Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos2ϕ Method View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1997

AUTHORS

B. L. Ballard , P. K. Predecki , T. R. Watkins , K. J. Kozaczek , D. N. Braski , C. R. Hubbard

ABSTRACT

N/A

PAGES

363-370

Book

TITLE

Advances in X-Ray Analysis

ISBN

978-0-306-45803-3
978-1-4615-5377-9

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4615-5377-9_40

DOI

http://dx.doi.org/10.1007/978-1-4615-5377-9_40

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1089521318


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