Contrast of Surface Steps and Dislocations under Resonance, Non-Resonance, Bragg, and Non-Bragg Conditions View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1988

AUTHORS

Tung Hsu , L.-M. Peng

ABSTRACT

Reflection high energy electron diffraction (RHEED) and its extension, reflection electron microcsopy (REM) have been used extensively for studying the atomic structure of crystal surfaces. The Important features of REM are that surface steps as low as one atom high can be observed in real space with strong contrast and high spatial resolution. Other surface structures such as reconstructions, dislocations, stacking faults, etc., have also been observed on surfaces of bulk crystals with minimal preparation. More... »

PAGES

329-341

Book

TITLE

Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

ISBN

978-1-4684-5582-3
978-1-4684-5580-9

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4684-5580-9_24

DOI

http://dx.doi.org/10.1007/978-1-4684-5580-9_24

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1047301510


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[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0299", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Other Physical Sciences", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/02", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Physical Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "University of Utah", 
          "id": "https://www.grid.ac/institutes/grid.223827.e", 
          "name": [
            "Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah\u00a084112, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Hsu", 
        "givenName": "Tung", 
        "id": "sg:person.07464030365.26", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07464030365.26"
        ], 
        "type": "Person"
      }, 
      {
        "affiliation": {
          "alternateName": "University of Utah", 
          "id": "https://www.grid.ac/institutes/grid.223827.e", 
          "name": [
            "Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah\u00a084112, USA"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Peng", 
        "givenName": "L.-M.", 
        "id": "sg:person.010515521607.58", 
        "sameAs": [
          "https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010515521607.58"
        ], 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0739-6260(87)90053-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1014638537"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0739-6260(87)90053-0", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1014638537"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(81)90038-8", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020143272"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(81)90038-8", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1020143272"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(84)90080-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029577859"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(84)90080-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1029577859"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(84)90529-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1041883800"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(84)90529-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1041883800"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(80)90675-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1045394665"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0039-6028(80)90675-5", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1045394665"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(87)90065-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1046087934"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(87)90065-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1046087934"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0739-6260(87)90054-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1046824428"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0739-6260(87)90054-2", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1046824428"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(83)90004-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1053035626"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0304-3991(83)90004-9", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1053035626"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/jemt.1060060107", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1053701725"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1143/jpsj.49.684", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1063105434"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1988", 
    "datePublishedReg": "1988-01-01", 
    "description": "Reflection high energy electron diffraction (RHEED) and its extension, reflection electron microcsopy (REM) have been used extensively for studying the atomic structure of crystal surfaces. The Important features of REM are that surface steps as low as one atom high can be observed in real space with strong contrast and high spatial resolution. Other surface structures such as reconstructions, dislocations, stacking faults, etc., have also been observed on surfaces of bulk crystals with minimal preparation.", 
    "editor": [
      {
        "familyName": "Larsen", 
        "givenName": "P. K.", 
        "type": "Person"
      }, 
      {
        "familyName": "Dobson", 
        "givenName": "P. J.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-1-4684-5580-9_24", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-1-4684-5582-3", 
        "978-1-4684-5580-9"
      ], 
      "name": "Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces", 
      "type": "Book"
    }, 
    "name": "Contrast of Surface Steps and Dislocations under Resonance, Non-Resonance, Bragg, and Non-Bragg Conditions", 
    "pagination": "329-341", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-1-4684-5580-9_24"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "e15472a9e5ca81dd1f7fbbb821ebaff585f4583913bb09782fde152b92c34e69"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1047301510"
        ]
      }
    ], 
    "publisher": {
      "location": "Boston, MA", 
      "name": "Springer US", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-1-4684-5580-9_24", 
      "https://app.dimensions.ai/details/publication/pub.1047301510"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T14:27", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8669_00000272.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-1-4684-5580-9_24"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

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This table displays all metadata directly associated to this object as RDF triples.

