In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2018

AUTHORS

T. A. Pikuz , A. Ya. Faenov , T. Matsuoka , B. Albertazzi , N. Ozaki , N. Hartely , O. Muray Ricardo Arturo , T. Yabuuchi , H. Habara , S. Matsuyama , K. Yamauchi , Y. Inubushi , T. Togashi , H. Yumoto , Y. Tange , K. Tono , Y. Sato , M. Yabashi , M. Nishikino , T. Kawachi , A. Mitrofanov , S. A. Pikuz , D. Bleiner , A. Grum-Grzhimailo , N. N. Rosanov , N. V. Vysotina , M. Harmand , M. Koenig , K. A. Tanaka , T. Ishikawa , R. Kodama

ABSTRACT

We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimetres with high spatial resolution (~1 µm). In situ, 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials, is demonstrated. Also, a high spatial resolution control a quality of targets used in optical laser pump—XFEL probe HEDS experiments is proposed. More... »

PAGES

109-115

References to SciGraph publications

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-319-73025-7_17

DOI

http://dx.doi.org/10.1007/978-3-319-73025-7_17

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1101187375


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