Actual Problems of Circuit Simulation in Industry View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2003

AUTHORS

Diana Estévez Schwarz , Uwe Feldmann

ABSTRACT

In the first part of this article actual trends in microelectronics are highlighted. These give rise to identify some topics of mathematical research, which are desirable to be solved in order to cope with future circuit simulation problems.Parts of this research — which are fairly beyond the scope of industrial activities — are carried out by university partners, and are reported in other contributions to this book. Other parts, however, can only be pursued in close contacts to applications, which makes them better suited for industrial research. As an example, we will focus in the second part of this paper on actual own work on diagnosis. We give an overview of attempts to provide user oriented diagnostics in case of faulty circuit models, problems with coupling structural and functional descriptions, and failure of numerical integration due to high DAE index. More... »

PAGES

83-99

Book

TITLE

Modeling, Simulation, and Optimization of Integrated Circuits

ISBN

978-3-0348-9426-5
978-3-0348-8065-7

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-3-0348-8065-7_6

DOI

http://dx.doi.org/10.1007/978-3-0348-8065-7_6

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1000791946


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information and Computing Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0801", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Artificial Intelligence and Image Processing", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Memory Products, Infineon Technologies, Balanstr. 73, D-81541, M\u00fcnchen, Germany", 
          "id": "http://www.grid.ac/institutes/grid.410337.2", 
          "name": [
            "Memory Products, Infineon Technologies, Balanstr. 73, D-81541, M\u00fcnchen, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Schwarz", 
        "givenName": "Diana Est\u00e9vez", 
        "id": "sg:person.014256551033.47", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014256551033.47"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "Memory Products, Infineon Technologies, Balanstr. 73, D-81541, M\u00fcnchen, Germany", 
          "id": "http://www.grid.ac/institutes/grid.410337.2", 
          "name": [
            "Memory Products, Infineon Technologies, Balanstr. 73, D-81541, M\u00fcnchen, Germany"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Feldmann", 
        "givenName": "Uwe", 
        "id": "sg:person.010662756515.87", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010662756515.87"
        ], 
        "type": "Person"
      }
    ], 
    "datePublished": "2003", 
    "datePublishedReg": "2003-01-01", 
    "description": "In the first part of this article actual trends in microelectronics are highlighted. These give rise to identify some topics of mathematical research, which are desirable to be solved in order to cope with future circuit simulation problems.Parts of this research \u2014 which are fairly beyond the scope of industrial activities \u2014 are carried out by university partners, and are reported in other contributions to this book. Other parts, however, can only be pursued in close contacts to applications, which makes them better suited for industrial research. As an example, we will focus in the second part of this paper on actual own work on diagnosis. We give an overview of attempts to provide user oriented diagnostics in case of faulty circuit models, problems with coupling structural and functional descriptions, and failure of numerical integration due to high DAE index.", 
    "editor": [
      {
        "familyName": "Antreich", 
        "givenName": "Kurt", 
        "type": "Person"
      }, 
      {
        "familyName": "Bulirsch", 
        "givenName": "Roland", 
        "type": "Person"
      }, 
      {
        "familyName": "Gilg", 
        "givenName": "Albert", 
        "type": "Person"
      }, 
      {
        "familyName": "Rentrop", 
        "givenName": "Peter", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-3-0348-8065-7_6", 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-3-0348-9426-5", 
        "978-3-0348-8065-7"
      ], 
      "name": "Modeling, Simulation, and Optimization of Integrated Circuits", 
      "type": "Book"
    }, 
    "keywords": [
      "circuit simulation problems", 
      "mathematical research", 
      "DAE index", 
      "simulation problems", 
      "numerical integration", 
      "circuit simulation", 
      "circuit model", 
      "problem", 
      "actual problem", 
      "second part", 
      "first part", 
      "functional description", 
      "simulations", 
      "microelectronics", 
      "description", 
      "model", 
      "overview of attempts", 
      "actual trends", 
      "applications", 
      "industrial research", 
      "order", 
      "part", 
      "cases", 
      "work", 
      "integration", 
      "contribution", 
      "diagnostics", 
      "topic", 
      "rise", 
      "overview", 
      "own work", 
      "research", 
      "book", 
      "users", 
      "contact", 
      "scope", 
      "index", 
      "attempt", 
      "industry", 
      "trends", 
      "industrial activities", 
      "failure", 
      "close contact", 
      "university partners", 
      "example", 
      "activity", 
      "partners", 
      "diagnosis", 
      "paper"
    ], 
    "name": "Actual Problems of Circuit Simulation in Industry", 
    "pagination": "83-99", 
    "productId": [
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1000791946"
        ]
      }, 
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-3-0348-8065-7_6"
        ]
      }
    ], 
    "publisher": {
      "name": "Springer Nature", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-3-0348-8065-7_6", 
      "https://app.dimensions.ai/details/publication/pub.1000791946"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2022-09-02T16:14", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-springernature-scigraph/baseset/20220902/entities/gbq_results/chapter/chapter_319.jsonl", 
    "type": "Chapter", 
    "url": "https://doi.org/10.1007/978-3-0348-8065-7_6"
  }
]
 