107 TRIPLES      23 PREDICATES      37 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-1-4684-5580-9_24 schema:about anzsrc-for:02
2 anzsrc-for:0299
3 schema:author Nd1a987cac32a4066a94a5ad8e3ce70f5
4 schema:citation https://doi.org/10.1002/jemt.1060060107
5 https://doi.org/10.1016/0039-6028(80)90675-5
6 https://doi.org/10.1016/0039-6028(81)90038-8
7 https://doi.org/10.1016/0039-6028(84)90529-6
8 https://doi.org/10.1016/0304-3991(83)90004-9
9 https://doi.org/10.1016/0304-3991(84)90080-9
10 https://doi.org/10.1016/0304-3991(87)90065-9
11 https://doi.org/10.1016/0739-6260(87)90053-0
12 https://doi.org/10.1016/0739-6260(87)90054-2
13 https://doi.org/10.1143/jpsj.49.684
14 schema:datePublished 1988
15 schema:datePublishedReg 1988-01-01
16 schema:description Reflection high energy electron diffraction (RHEED) and its extension, reflection electron microcsopy (REM) have been used extensively for studying the atomic structure of crystal surfaces. The Important features of REM are that surface steps as low as one atom high can be observed in real space with strong contrast and high spatial resolution. Other surface structures such as reconstructions, dislocations, stacking faults, etc., have also been observed on surfaces of bulk crystals with minimal preparation.
17 schema:editor N4599470a1ba54cabb55c955860c42991
18 schema:genre chapter
19 schema:inLanguage en
20 schema:isAccessibleForFree false
21 schema:isPartOf N6bfc5c640c4a450aa3b1c836691ae243
22 schema:name Contrast of Surface Steps and Dislocations under Resonance, Non-Resonance, Bragg, and Non-Bragg Conditions
23 schema:pagination 329-341
24 schema:productId N0dcd7481fec641158e1228679567a11e
25 N802843c6cc6241ad8a1475f49aa5897d
26 N91d31445d32d4475a6b2959fa616ee07
27 schema:publisher Ne62bb4ef548a463c8737e59e31a185c8
28 schema:sameAs https://app.dimensions.ai/details/publication/pub.1047301510
29 https://doi.org/10.1007/978-1-4684-5580-9_24
30 schema:sdDatePublished 2019-04-15T14:27
31 schema:sdLicense https://scigraph.springernature.com/explorer/license/
32 schema:sdPublisher N09c2437521bb47afa44d1d0acfabf73a
33 schema:url http://link.springer.com/10.1007/978-1-4684-5580-9_24
34 sgo:license sg:explorer/license/
35 sgo:sdDataset chapters
36 rdf:type schema:Chapter
37 N09c2437521bb47afa44d1d0acfabf73a schema:name Springer Nature - SN SciGraph project
38 rdf:type schema:Organization
39 N0dcd7481fec641158e1228679567a11e schema:name readcube_id
40 schema:value e15472a9e5ca81dd1f7fbbb821ebaff585f4583913bb09782fde152b92c34e69
41 rdf:type schema:PropertyValue
42 N4599470a1ba54cabb55c955860c42991 rdf:first N9542acf2d38742be9c2a48e29d74bb82
43 rdf:rest Nb38d61c2892345739ef37f362bf8e6ca
44 N6bfc5c640c4a450aa3b1c836691ae243 schema:isbn 978-1-4684-5580-9
45 978-1-4684-5582-3
46 schema:name Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
47 rdf:type schema:Book
48 N802843c6cc6241ad8a1475f49aa5897d schema:name doi
49 schema:value 10.1007/978-1-4684-5580-9_24
50 rdf:type schema:PropertyValue
51 N91d31445d32d4475a6b2959fa616ee07 schema:name dimensions_id
52 schema:value pub.1047301510
53 rdf:type schema:PropertyValue
54 N9542acf2d38742be9c2a48e29d74bb82 schema:familyName Larsen
55 schema:givenName P. K.
56 rdf:type schema:Person
57 N994a083692af49b0aa85829e0c07addb rdf:first sg:person.010515521607.58
58 rdf:rest rdf:nil
59 Nb38d61c2892345739ef37f362bf8e6ca rdf:first Ndc997350743442c688a30e6b69e4875d
60 rdf:rest rdf:nil
61 Nd1a987cac32a4066a94a5ad8e3ce70f5 rdf:first sg:person.07464030365.26
62 rdf:rest N994a083692af49b0aa85829e0c07addb
63 Ndc997350743442c688a30e6b69e4875d schema:familyName Dobson
64 schema:givenName P. J.
65 rdf:type schema:Person
66 Ne62bb4ef548a463c8737e59e31a185c8 schema:location Boston, MA
67 schema:name Springer US
68 rdf:type schema:Organisation
69 anzsrc-for:02 schema:inDefinedTermSet anzsrc-for:
70 schema:name Physical Sciences
71 rdf:type schema:DefinedTerm
72 anzsrc-for:0299 schema:inDefinedTermSet anzsrc-for:
73 schema:name Other Physical Sciences
74 rdf:type schema:DefinedTerm
75 sg:person.010515521607.58 schema:affiliation https://www.grid.ac/institutes/grid.223827.e
76 schema:familyName Peng
77 schema:givenName L.-M.
78 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.010515521607.58
79 rdf:type schema:Person
80 sg:person.07464030365.26 schema:affiliation https://www.grid.ac/institutes/grid.223827.e
81 schema:familyName Hsu
82 schema:givenName Tung
83 schema:sameAs https://app.dimensions.ai/discover/publication?and_facet_researcher=ur.07464030365.26
84 rdf:type schema:Person
85 https://doi.org/10.1002/jemt.1060060107 schema:sameAs https://app.dimensions.ai/details/publication/pub.1053701725
86 rdf:type schema:CreativeWork
87 https://doi.org/10.1016/0039-6028(80)90675-5 schema:sameAs https://app.dimensions.ai/details/publication/pub.1045394665
88 rdf:type schema:CreativeWork
89 https://doi.org/10.1016/0039-6028(81)90038-8 schema:sameAs https://app.dimensions.ai/details/publication/pub.1020143272
90 rdf:type schema:CreativeWork
91 https://doi.org/10.1016/0039-6028(84)90529-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1041883800
92 rdf:type schema:CreativeWork
93 https://doi.org/10.1016/0304-3991(83)90004-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1053035626
94 rdf:type schema:CreativeWork
95 https://doi.org/10.1016/0304-3991(84)90080-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1029577859
96 rdf:type schema:CreativeWork
97 https://doi.org/10.1016/0304-3991(87)90065-9 schema:sameAs https://app.dimensions.ai/details/publication/pub.1046087934
98 rdf:type schema:CreativeWork
99 https://doi.org/10.1016/0739-6260(87)90053-0 schema:sameAs https://app.dimensions.ai/details/publication/pub.1014638537
100 rdf:type schema:CreativeWork
101 https://doi.org/10.1016/0739-6260(87)90054-2 schema:sameAs https://app.dimensions.ai/details/publication/pub.1046824428
102 rdf:type schema:CreativeWork
103 https://doi.org/10.1143/jpsj.49.684 schema:sameAs https://app.dimensions.ai/details/publication/pub.1063105434
104 rdf:type schema:CreativeWork
105 https://www.grid.ac/institutes/grid.223827.e schema:alternateName University of Utah
106 schema:name Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah 84112, USA
107 rdf:type schema:Organization
 




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