Prospects for Direct Refraction Index Measurement by Soft X-Ray Interferometry View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1992

AUTHORS

F. Polack , D. Joyeux

ABSTRACT

We investigate the feasibility of a direct determination of a refractive index in the soft x-ray range, by using interferometry. The method (classical in the optical range) consists in the measurement of the fringe pattern shift due to the transmission through the sample. Such measurements can be performed by using a simple, wavefront division interferometer: the Fresnel twin mirrors interferometer. The required coherence can be easily obtained from an undulator synchrotron radiation source. The final accuracy of the refractive index will presumably be limited by absorption, which restricts the allowable sample thickness, and therefore the fringe shift to be measured. More... »

PAGES

301-305

Book

TITLE

X-Ray Microscopy III

ISBN

978-3-662-13894-6
978-3-540-46887-5

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-46887-5_69

DOI

http://dx.doi.org/10.1007/978-3-540-46887-5_69

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1012398010


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "name": [
            "LURE, CNRS UP8, bat. 209d, Campus d\u2019Orsay, F-91405\u00a0Orsay Cedex, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Polack", 
        "givenName": "F.", 
        "id": "sg:person.01033147151.02", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institut d\u2019Optique Graduate School", 
          "id": "https://www.grid.ac/institutes/grid.425181.b", 
          "name": [
            "Institut d\u2019Optique (CNRS UA14), BP147, F-91403\u00a0Orsay Cedex, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Joyeux", 
        "givenName": "D.", 
        "id": "sg:person.01057467207.77", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01057467207.77"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0092-640x(82)90002-x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1007993115"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0378-4363(88)90140-4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1027616348"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0378-4363(88)90140-4", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1027616348"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0895-3996(89)90036-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049720329"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1364/ao.29.000019", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1065104367"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1992", 
    "datePublishedReg": "1992-01-01", 
    "description": "We investigate the feasibility of a direct determination of a refractive index in the soft x-ray range, by using interferometry. The method (classical in the optical range) consists in the measurement of the fringe pattern shift due to the transmission through the sample. Such measurements can be performed by using a simple, wavefront division interferometer: the Fresnel twin mirrors interferometer. The required coherence can be easily obtained from an undulator synchrotron radiation source. The final accuracy of the refractive index will presumably be limited by absorption, which restricts the allowable sample thickness, and therefore the fringe shift to be measured.", 
    "editor": [
      {
        "familyName": "Michette", 
        "givenName": "Alan G.", 
        "type": "Person"
      }, 
      {
        "familyName": "Morrison", 
        "givenName": "Graeme R.", 
        "type": "Person"
      }, 
      {
        "familyName": "Buckley", 
        "givenName": "Chistopher J.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-540-46887-5_69", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-662-13894-6", 
        "978-3-540-46887-5"
      ], 
      "name": "X-Ray Microscopy III", 
      "type": "Book"
    }, 
    "name": "Prospects for Direct Refraction Index Measurement by Soft X-Ray Interferometry", 
    "pagination": "301-305", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-540-46887-5_69"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "3b11478b12c578e6f7308f7570b1cbdb6301c9243a9fb603a8a7c322386751fe"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1012398010"
        ]
      }
    ], 
    "publisher": {
      "location": "Berlin, Heidelberg", 
      "name": "Springer Berlin Heidelberg", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-540-46887-5_69", 
      "https://app.dimensions.ai/details/publication/pub.1012398010"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T21:00", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8690_00000250.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-3-540-46887-5_69"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

