Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1989

AUTHORS

S. H. Liou , N. J. Ianno , B. Johs , D. Thompson , D. Meyer , John A. Woollam

ABSTRACT

Pulsed Laser Evaporation (PLE) has been shown to produce superconducting films of excellent quality. We will be discussing the results obtained from the PLE of Tl-Ba-Ca-Cu-O using a frequency doubled Nd:YAG laser operating at 532 mn. Films were deposited on SrTiO3, MgO, yttrium stabilized ZrO2, and polycrystalline Al2O3. Nearly single phase films of Tl2Ba2Ca2Cu3O10 on MgO were routinely obtained. The best films exhibited a superconducting transition onset temperature of about 125K and zero resistance at 110K. The films had a c-axis orientation perpendicular to the substrates. X-ray microprobe fluorescence measurements indicate that a typical composition of the films is Tl0.66Ba1.77Ca1.46Cu3Ox, which is low in Ti compared to that expected for the 2:2:2:3 phase. The typical grain size is greater than 10 μm as revealed by scanning electron microscopy. More... »

PAGES

35-43

Book

TITLE

Science and Technology of Thin Film Superconductors

ISBN

978-1-4684-5660-8
978-1-4684-5658-5

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4684-5658-5_5

DOI

http://dx.doi.org/10.1007/978-1-4684-5658-5_5

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1004563714


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0912", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Materials Engineering", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/09", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Engineering", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska\u00a068588-0111, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Liou", 
        "givenName": "S. H.", 
        "id": "sg:person.01332217324.33", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01332217324.33"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Electrical Engineering, University of Nebraska \u2014 Lincoln, Lincoln, Nebraska\u00a068588-0511, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Ianno", 
        "givenName": "N. J.", 
        "id": "sg:person.011141132525.08", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011141132525.08"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Electrical Engineering, University of Nebraska \u2014 Lincoln, Lincoln, Nebraska\u00a068588-0511, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Johs", 
        "givenName": "B.", 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Electrical Engineering, University of Nebraska \u2014 Lincoln, Lincoln, Nebraska\u00a068588-0511, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Thompson", 
        "givenName": "D.", 
        "id": "sg:person.016403460626.32", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016403460626.32"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Electrical Engineering, University of Nebraska \u2014 Lincoln, Lincoln, Nebraska\u00a068588-0511, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Meyer", 
        "givenName": "D.", 
        "id": "sg:person.015042776350.48", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015042776350.48"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Nebraska\u2013Lincoln", 
          "id": "https://www.grid.ac/institutes/grid.24434.35", 
          "name": [
            "Department of Electrical Engineering, University of Nebraska \u2014 Lincoln, Lincoln, Nebraska\u00a068588-0511, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Woollam", 
        "givenName": "John A.", 
        "id": "sg:person.015162055621.34", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015162055621.34"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0040-6090(87)90047-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1004222395"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0040-6090(87)90047-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1004222395"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0375-9601(88)90071-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012639991"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0375-9601(88)90071-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1012639991"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf01728682", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1016983818", 
          "https://doi.org/10.1007/bf01728682"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "sg:pub.10.1007/bf01728682", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1016983818", 
          "https://doi.org/10.1007/bf01728682"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100155", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057647748"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100159", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057647752"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100501", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648087"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100585", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648171"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100599", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648185"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100604", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648190"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100627", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648213"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.100646", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1057648232"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.95898", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058136034"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.98307", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058138409"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.98366", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058138468"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.99228", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058139322"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.99480", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058139570"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.99909", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058139983"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.60.2539", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060797115"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1103/physrevlett.60.2539", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1060797115"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1116/1.574032", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1062184079"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1143/jjap.27.l849", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1063043902"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1989", 
    "datePublishedReg": "1989-01-01", 
    "description": "Pulsed Laser Evaporation (PLE) has been shown to produce superconducting films of excellent quality. We will be discussing the results obtained from the PLE of Tl-Ba-Ca-Cu-O using a frequency doubled Nd:YAG laser operating at 532 mn. Films were deposited on SrTiO3, MgO, yttrium stabilized ZrO2, and polycrystalline Al2O3. Nearly single phase films of Tl2Ba2Ca2Cu3O10 on MgO were routinely obtained. The best films exhibited a superconducting transition onset temperature of about 125K and zero resistance at 110K. The films had a c-axis orientation perpendicular to the substrates. X-ray microprobe fluorescence measurements indicate that a typical composition of the films is Tl0.66Ba1.77Ca1.46Cu3Ox, which is low in Ti compared to that expected for the 2:2:2:3 phase. The typical grain size is greater than 10 \u03bcm as revealed by scanning electron microscopy.", 
    "editor": [
      {
        "familyName": "McConnell", 
        "givenName": "Robert D.", 
        "type": "Person"
      }, 
      {
        "familyName": "Wolf", 
        "givenName": "Stuart A.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-1-4684-5658-5_5", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-1-4684-5660-8", 
        "978-1-4684-5658-5"
      ], 
      "name": "Science and Technology of Thin Film Superconductors", 
      "type": "Book"
    }, 
    "name": "Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films", 
    "pagination": "35-43", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-1-4684-5658-5_5"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "15bf5981e75f89c42f85ae72e6eb02e2befd90c9bb2344e151ae30ea6cb0f972"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1004563714"
        ]
      }
    ], 
    "publisher": {
      "location": "Boston, MA", 
      "name": "Springer US", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-1-4684-5658-5_5", 
      "https://app.dimensions.ai/details/publication/pub.1004563714"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T10:30", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8659_00000245.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-1-4684-5658-5_5"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-1-4684-5658-5_5'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-1-4684-5658-5_5'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-1-4684-5658-5_5'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-1-4684-5658-5_5'


