Engineering graphene superlattices with crystallographic orien-tation control using atomic force microscope View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2014

AUTHORS

Clara M. Almeida , Pedro M. Bede , Benjamin Fragneaud , Carlos A. Achete

ABSTRACT

In this work we present a route to engineer bilayer graphene superlattices via direct nanomanipulation of monolayer graphene sheets by the mean of atomic force microscopy. In order to obtain such structures we manipulate the graphene sheet using an A FM tip in contact mode by scanning it parallel to the edge direction. Since the static surface atomic potential created by the twisted bilayer structure depends on the mismatch angle between the top and bottom layers, we carried out lattice resolution images in order to determine the crystallographic orientation of the graphene and of the folded twisted bilayer. More... »

PAGES

3-11

Book

TITLE

Materials Challenges and Testing for Manufacturing, Mobility, Biomedical Applications and Climate

ISBN

978-3-319-11339-5
978-3-319-11340-1

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-319-11340-1_1

DOI

http://dx.doi.org/10.1007/978-3-319-11340-1_1

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1028334765


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "name": [
            "Divis\u00e3o de Metrologia de Materiais, Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), 25250-020\u00a0s\u00e3o Paulo, Brazil"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Almeida", 
        "givenName": "Clara M.", 
        "id": "sg:person.0775451301.12", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0775451301.12"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Divis\u00e3o de Metrologia de Materiais, Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), 25250-020\u00a0s\u00e3o Paulo, Brazil"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Bede", 
        "givenName": "Pedro M.", 
        "id": "sg:person.014573066013.42", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014573066013.42"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Divis\u00e3o de Metrologia de Materiais, Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), 25250-020\u00a0s\u00e3o Paulo, Brazil"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Fragneaud", 
        "givenName": "Benjamin", 
        "id": "sg:person.0661222701.94", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0661222701.94"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "name": [
            "Divis\u00e3o de Metrologia de Materiais, Instituto Nacional de Metrologia, Normaliza\u00e7\u00e3o e Qualidade Industrial (INMETRO), 25250-020\u00a0s\u00e3o Paulo, Brazil"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Achete", 
        "givenName": "Carlos A.", 
        "id": "sg:person.0655274157.23", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0655274157.23"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2014", 
    "datePublishedReg": "2014-01-01", 
    "description": "In this work we present a route to engineer bilayer graphene superlattices via direct nanomanipulation of monolayer graphene sheets by the mean of atomic force microscopy. In order to obtain such structures we manipulate the graphene sheet using an A FM tip in contact mode by scanning it parallel to the edge direction. Since the static surface atomic potential created by the twisted bilayer structure depends on the mismatch angle between the top and bottom layers, we carried out lattice resolution images in order to determine the crystallographic orientation of the graphene and of the folded twisted bilayer.", 
    "editor": [
      {
        "familyName": "Udomkichdecha", 
        "givenName": "Werasak", 
        "type": "Person"
      }, 
      {
        "familyName": "B\u00f6llinghaus", 
        "givenName": "Thomas", 
        "type": "Person"
      }, 
      {
        "familyName": "Manonukul", 
        "givenName": "Anchalee", 
        "type": "Person"
      }, 
      {
        "familyName": "Lexow", 
        "givenName": "J\u00fcrgen", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-319-11340-1_1", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-319-11339-5", 
        "978-3-319-11340-1"
      ], 
      "name": "Materials Challenges and Testing for Manufacturing, Mobility, Biomedical Applications and Climate", 
      "type": "Book"
    }, 
    "name": "Engineering graphene superlattices with crystallographic orien-tation control using atomic force microscope", 
    "pagination": "3-11", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-319-11340-1_1"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "86fb4e8402460ec2ba4b27120c5d16d3f0d09c2ea77062987726db18bd040693"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1028334765"
        ]
      }
    ], 
    "publisher": {
      "location": "Cham", 
      "name": "Springer International Publishing", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-319-11340-1_1", 
      "https://app.dimensions.ai/details/publication/pub.1028334765"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T12:17", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8663_00000048.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-3-319-11340-1_1"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-3-319-11340-1_1'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-3-319-11340-1_1'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-3-319-11340-1_1'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-3-319-11340-1_1'


 

This table displays all metadata directly associated to this object as RDF triples.

