Trace-Based Post-Silicon Validation for VLSI Circuits View Full Text


Ontology type: schema:Book     


Book Info

DATE

2014

GENRE

Monograph

AUTHORS

Xiao Liu , Qiang Xu

PUBLISHER

Springer International Publishing

ABSTRACT

N/A

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-319-00533-1

DOI

http://dx.doi.org/10.1007/978-3-319-00533-1

ISBN

978-3-319-00532-4 | 978-3-319-00533-1

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1011682129


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