 

This table displays all metadata directly associated to this object as RDF triples.

166 TRIPLES      23 PREDICATES      47 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-1-4684-5658-5_5 schema:about anzsrc-for:09
2 anzsrc-for:0912
3 schema:author N251dbae0bd554b9f87570f8969406544
4 schema:citation sg:pub.10.1007/bf01728682
5 https://doi.org/10.1016/0040-6090(87)90047-2
6 https://doi.org/10.1016/0375-9601(88)90071-0
7 https://doi.org/10.1063/1.100155
8 https://doi.org/10.1063/1.100159
9 https://doi.org/10.1063/1.100501
10 https://doi.org/10.1063/1.100585
11 https://doi.org/10.1063/1.100599
12 https://doi.org/10.1063/1.100604
13 https://doi.org/10.1063/1.100627
14 https://doi.org/10.1063/1.100646
15 https://doi.org/10.1063/1.95898
16 https://doi.org/10.1063/1.98307
17 https://doi.org/10.1063/1.98366
18 https://doi.org/10.1063/1.99228
19 https://doi.org/10.1063/1.99480
20 https://doi.org/10.1063/1.99909
21 https://doi.org/10.1103/physrevlett.60.2539
22 https://doi.org/10.1116/1.574032
23 https://doi.org/10.1143/jjap.27.l849
24 schema:datePublished 1989
25 schema:datePublishedReg 1989-01-01
26 schema:description Pulsed Laser Evaporation (PLE) has been shown to produce superconducting films of excellent quality. We will be discussing the results obtained from the PLE of Tl-Ba-Ca-Cu-O using a frequency doubled Nd:YAG laser operating at 532 mn. Films were deposited on SrTiO3, MgO, yttrium stabilized ZrO2, and polycrystalline Al2O3. Nearly single phase films of Tl2Ba2Ca2Cu3O10 on MgO were routinely obtained. The best films exhibited a superconducting transition onset temperature of about 125K and zero resistance at 110K. The films had a c-axis orientation perpendicular to the substrates. X-ray microprobe fluorescence measurements indicate that a typical composition of the films is Tl0.66Ba1.77Ca1.46Cu3Ox, which is low in Ti compared to that expected for the 2:2:2:3 phase. The typical grain size is greater than 10 μm as revealed by scanning electron microscopy.
27 schema:editor N90bca0852271446291924ad127dc1c07
28 schema:genre chapter
29 schema:inLanguage en
30 schema:isAccessibleForFree false
31 schema:isPartOf N4b09c8c7824d4b5a914921584660310c
32 schema:name Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films
33 schema:pagination 35-43
34 schema:productId N3063ed3026784983abc76efa93adfd3d
35 N7a2ba14634a64d7eb16f3a68cde61c62
36 Ne3d201105e9c4fa7a3e911d4842606d4
37 schema:publisher Nd3f5dccdd2e14e648c4c361e22b9a65c
38 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004563714
39 https://doi.org/10.1007/978-1-4684-5658-5_5
40 schema:sdDatePublished 2019-04-15T10:30
41 schema:sdLicense https://scigraph.springernature.com/explorer/license/
42 schema:sdPublisher Ne8819236253e4fd998b2061a3ee522b1
43 schema:url http://link.springer.com/10.1007/978-1-4684-5658-5_5
44 sgo:license sg:explorer/license/
45 sgo:sdDataset chapters
46 rdf:type schema:Chapter
47 N0044f12c81fe4fbfbb213f0120db6b82 schema:familyName Wolf
48 schema:givenName Stuart A.
49 rdf:type schema:Person
50 N251dbae0bd554b9f87570f8969406544 rdf:first sg:person.01332217324.33
51 rdf:rest N44501e2179db44a48ee11a95ad865f0a
52 N3063ed3026784983abc76efa93adfd3d schema:name dimensions_id