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This table displays all metadata directly associated to this object as RDF triples.

130 TRIPLES      22 PREDICATES      74 URIs      67 LITERALS      7 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-3-0348-8065-7_6 schema:about anzsrc-for:08
2 anzsrc-for:0801
3 schema:author N2f4c26a243c64b5ea2913dfd507fb642
4 schema:datePublished 2003
5 schema:datePublishedReg 2003-01-01
6 schema:description In the first part of this article actual trends in microelectronics are highlighted. These give rise to identify some topics of mathematical research, which are desirable to be solved in order to cope with future circuit simulation problems.Parts of this research — which are fairly beyond the scope of industrial activities — are carried out by university partners, and are reported in other contributions to this book. Other parts, however, can only be pursued in close contacts to applications, which makes them better suited for industrial research. As an example, we will focus in the second part of this paper on actual own work on diagnosis. We give an overview of attempts to provide user oriented diagnostics in case of faulty circuit models, problems with coupling structural and functional descriptions, and failure of numerical integration due to high DAE index.
7 schema:editor N57f9c7f97a454dbd8c437e9a6f432ed6
8 schema:genre chapter
9 schema:isAccessibleForFree false
10 schema:isPartOf Ndee904acb25e49f28c282adedae49424
11 schema:keywords DAE index
12 activity
13 actual problem
14 actual trends
15 applications
16 attempt
17 book
18 cases
19 circuit model
20 circuit simulation
21 circuit simulation problems
22 close contact
23 contact
24 contribution
25 description
26 diagnosis
27 diagnostics
28 example
29 failure
30 first part
31 functional description
32 index
33 industrial activities
34 industrial research
35 industry
36 integration
37 mathematical research
38 microelectronics
39 model
40 numerical integration
41 order
42 overview
43 overview of attempts
44 own work
45 paper
46 part
47 partners
48 problem
49 research
50 rise
51 scope
52 second part
53 simulation problems
54 simulations
55 topic
56 trends
57 university partners
58 users
59 work
60 schema:name Actual Problems of Circuit Simulation in Industry
61 schema:pagination 83-99
62 schema:productId N74718d17ad674787b9feef21bb6e6f06
63 Ncc88a7def78544a58bb34c2160052c98
64 schema:publisher Nca7903f1118748d4ad738ac1f306f276
65 schema:sameAs https://app.dimensions.ai/details/publication/pub.1000791946
66 https://doi.org/10.1007/978-3-0348-8065-7_6
67 schema:sdDatePublished 2022-09-02T16:14
68 schema:sdLicense https://scigraph.springernature.com/explorer/license/
69 schema:sdPublisher Ne5bf415e229d4105b83a5671ab2930d9
70 schema:url https://doi.org/10.1007/978-3-0348-8065-7_6
71 sgo:license sg:explorer/license/
72 sgo:sdDataset chapters
73 rdf:type schema:Chapter
