945248e2ab46e96583030e1ab47ab"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1027706426"
        ]
      }
    ], 
    "publisher": {
      "location": "Berlin, Heidelberg", 
      "name": "Springer Berlin Heidelberg", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-540-85226-1_255", 
      "https://app.dimensions.ai/details/publication/pub.1027706426"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-16T06:09", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000350_0000000350/records_77554_00000000.jsonl", 
    "type": "Chapter", 
    "url": "https://link.springer.com/10.1007%2F978-3-540-85226-1_255"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255'


 

This table displays all metadata directly associated to this object as RDF triples.

129 TRIPLES      22 PREDICATES      28 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-540-85226-1_255 schema:author N81dbe109a26a4d88aefe2ff19a19a328
2 schema:citation https://doi.org/10.1016/j.msea.2003.10.338
3 https://doi.org/10.1016/j.msea.2007.04.101
4 https://doi.org/10.1049/mnl:20065068
5 schema:datePublished 2008
6 schema:datePublishedReg 2008-01-01
7 schema:description Recently, NiTi thin films have received a growing interest owing to the large stress induced transformation strain and the high work density involved in that transformation
8 schema:editor N4c3e65508027468983c459d09165ec2b
9 schema:genre chapter
10 schema:inLanguage en
11 schema:isAccessibleForFree false
12 schema:isPartOf Nf84e16628fdd46849a9139c2fdf7e404
13 schema:name TEM study of the NiTi shape memory thin film
14 schema:pagination 509-510
15 schema:productId N13ecc81982a04f1eb7a28cb4f7dd8330
16 N6ecf674a527f40b6b15d44f4a0cbe4a9
17 N7c55eea50e4c4a4eaa0dd482653d08cd
18 schema:publisher N2eddf8637ece49498d8d753cdbf28ed5
19 schema:sameAs https://app.dimensions.ai/details/publication/pub.1027706426
20 https://doi.org/10.1007/978-3-540-85226-1_255
21 schema:sdDatePublished 2019-04-16T06:09
22 schema:sdLicense https://scigraph.springernature.com/explorer/license/
23 schema:sdPublisher N2b0ea0e5bc4b4c31bfcc68f238c4862e
24 schema:url https://link.springer.com/10.1007%2F978-3-540-85226-1_255
25 sgo:license sg:explorer/license/
26 sgo:sdDataset chapters
27 rdf:type schema:Chapter
28 N13ecc81982a04f1eb7a28cb4f7dd8330 schema:name dimensions_id
29 schema:value pub.1027706426
30 rdf:type schema:PropertyValue
31 N29863c9c6ff2424eb475a3d85df0ec6b rdf:first sg:person.013444360675.33
32 rdf:rest N87d866eb5bfe446baae510b91c74d464
33 N2b0ea0e5bc4b4c31bfcc68f238c4862e schema:name Springer Nature - SN SciGraph project
34 rdf:type schema:Organization
35 N2eddf8637ece49498d8d753cdbf28ed5 schema:location Berlin, Heidelberg
36 schema:name Springer Berlin Heidelberg
37 rdf:type schema:Organisation
38 N39c4a25542f640b085fd4966e78e130f rdf:first Nda7c9be2a698437b9aac74048527a33e
39 rdf:rest rdf:nil
40 N4c3e65508027468983c459d09165ec2b rdf:first N6fdb60849e5449728865ef8cc73a9e36
41 rdf:rest N39c4a25542f640b085fd4966e78e130f
42 N58f21fd9ab304f5a9024207ff48d4430 schema:affiliation https://www.grid.ac/institutes/grid.38142.3c
43 schema:familyName Wang
44 schema:givenName X.
45 rdf:type schema:Person
46 N6ecf674a527f40b6b15d44f4a0cbe4a9 schema:name doi
47 schema:value 10.1007/978-3-540-85226-1_255
48 rdf:type schema:PropertyValue
49 N6fdb60849e5449728865ef8cc73a9e36 schema:familyName Richter
50 schema:givenName Silvia
51 rdf:type schema:Person
52 N7c55eea50e4c4a4eaa0dd482653d08cd schema:name readcube_id
53 schema:value 83fce42fb1333f078255a4e82a2db6c55d2945248e2ab46e96583030e1ab47ab
54 rdf:type schema:PropertyValue
55 N81dbe109a26a4d88aefe2ff19a19a328 rdf:first sg:person.0732603266.25
56 rdf:rest N29863c9c6ff2424eb475a3d85df0ec6b
57 N87d866eb5bfe446baae510b91c74d464 rdf:first sg:person.01163260266.87
58 rdf:rest N9364474c2eb44cca99332d9b0eb70524
59 N9364474c2eb44cca99332d9b0eb70524 rdf:first sg:person.015360360641.26
60 rdf:rest Ne43082196b3b49c4b1bf15f6b88d6f63
