Neutron Reflectometry View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2016-04-23

AUTHORS

Helmut Fritzsche , Frank Klose , Christine Rehm , Zin Tun , Max Wolff , Björgvin Hjörvarsson

ABSTRACT

Neutron Reflectometry (NR) is capable to determine the chemical depth profile of thin film samples from the sub-nanometer regime up to about 200 nm thickness. The high sensitivity of neutrons to hydrogen and deuterium enables NR to detect absolute hydrogen concentrations in the at.% range even in nm-thick layers. Therefore, NR is an ideal tool to study in-situ the hydrogen/deuterium absorption and desorption properties of thin films on a nanometer scale—without the need of a calibration sample. After an introduction to the NR technique and required instrumentation, this chapter provides a comprehensive overview of NR applications in various scientific areas, e.g. hydrogen absorption and desorption of Mg-based alloys and thin Nb films, electrochemical measurements on thin Zr and Ti films, and tuning of the oscillating magnetic exchange coupling in Fe/V and Fe/Nb multilayers with hydrogen. More... »

PAGES

115-158

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-319-22792-4_5

DOI

http://dx.doi.org/10.1007/978-3-319-22792-4_5

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1030510792


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