Photoelectron X-Ray Microscopy: Recent Developments View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1984

AUTHORS

F. Polack , S. Lowenthal

ABSTRACT

Using absorption edges for contrast enhancement or microchemical analysis has been often claimed as one of the main advantages of the soft x-ray microscopy; the K edges of carbon to aluminium and L23 edges of phosphorus to bromine are located in the 0, 8–9 nm wavelength range which is very favourable to image biological objects. But in practice, this opportunity has been very seldom used [26.1]. As a matter of fact, none of the common techniques of x-ray microscopy is really suitable for this purpose. More... »

PAGES

251-260

Book

TITLE

X-Ray Microscopy

ISBN

978-3-662-13547-1
978-3-540-38833-3

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27

DOI

http://dx.doi.org/10.1007/978-3-540-38833-3_27

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1009739000


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