61 N98f9d6fb3eac43c08cdafe9dc0ef4b47 schema:name Department of Electrical Engineering, ELEC, Université catholique de Louvain (UCL), B-1348, Louvain-la-Neuve, Belgium
62 rdf:type schema:Organization
63 Nb5e9b747c25a41e890db9ebad2361ddd rdf:first sg:person.013773701247.34
64 rdf:rest rdf:nil
65 Nc4125faaa0cf488bb96fe2810737d730 rdf:first sg:person.0706715721.58
66 rdf:rest Nb5e9b747c25a41e890db9ebad2361ddd
67 Nda7c9be2a698437b9aac74048527a33e schema:familyName Schwedt
68 schema:givenName Alexander
69 rdf:type schema:Person
70 Ne0c3182a391b4ffc82a822d76c8dec62 schema:name Department of Electrical Engineering, ELEC, Université catholique de Louvain (UCL), B-1348, Louvain-la-Neuve, Belgium
71 rdf:type schema:Organization
72 Ne43082196b3b49c4b1bf15f6b88d6f63 rdf:first sg:person.01330112061.00
73 rdf:rest Nf71579a5bb4344ceba9c77dcabfae18e
74 Nf71579a5bb4344ceba9c77dcabfae18e rdf:first N58f21fd9ab304f5a9024207ff48d4430
75 rdf:rest Nc4125faaa0cf488bb96fe2810737d730
76 Nf84e16628fdd46849a9139c2fdf7e404 schema:isbn 978-3-540-85225-4
77 978-3-540-85226-1
78 schema:name EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
79 rdf:type schema:Book
80 sg:person.01163260266.87 schema:affiliation https://www.grid.ac/institutes/grid.7942.8
81 schema:familyName Pardoen
82 schema:givenName T.
83 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01163260266.87
84 rdf:type schema:Person
85 sg:person.01330112061.00 schema:affiliation N98f9d6fb3eac43c08cdafe9dc0ef4b47
86 schema:familyName Raskin
87 schema:givenName J. P.
88 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01330112061.00
89 rdf:type schema:Person
90 sg:person.013444360675.33 schema:affiliation https://www.grid.ac/institutes/grid.7942.8
91 schema:familyName Safi
92 schema:givenName A.
93 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013444360675.33
94 rdf:type schema:Person
95 sg:person.013773701247.34 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
96 schema:familyName Schryvers
97 schema:givenName D.
98 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.013773701247.34
99 rdf:type schema:Person
100 sg:person.015360360641.26 schema:affiliation Ne0c3182a391b4ffc82a822d76c8dec62
101 schema:familyName Boe
102 schema:givenName A.
103 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015360360641.26
104 rdf:type schema:Person
105 sg:person.0706715721.58 schema:affiliation https://www.grid.ac/institutes/grid.38142.3c
106 schema:familyName Vlassak
107 schema:givenName J. J.
108 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0706715721.58
109 rdf:type schema:Person
110 sg:person.0732603266.25 schema:affiliation https://www.grid.ac/institutes/grid.5284.b
111 schema:familyName Wang
112 schema:givenName B.
113 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0732603266.25
114 rdf:type schema:Person
115 https://doi.org/10.1016/j.msea.2003.10.338 schema:sameAs https://app.dimensions.ai/details/publication/pub.1017605678
116 rdf:type schema:CreativeWork
117 https://doi.org/10.1016/j.msea.2007.04.101 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049450404
118 rdf:type schema:CreativeWork
119 https://doi.org/10.1049/mnl:20065068 schema:sameAs https://app.dimensions.ai/details/publication/pub.1056886120
120 rdf:type schema:CreativeWork
121 https://www.grid.ac/institutes/grid.38142.3c schema:alternateName Harvard University
122 schema:name Division of Engineering and Applied Sciences, Harvard University, 02138-2901, Cambridge, MA
123 rdf:type schema:Organization
124 https://www.grid.ac/institutes/grid.5284.b schema:alternateName University of Antwerp
125 schema:name EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020, Antwerp, Belgium
126 rdf:type schema:Organization
127 https://www.grid.ac/institutes/grid.7942.8 schema:alternateName Université Catholique de Louvain
128 schema:name Department of Materials Science and Processes, Université catholique de Louvain (UCL), IMAP, Place Sainte Barbe 2, B-1348, Louvain-la-Neuve, Belgium
129 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...