53 schema:value pub.1004563714
54 rdf:type schema:PropertyValue
55 N44501e2179db44a48ee11a95ad865f0a rdf:first sg:person.011141132525.08
56 rdf:rest N790b76e0434f48b6a0de050f15b79764
57 N4b09c8c7824d4b5a914921584660310c schema:isbn 978-1-4684-5658-5
58 978-1-4684-5660-8
59 schema:name Science and Technology of Thin Film Superconductors
60 rdf:type schema:Book
61 N4d415b2f6c584faab6d5ea732b347729 rdf:first sg:person.015162055621.34
62 rdf:rest rdf:nil
63 N687ed06db3bc4d16b19348b612469e48 rdf:first N0044f12c81fe4fbfbb213f0120db6b82
64 rdf:rest rdf:nil
65 N781fe7ce61ee402596803fe3cbe6aa99 schema:familyName McConnell
66 schema:givenName Robert D.
67 rdf:type schema:Person
68 N790b76e0434f48b6a0de050f15b79764 rdf:first N838cfcb411e84b0b9adfbe63ff089850
69 rdf:rest Ne0f9dcb0ff834279908a7f1f2dabc762
70 N7a2ba14634a64d7eb16f3a68cde61c62 schema:name doi
71 schema:value 10.1007/978-1-4684-5658-5_5
72 rdf:type schema:PropertyValue
73 N838cfcb411e84b0b9adfbe63ff089850 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
74 schema:familyName Johs
75 schema:givenName B.
76 rdf:type schema:Person
77 N90bca0852271446291924ad127dc1c07 rdf:first N781fe7ce61ee402596803fe3cbe6aa99
78 rdf:rest N687ed06db3bc4d16b19348b612469e48
79 Nc9e8b2e658264e088999312c8faffacd rdf:first sg:person.015042776350.48
80 rdf:rest N4d415b2f6c584faab6d5ea732b347729
81 Nd3f5dccdd2e14e648c4c361e22b9a65c schema:location Boston, MA
82 schema:name Springer US
83 rdf:type schema:Organisation
84 Ne0f9dcb0ff834279908a7f1f2dabc762 rdf:first sg:person.016403460626.32
85 rdf:rest Nc9e8b2e658264e088999312c8faffacd
86 Ne3d201105e9c4fa7a3e911d4842606d4 schema:name readcube_id
87 schema:value 15bf5981e75f89c42f85ae72e6eb02e2befd90c9bb2344e151ae30ea6cb0f972
88 rdf:type schema:PropertyValue
89 Ne8819236253e4fd998b2061a3ee522b1 schema:name Springer Nature - SN SciGraph project
90 rdf:type schema:Organization
91 anzsrc-for:09 schema:inDefinedTermSet anzsrc-for:
92 schema:name Engineering
93 rdf:type schema:DefinedTerm
94 anzsrc-for:0912 schema:inDefinedTermSet anzsrc-for:
95 schema:name Materials Engineering
96 rdf:type schema:DefinedTerm
97 sg:person.011141132525.08 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
98 schema:familyName Ianno
99 schema:givenName N. J.
100 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.011141132525.08
101 rdf:type schema:Person
102 sg:person.01332217324.33 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
103 schema:familyName Liou
104 schema:givenName S. H.
105 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.01332217324.33
106 rdf:type schema:Person
107 sg:person.015042776350.48 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
108 schema:familyName Meyer
109 schema:givenName D.
110 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015042776350.48
111 rdf:type schema:Person
112 sg:person.015162055621.34 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
113 schema:familyName Woollam
114 schema:givenName John A.
115 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.015162055621.34
116 rdf:type schema:Person
117 sg:person.016403460626.32 schema:affiliation https://www.grid.ac/institutes/grid.24434.35
118 schema:familyName Thompson
119 schema:givenName D.
