Photoelectron X-Ray Microscopy: Recent Developments View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1984

AUTHORS

F. Polack , S. Lowenthal

ABSTRACT

Using absorption edges for contrast enhancement or microchemical analysis has been often claimed as one of the main advantages of the soft x-ray microscopy; the K edges of carbon to aluminium and L23 edges of phosphorus to bromine are located in the 0, 8–9 nm wavelength range which is very favourable to image biological objects. But in practice, this opportunity has been very seldom used [26.1]. As a matter of fact, none of the common techniques of x-ray microscopy is really suitable for this purpose. More... »

PAGES

251-260

Book

TITLE

X-Ray Microscopy

ISBN

978-3-662-13547-1
978-3-540-38833-3

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27

DOI

http://dx.doi.org/10.1007/978-3-540-38833-3_27

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1009739000


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of Paris-Sud", 
          "id": "https://www.grid.ac/institutes/grid.5842.b", 
          "name": [
            "L.U.R.E., Bat. 209 C, Universit\u00e9 Paris-Sud, F-91405\u00a0Orsay, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Polack", 
        "givenName": "F.", 
        "id": "sg:person.01033147151.02", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Institut d\u2019Optique Graduate School", 
          "id": "https://www.grid.ac/institutes/grid.425181.b", 
          "name": [
            "Institut d\u2019Optique, B.P. 43, F-91406\u00a0Orsay, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Lowenthal", 
        "givenName": "S.", 
        "id": "sg:person.010262362145.29", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010262362145.29"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "sg:pub.10.1007/bf01341344", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1026774349", 
          "https://doi.org/10.1007/bf01341344"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1111/j.1749-6632.1980.tb47234.x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1031130069"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1111/j.1749-6632.1980.tb47229.x", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1049958769"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.1136565", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057663752"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.323938", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057922949"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.329789", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057933101"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1984", 
    "datePublishedReg": "1984-01-01", 
    "description": "Using absorption edges for contrast enhancement or microchemical analysis has been often claimed as one of the main advantages of the soft x-ray microscopy; the K edges of carbon to aluminium and L23 edges of phosphorus to bromine are located in the 0, 8\u20139 nm wavelength range which is very favourable to image biological objects. But in practice, this opportunity has been very seldom used [26.1]. As a matter of fact, none of the common techniques of x-ray microscopy is really suitable for this purpose.", 
    "editor": [
      {
        "familyName": "Schmahl", 
        "givenName": "G\u00fcnter", 
        "type": "Person"
      }, 
      {
        "familyName": "Rudolph", 
        "givenName": "Dietbert", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-540-38833-3_27", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-662-13547-1", 
        "978-3-540-38833-3"
      ], 
      "name": "X-Ray Microscopy", 
      "type": "Book"
    }, 
    "name": "Photoelectron X-Ray Microscopy: Recent Developments", 
    "pagination": "251-260", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-540-38833-3_27"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "2e6542f732d4af2b99ad5719a0b349a0079cbb535f89716a59c8e0f62fadf25f"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1009739000"
        ]
      }
    ], 
    "publisher": {
      "location": "Berlin, Heidelberg", 
      "name": "Springer Berlin Heidelberg", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-540-38833-3_27", 
      "https://app.dimensions.ai/details/publication/pub.1009739000"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T23:50", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8697_00000249.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-3-540-38833-3_27"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27'


 

This table displays all metadata directly associated to this object as RDF triples.