74 N183771cab2514e8c9e1c1a1e71ac895d schema:familyName Bulirsch
75 schema:givenName Roland
76 rdf:type schema:Person
77 N25e0bca1fc5444bfb2d877c5e68c7c60 schema:familyName Gilg
78 schema:givenName Albert
79 rdf:type schema:Person
80 N2f4c26a243c64b5ea2913dfd507fb642 rdf:first sg:person.014256551033.47
81 rdf:rest N4f9c604acee649e2a94cc586c7ae61bb
82 N48ecad4d4cb149568017bb40b36bd86d rdf:first N25e0bca1fc5444bfb2d877c5e68c7c60
83 rdf:rest N947ada146fa540c5b763ffefdf23e357
84 N4f9c604acee649e2a94cc586c7ae61bb rdf:first sg:person.010662756515.87
85 rdf:rest rdf:nil
86 N57f9c7f97a454dbd8c437e9a6f432ed6 rdf:first N8c30b656c82047549902ab069d018332
87 rdf:rest N84374f42e5b140be92b3da043e9e956f
88 N74718d17ad674787b9feef21bb6e6f06 schema:name doi
89 schema:value 10.1007/978-3-0348-8065-7_6
90 rdf:type schema:PropertyValue
91 N84374f42e5b140be92b3da043e9e956f rdf:first N183771cab2514e8c9e1c1a1e71ac895d
92 rdf:rest N48ecad4d4cb149568017bb40b36bd86d
93 N8c30b656c82047549902ab069d018332 schema:familyName Antreich
94 schema:givenName Kurt
95 rdf:type schema:Person
96 N947ada146fa540c5b763ffefdf23e357 rdf:first Nc8b5dda20bf34886928188a6940bab8e
97 rdf:rest rdf:nil
98 Nc8b5dda20bf34886928188a6940bab8e schema:familyName Rentrop
99 schema:givenName Peter
100 rdf:type schema:Person
101 Nca7903f1118748d4ad738ac1f306f276 schema:name Springer Nature
102 rdf:type schema:Organisation
103 Ncc88a7def78544a58bb34c2160052c98 schema:name dimensions_id
104 schema:value pub.1000791946
105 rdf:type schema:PropertyValue
106 Ndee904acb25e49f28c282adedae49424 schema:isbn 978-3-0348-8065-7
107 978-3-0348-9426-5
108 schema:name Modeling, Simulation, and Optimization of Integrated Circuits
109 rdf:type schema:Book
110 Ne5bf415e229d4105b83a5671ab2930d9 schema:name Springer Nature - SN SciGraph project
111 rdf:type schema:Organization
112 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
113 schema:name Information and Computing Sciences
114 rdf:type schema:DefinedTerm
115 anzsrc-for:0801 schema:inDefinedTermSet anzsrc-for:
116 schema:name Artificial Intelligence and Image Processing
117 rdf:type schema:DefinedTerm
118 sg:person.010662756515.87 schema:affiliation grid-institutes:grid.410337.2
119 schema:familyName Feldmann
120 schema:givenName Uwe
121 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010662756515.87
122 rdf:type schema:Person
123 sg:person.014256551033.47 schema:affiliation grid-institutes:grid.410337.2
124 schema:familyName Schwarz
125 schema:givenName Diana Estévez
126 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.014256551033.47
127 rdf:type schema:Person
128 grid-institutes:grid.410337.2 schema:alternateName Memory Products, Infineon Technologies, Balanstr. 73, D-81541, München, Germany
129 schema:name Memory Products, Infineon Technologies, Balanstr. 73, D-81541, München, Germany
130 rdf:type schema:Organization
 




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