96 TRIPLES      23 PREDICATES      31 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-540-46887-5_69 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N06db87e158fd496fa50b9f5c0efeef99
4 schema:citation https://doi.org/10.1016/0092-640x(82)90002-x
5 https://doi.org/10.1016/0378-4363(88)90140-4
6 https://doi.org/10.1016/0895-3996(89)90036-0
7 https://doi.org/10.1364/ao.29.000019
8 schema:datePublished 1992
9 schema:datePublishedReg 1992-01-01
10 schema:description We investigate the feasibility of a direct determination of a refractive index in the soft x-ray range, by using interferometry. The method (classical in the optical range) consists in the measurement of the fringe pattern shift due to the transmission through the sample. Such measurements can be performed by using a simple, wavefront division interferometer: the Fresnel twin mirrors interferometer. The required coherence can be easily obtained from an undulator synchrotron radiation source. The final accuracy of the refractive index will presumably be limited by absorption, which restricts the allowable sample thickness, and therefore the fringe shift to be measured.
11 schema:editor N59752ad777db43818f69f7bfcc0d42b1
12 schema:genre chapter
13 schema:inLanguage en
14 schema:isAccessibleForFree false
15 schema:isPartOf N4da3eebf287c454fa9b9689f10cbd4d7
16 schema:name Prospects for Direct Refraction Index Measurement by Soft X-Ray Interferometry
17 schema:pagination 301-305
18 schema:productId N5dacea6b549b4170982667946de78c77
19 N71b3335debfd4a53aa40ca86fa9f6228
20 Nba5717ac6625446d8775c64e5ee4b580
21 schema:publisher N0ffd68bea15f4f338b50a92499ff1a5c
22 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012398010
23 https://doi.org/10.1007/978-3-540-46887-5_69
24 schema:sdDatePublished 2019-04-15T21:00
25 schema:sdLicense https://scigraph.springernature.com/explorer/license/
26 schema:sdPublisher N69894eaed68c442ab383f11d5ca6f91e
27 schema:url http://link.springer.com/10.1007/978-3-540-46887-5_69
28 sgo:license sg:explorer/license/
29 sgo:sdDataset chapters
30 rdf:type schema:Chapter
31 N06db87e158fd496fa50b9f5c0efeef99 rdf:first sg:person.01033147151.02
32 rdf:rest N8c65695e11c84f21a60644d0e075c38c
33 N0ffd68bea15f4f338b50a92499ff1a5c schema:location Berlin, Heidelberg
34 schema:name Springer Berlin Heidelberg
35 rdf:type schema:Organisation
36 N2fd4ce7183a64a9ebc5a732ab7980c99 schema:name LURE, CNRS UP8, bat. 209d, Campus d’Orsay, F-91405 Orsay Cedex, France
37 rdf:type schema:Organization
38 N4da3eebf287c454fa9b9689f10cbd4d7 schema:isbn 978-3-540-46887-5
39 978-3-662-13894-6
40 schema:name X-Ray Microscopy III
41 rdf:type schema:Book
42 N58b6df804b564860a0112b5627e18258 schema:familyName Buckley
43 schema:givenName Chistopher J.
44 rdf:type schema:Person
45 N59752ad777db43818f69f7bfcc0d42b1 rdf:first N8af435be3ae34035970344ee0fcc40d4
46 rdf:rest N6bf8a9688326401b846ce0d44d93da39
47 N5dacea6b549b4170982667946de78c77 schema:name doi
48 schema:value 10.1007/978-3-540-46887-5_69
49 rdf:type schema:PropertyValue
50 N69894eaed68c442ab383f11d5ca6f91e schema:name Springer Nature - SN SciGraph project
51 rdf:type schema:Organization
52 N6bf8a9688326401b846ce0d44d93da39 rdf:first Nbeb4cbcbc7744677a913f0ac763e386f
53 rdf:rest Ne1870edc994344f5a0a2fa92dbb5e0de
54 N71b3335debfd4a53aa40ca86fa9f6228 schema:name readcube_id
55 schema:value 3b11478b12c578e6f7308f7570b1cbdb6301c9243a9fb603a8a7c322386751fe
56 rdf:type schema:PropertyValue
57 N8af435be3ae34035970344ee0fcc40d4 schema:familyName Michette
58 schema:givenName Alan G.
59 rdf:type schema:Person
60 N8c65695e11c84f21a60644d0e075c38c rdf:first sg:person.01057467207.77
61 rdf:rest rdf:nil
62 Nba5717ac6625446d8775c64e5ee4b580 schema:name dimensions_id
63 schema:value pub.1012398010
64 rdf:type schema:PropertyValue
65 Nbeb4cbcbc7744677a913f0ac763e386f schema:familyName Morrison
66 schema:givenName Graeme R.
67 rdf:type schema:Person
68 Ne1870edc994344f5a0a2fa92dbb5e0de rdf:first N58b6df804b564860a0112b5627e18258
69 rdf:rest rdf:nil
70 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
71 schema:name Physical Sciences
72 rdf:type schema:DefinedTerm
73 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
74 schema:name Other Physical Sciences
75 rdf:type schema:DefinedTerm
76 sg:person.01033147151.02 schema:affiliation N2fd4ce7183a64a9ebc5a732ab7980c99
77 schema:familyName Polack
78 schema:givenName F.
79 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02
80 rdf:type schema:Person
81 sg:person.01057467207.77 schema:affiliation https://www.grid.ac/institutes/grid.425181.b
82 schema:familyName Joyeux
83 schema:givenName D.
84 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01057467207.77
85 rdf:type schema:Person
86 https://doi.org/10.1016/0092-640x(82)90002-x schema:sameAs https://app.dimensions.ai/details/publication/pub.1007993115
87 rdf:type schema:CreativeWork
88 https://doi.org/10.1016/0378-4363(88)90140-4 schema:sameAs https://app.dimensions.ai/details/publication/pub.1027616348
89 rdf:type schema:CreativeWork
90 https://doi.org/10.1016/0895-3996(89)90036-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1049720329
91 rdf:type schema:CreativeWork
92 https://doi.org/10.1364/ao.29.000019 schema:sameAs https://app.dimensions.ai/details/publication/pub.1065104367
93 rdf:type schema:CreativeWork
94 https://www.grid.ac/institutes/grid.425181.b schema:alternateName Institut d’Optique Graduate School
95 schema:name Institut d’Optique (CNRS UA14), BP147, F-91403 Orsay Cedex, France
96 rdf:type schema:Organization
 




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