99 TRIPLES      23 PREDICATES      33 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-540-38833-3_27 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author N55d41f818c2e49f6be706bde7015bb91
4 schema:citation sg:pub.10.1007/bf01341344
5 https://doi.org/10.1063/1.1136565
6 https://doi.org/10.1063/1.323938
7 https://doi.org/10.1063/1.329789
8 https://doi.org/10.1111/j.1749-6632.1980.tb47229.x
9 https://doi.org/10.1111/j.1749-6632.1980.tb47234.x
10 schema:datePublished 1984
11 schema:datePublishedReg 1984-01-01
12 schema:description Using absorption edges for contrast enhancement or microchemical analysis has been often claimed as one of the main advantages of the soft x-ray microscopy; the K edges of carbon to aluminium and L23 edges of phosphorus to bromine are located in the 0, 8–9 nm wavelength range which is very favourable to image biological objects. But in practice, this opportunity has been very seldom used [26.1]. As a matter of fact, none of the common techniques of x-ray microscopy is really suitable for this purpose.
13 schema:editor Ndd702ffe767043c9b6e56817d231e1d8
14 schema:genre chapter
15 schema:inLanguage en
16 schema:isAccessibleForFree false
17 schema:isPartOf N7d2bb06aa5b74426becffdcdd080361d
18 schema:name Photoelectron X-Ray Microscopy: Recent Developments
19 schema:pagination 251-260
20 schema:productId N23e7cc3dddf54a199d82aab54ed010d0
21 N304fe974b0ee4c09be05a6681e4e8564
22 N34e196c2f3534279a871b719da70ccc5
23 schema:publisher Nf074cc735dd34f8eaff271647bec4a02
24 schema:sameAs https://app.dimensions.ai/details/publication/pub.1009739000
25 https://doi.org/10.1007/978-3-540-38833-3_27
26 schema:sdDatePublished 2019-04-15T23:50
27 schema:sdLicense https://scigraph.springernature.com/explorer/license/
28 schema:sdPublisher N695b9244a762431494dfdd4e46c2caa3
29 schema:url http://link.springer.com/10.1007/978-3-540-38833-3_27
30 sgo:license sg:explorer/license/
31 sgo:sdDataset chapters
32 rdf:type schema:Chapter
33 N23e7cc3dddf54a199d82aab54ed010d0 schema:name dimensions_id
34 schema:value pub.1009739000
35 rdf:type schema:PropertyValue
36 N304fe974b0ee4c09be05a6681e4e8564 schema:name readcube_id
37 schema:value 2e6542f732d4af2b99ad5719a0b349a0079cbb535f89716a59c8e0f62fadf25f
38 rdf:type schema:PropertyValue
39 N34e196c2f3534279a871b719da70ccc5 schema:name doi
40 schema:value 10.1007/978-3-540-38833-3_27
41 rdf:type schema:PropertyValue
42 N4f8ef994f7f142a6862bbe8b89366832 schema:familyName Rudolph
43 schema:givenName Dietbert
44 rdf:type schema:Person
45 N525e42809b8f4668a1d8a1f5c0ba99fc schema:familyName Schmahl
46 schema:givenName Günter
47 rdf:type schema:Person
48 N55d41f818c2e49f6be706bde7015bb91 rdf:first sg:person.01033147151.02
49 rdf:rest N81bf5f88d14f47a49c8ff32507fdcd76
50 N695b9244a762431494dfdd4e46c2caa3 schema:name Springer Nature - SN SciGraph project
51 rdf:type schema:Organization
52 N7d2bb06aa5b74426becffdcdd080361d schema:isbn 978-3-540-38833-3
53 978-3-662-13547-1
54 schema:name X-Ray Microscopy
55 rdf:type schema:Book
56 N81bf5f88d14f47a49c8ff32507fdcd76 rdf:first sg:person.010262362145.29
57 rdf:rest rdf:nil
58 Ndd702ffe767043c9b6e56817d231e1d8 rdf:first N525e42809b8f4668a1d8a1f5c0ba99fc
59 rdf:rest Ned8a235085bb4fad83487d2c88121b3a
60 Ned8a235085bb4fad83487d2c88121b3a rdf:first N4f8ef994f7f142a6862bbe8b89366832
61 rdf:rest rdf:nil
62 Nf074cc735dd34f8eaff271647bec4a02 schema:location Berlin, Heidelberg
63 schema:name Springer Berlin Heidelberg
64 rdf:type schema:Organisation
65 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
66 schema:name Physical Sciences
67 rdf:type schema:DefinedTerm
68 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
69 schema:name Other Physical Sciences
70 rdf:type schema:DefinedTerm
71 sg:person.010262362145.29 schema:affiliation https://www.grid.ac/institutes/grid.425181.b
72 schema:familyName Lowenthal
73 schema:givenName S.
74 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010262362145.29
75 rdf:type schema:Person
76 sg:person.01033147151.02 schema:affiliation https://www.grid.ac/institutes/grid.5842.b
77 schema:familyName Polack
78 schema:givenName F.
79 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01033147151.02
80 rdf:type schema:Person
81 sg:pub.10.1007/bf01341344 schema:sameAs https://app.dimensions.ai/details/publication/pub.1026774349
82 https://doi.org/10.1007/bf01341344
83 rdf:type schema:CreativeWork
84 https://doi.org/10.1063/1.1136565 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057663752
85 rdf:type schema:CreativeWork
86 https://doi.org/10.1063/1.323938 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057922949
87 rdf:type schema:CreativeWork
88 https://doi.org/10.1063/1.329789 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057933101
89 rdf:type schema:CreativeWork
90 https://doi.org/10.1111/j.1749-6632.1980.tb47229.x schema:sameAs https://app.dimensions.ai/details/publication/pub.1049958769
91 rdf:type schema:CreativeWork
92 https://doi.org/10.1111/j.1749-6632.1980.tb47234.x schema:sameAs https://app.dimensions.ai/details/publication/pub.1031130069
93 rdf:type schema:CreativeWork
94 https://www.grid.ac/institutes/grid.425181.b schema:alternateName Institut d’Optique Graduate School
95 schema:name Institut d’Optique, B.P. 43, F-91406 Orsay, France
96 rdf:type schema:Organization
97 https://www.grid.ac/institutes/grid.5842.b schema:alternateName University of Paris-Sud
98 schema:name L.U.R.E., Bat. 209 C, Université Paris-Sud, F-91405 Orsay, France
99 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...