TEM study of the NiTi shape memory thin film View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2008

AUTHORS

B. Wang , A. Safi , T. Pardoen , A. Boe , J. P. Raskin , X. Wang , J. J. Vlassak , D. Schryvers

ABSTRACT

Recently, NiTi thin films have received a growing interest owing to the large stress induced transformation strain and the high work density involved in that transformation

PAGES

509-510

Book

TITLE

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

ISBN

978-3-540-85225-4
978-3-540-85226-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-85226-1_255

DOI

http://dx.doi.org/10.1007/978-3-540-85226-1_255

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1027706426


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