120 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.016403460626.32
121 rdf:type schema:Person
122 sg:pub.10.1007/bf01728682 schema:sameAs https://app.dimensions.ai/details/publication/pub.1016983818
123 https://doi.org/10.1007/bf01728682
124 rdf:type schema:CreativeWork
125 https://doi.org/10.1016/0040-6090(87)90047-2 schema:sameAs https://app.dimensions.ai/details/publication/pub.1004222395
126 rdf:type schema:CreativeWork
127 https://doi.org/10.1016/0375-9601(88)90071-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1012639991
128 rdf:type schema:CreativeWork
129 https://doi.org/10.1063/1.100155 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057647748
130 rdf:type schema:CreativeWork
131 https://doi.org/10.1063/1.100159 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057647752
132 rdf:type schema:CreativeWork
133 https://doi.org/10.1063/1.100501 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648087
134 rdf:type schema:CreativeWork
135 https://doi.org/10.1063/1.100585 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648171
136 rdf:type schema:CreativeWork
137 https://doi.org/10.1063/1.100599 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648185
138 rdf:type schema:CreativeWork
139 https://doi.org/10.1063/1.100604 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648190
140 rdf:type schema:CreativeWork
141 https://doi.org/10.1063/1.100627 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648213
142 rdf:type schema:CreativeWork
143 https://doi.org/10.1063/1.100646 schema:sameAs https://app.dimensions.ai/details/publication/pub.1057648232
144 rdf:type schema:CreativeWork
145 https://doi.org/10.1063/1.95898 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058136034
146 rdf:type schema:CreativeWork
147 https://doi.org/10.1063/1.98307 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058138409
148 rdf:type schema:CreativeWork
149 https://doi.org/10.1063/1.98366 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058138468
150 rdf:type schema:CreativeWork
151 https://doi.org/10.1063/1.99228 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058139322
152 rdf:type schema:CreativeWork
153 https://doi.org/10.1063/1.99480 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058139570
154 rdf:type schema:CreativeWork
155 https://doi.org/10.1063/1.99909 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058139983
156 rdf:type schema:CreativeWork
157 https://doi.org/10.1103/physrevlett.60.2539 schema:sameAs https://app.dimensions.ai/details/publication/pub.1060797115
158 rdf:type schema:CreativeWork
159 https://doi.org/10.1116/1.574032 schema:sameAs https://app.dimensions.ai/details/publication/pub.1062184079
160 rdf:type schema:CreativeWork
161 https://doi.org/10.1143/jjap.27.l849 schema:sameAs https://app.dimensions.ai/details/publication/pub.1063043902
162 rdf:type schema:CreativeWork
163 https://www.grid.ac/institutes/grid.24434.35 schema:alternateName University of Nebraska–Lincoln
164 schema:name Department of Electrical Engineering, University of Nebraska — Lincoln, Lincoln, Nebraska 68588-0511, USA
165 Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0111, USA
166 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...