Ontology type: schema:Chapter
1988
AUTHORSF. Polack , S. Lowenthal , D. Phalippou , P. Fournet
ABSTRACTIn X-ray contact microscopy, the image detector is usually a photoresist which is observed, after development, with an electron microscope. With this simple technique very high resolutions have been demonstrated, but quantitative measurements are very difficult to obtain [1,2]. Quantitative and real-time images can be produced on a high resolution image converter. In the fifties MOLLENSTEDT and HUANG realized such an apparatus which worked with a tungsten target X-ray tube [3]. A few years ago, we began the construction of a similar instrument to be used with soft X-ray radiation of the ACO storage ring [4]. More... »
PAGES220-227
X-Ray Microscopy II
ISBN
978-3-662-14490-9
978-3-540-39246-0
http://scigraph.springernature.com/pub.10.1007/978-3-540-39246-0_39
DOIhttp://dx.doi.org/10.1007/978-3-540-39246-0_39
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