106 TRIPLES      22 PREDICATES      27 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-319-11340-1_1 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author Na9769eb68fd649edb728aa178c036c15
4 schema:datePublished 2014
5 schema:datePublishedReg 2014-01-01
6 schema:description In this work we present a route to engineer bilayer graphene superlattices via direct nanomanipulation of monolayer graphene sheets by the mean of atomic force microscopy. In order to obtain such structures we manipulate the graphene sheet using an A FM tip in contact mode by scanning it parallel to the edge direction. Since the static surface atomic potential created by the twisted bilayer structure depends on the mismatch angle between the top and bottom layers, we carried out lattice resolution images in order to determine the crystallographic orientation of the graphene and of the folded twisted bilayer.
7 schema:editor N4622ccafd60f41d6b4d048b5cc8f6c9f
8 schema:genre chapter
9 schema:inLanguage en
10 schema:isAccessibleForFree false
11 schema:isPartOf Nc7dd38b28cbd446eb6571fd8e2224ce2
12 schema:name Engineering graphene superlattices with crystallographic orien-tation control using atomic force microscope
13 schema:pagination 3-11
14 schema:productId N15b7f86674b0457a8502df6e42f3c913
15 N62b6b51d1a0a44ef8607676a5a40cfd4
16 Ne0457ebe0f69466bb7651a11f76b553e
17 schema:publisher N0dabf6448c3a4d6092ab6fccbda2c0f1
18 schema:sameAs https://app.dimensions.ai/details/publication/pub.1028334765
19 https://doi.org/10.1007/978-3-319-11340-1_1
20 schema:sdDatePublished 2019-04-15T12:17
21 schema:sdLicense https://scigraph.springernature.com/explorer/license/
22 schema:sdPublisher N152ca457d34149d4a1dbbf34c503e0d6
23 schema:url http://link.springer.com/10.1007/978-3-319-11340-1_1
24 sgo:license sg:explorer/license/
25 sgo:sdDataset chapters
26 rdf:type schema:Chapter
27 N0d0559067b4f47a8808b9f0e21297f26 rdf:first sg:person.0655274157.23
28 rdf:rest rdf:nil
29 N0dabf6448c3a4d6092ab6fccbda2c0f1 schema:location Cham
30 schema:name Springer International Publishing
31 rdf:type schema:Organisation
32 N152ca457d34149d4a1dbbf34c503e0d6 schema:name Springer Nature - SN SciGraph project
33 rdf:type schema:Organization
34 N15b7f86674b0457a8502df6e42f3c913 schema:name dimensions_id
35 schema:value pub.1028334765
36 rdf:type schema:PropertyValue
37 N232e13023bd443f19714abd9ed1852b1 rdf:first sg:person.0661222701.94
38 rdf:rest N0d0559067b4f47a8808b9f0e21297f26
39 N43366328ab124181b751bf3d4aac266d schema:name Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO), 25250-020 são Paulo, Brazil
40 rdf:type schema:Organization
41 N4622ccafd60f41d6b4d048b5cc8f6c9f rdf:first Nfc5f0ff9998a44cfa2abfcc6c9bd199f
42 rdf:rest Nc2126c6a36584f49b27e98f404489ef4
43 N5264e601678a4dd98a1856574b77a84b rdf:first Nd6d6503441984c4da25ca6f116d7c3fd
44 rdf:rest rdf:nil
45 N54fd4b1f058541d6b8ebdf449afd36d2 schema:name Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO), 25250-020 são Paulo, Brazil
46 rdf:type schema:Organization
47 N62b6b51d1a0a44ef8607676a5a40cfd4 schema:name doi
48 schema:value 10.1007/978-3-319-11340-1_1
49 rdf:type schema:PropertyValue
50 N970c4cda27454413be923dc1b8dc68b4 schema:familyName Manonukul
51 schema:givenName Anchalee
52 rdf:type schema:Person
53 Na9769eb68fd649edb728aa178c036c15 rdf:first sg:person.0775451301.12
54 rdf:rest Nf8759d5e875d4779a44e4243643d65fb
55 Nc2126c6a36584f49b27e98f404489ef4 rdf:first Nfc9722f132494ddc85efa8873e52c7d8
56 rdf:rest Nf307040fd1ea407388c1e68d4e3139ff
57 Nc7dd38b28cbd446eb6571fd8e2224ce2 schema:isbn 978-3-319-11339-5
58 978-3-319-11340-1
59 schema:name Materials Challenges and Testing for Manufacturing, Mobility, Biomedical Applications and Climate
60 rdf:type schema:Book
61 Ncc8f5261cf30403e8f0db66b2bbe8888 schema:name Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO), 25250-020 são Paulo, Brazil
62 rdf:type schema:Organization
63 Nd6d6503441984c4da25ca6f116d7c3fd schema:familyName Lexow
64 schema:givenName Jürgen
65 rdf:type schema:Person
66 Ne0457ebe0f69466bb7651a11f76b553e schema:name readcube_id
67 schema:value 86fb4e8402460ec2ba4b27120c5d16d3f0d09c2ea77062987726db18bd040693
68 rdf:type schema:PropertyValue
69 Nedcd64a364d145e29320f901942f1afa schema:name Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO), 25250-020 são Paulo, Brazil
70 rdf:type schema:Organization
71 Nf307040fd1ea407388c1e68d4e3139ff rdf:first N970c4cda27454413be923dc1b8dc68b4
72 rdf:rest N5264e601678a4dd98a1856574b77a84b
73 Nf8759d5e875d4779a44e4243643d65fb rdf:first sg:person.014573066013.42
74 rdf:rest N232e13023bd443f19714abd9ed1852b1
75 Nfc5f0ff9998a44cfa2abfcc6c9bd199f schema:familyName Udomkichdecha
76 schema:givenName Werasak
77 rdf:type schema:Person
78 Nfc9722f132494ddc85efa8873e52c7d8 schema:familyName Böllinghaus
79 schema:givenName Thomas
80 rdf:type schema:Person
81 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
82 schema:name Physical Sciences
83 rdf:type schema:DefinedTerm
84 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
85 schema:name Other Physical Sciences
86 rdf:type schema:DefinedTerm
87 sg:person.014573066013.42 schema:affiliation Ncc8f5261cf30403e8f0db66b2bbe8888
88 schema:familyName Bede
89 schema:givenName Pedro M.
90 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014573066013.42
91 rdf:type schema:Person
92 sg:person.0655274157.23 schema:affiliation N43366328ab124181b751bf3d4aac266d
93 schema:familyName Achete
94 schema:givenName Carlos A.
95 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0655274157.23
96 rdf:type schema:Person
97 sg:person.0661222701.94 schema:affiliation N54fd4b1f058541d6b8ebdf449afd36d2
98 schema:familyName Fragneaud
99 schema:givenName Benjamin
100 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0661222701.94
101 rdf:type schema:Person
102 sg:person.0775451301.12 schema:affiliation Nedcd64a364d145e29320f901942f1afa
103 schema:familyName Almeida
104 schema:givenName Clara M.
105 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.0775451301.12
106 rdf:type schema:Person
 




Preview window. Press ESC to close (or click here)


...