Photoelectron X-Ray Microscopy: Recent Developments View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1984

AUTHORS

F. Polack , S. Lowenthal

ABSTRACT

Using absorption edges for contrast enhancement or microchemical analysis has been often claimed as one of the main advantages of the soft x-ray microscopy; the K edges of carbon to aluminium and L23 edges of phosphorus to bromine are located in the 0, 8–9 nm wavelength range which is very favourable to image biological objects. But in practice, this opportunity has been very seldom used [26.1]. As a matter of fact, none of the common techniques of x-ray microscopy is really suitable for this purpose. More... »

PAGES

251-260

References to SciGraph publications

  • 1957-04. Röntgen-Bildwandler-Mikroskopie in ZEITSCHRIFT FÜR PHYSIK
  • Book

    TITLE

    X-Ray Microscopy

    ISBN

    978-3-662-13547-1
    978-3-540-38833-3

    Identifiers

    URI

    http://scigraph.springernature.com/pub.10.1007/978-3-540-38833-3_27

    DOI

    http://dx.doi.org/10.1007/978-3-540-38833-3_27

    DIMENSIONS

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