Probing Technology for IC Diagnosis View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1999

AUTHORS

Christopher G. Talbot

ABSTRACT

During integrated circuit diagnosis, contact and non-contact probing serves two key functions, namely fault localization and electrical characterization. As a fault localization capability, probing is usually the technology of last resort. Systematic back-tracing through a circuit (probing from a failing output back into the circuit to isolate the origin of the failure), while inherently capable of localizing almost any failure, is tedious and often quite time consuming. Fault localization techniques such as liquid crystal, emission microscopy, electron beam and optical beam induced current or voltage alteration techniques are often easier and quicker to use (See chapters 5 and 6). While these techniques are easy to apply they do not address all types of problems. For example, in design debug applications no physical defect usually exists in the circuit and back-tracing is frequently the only practical option. The back-tracing process is often facilitated by some level of simulation, test-based pre-localization software or image-based fault localization. More... »

PAGES

113-143

Book

TITLE

Failure Analysis of Integrated Circuits

ISBN

978-1-4613-7231-8
978-1-4615-4919-2

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4615-4919-2_7

DOI

http://dx.doi.org/10.1007/978-1-4615-4919-2_7

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1035640598


Indexing Status Check whether this publication has been indexed by Scopus and Web Of Science using the SN Indexing Status Tool
Incoming Citations Browse incoming citations for this publication using opencitations.net

JSON-LD is the canonical representation for SciGraph data.

TIP: You can open this SciGraph record using an external JSON-LD service: JSON-LD Playground Google SDTT

[
  {
    "@context": "https://springernature.github.io/scigraph/jsonld/sgcontext.json", 
    "about": [
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/0801", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Artificial Intelligence and Image Processing", 
        "type": "DefinedTerm"
      }, 
      {
        "id": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/08", 
        "inDefinedTermSet": "http://purl.org/au-research/vocabulary/anzsrc-for/2008/", 
        "name": "Information and Computing Sciences", 
        "type": "DefinedTerm"
      }
    ], 
    "author": [
      {
        "affiliation": {
          "alternateName": "Schlumberger (France)", 
          "id": "https://www.grid.ac/institutes/grid.410410.0", 
          "name": [
            "Schlumberger, France"
          ], 
          "type": "Organization"
        }, 
        "familyName": "Talbot", 
        "givenName": "Christopher G.", 
        "type": "Person"
      }
    ], 
    "citation": [
      {
        "id": "https://doi.org/10.1016/0168-583x(85)90461-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1026304085"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1016/0168-583x(85)90461-6", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1026304085"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1002/sca.4950050301", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1031370342"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1063/1.99887", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058139961"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1088/0022-3735/16/4/016", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058972201"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1088/0022-3735/4/4/027", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1058974834"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1109/3.118", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1061146507"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1109/mdt.1985.294856", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1061399102"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1147/rd.342.0162", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1063181770"
        ], 
        "type": "CreativeWork"
      }, 
      {
        "id": "https://doi.org/10.1109/iedm.1996.554133", 
        "sameAs": [
          "https://app.dimensions.ai/details/publication/pub.1094739828"
        ], 
        "type": "CreativeWork"
      }
    ], 
    "datePublished": "1999", 
    "datePublishedReg": "1999-01-01", 
    "description": "During integrated circuit diagnosis, contact and non-contact probing serves two key functions, namely fault localization and electrical characterization. As a fault localization capability, probing is usually the technology of last resort. Systematic back-tracing through a circuit (probing from a failing output back into the circuit to isolate the origin of the failure), while inherently capable of localizing almost any failure, is tedious and often quite time consuming. Fault localization techniques such as liquid crystal, emission microscopy, electron beam and optical beam induced current or voltage alteration techniques are often easier and quicker to use (See chapters 5 and 6). While these techniques are easy to apply they do not address all types of problems. For example, in design debug applications no physical defect usually exists in the circuit and back-tracing is frequently the only practical option. The back-tracing process is often facilitated by some level of simulation, test-based pre-localization software or image-based fault localization.", 
    "editor": [
      {
        "familyName": "Wagner", 
        "givenName": "Lawrence C.", 
        "type": "Person"
      }
    ], 
    "genre": "chapter", 
    "id": "sg:pub.10.1007/978-1-4615-4919-2_7", 
    "inLanguage": [
      "en"
    ], 
    "isAccessibleForFree": false, 
    "isPartOf": {
      "isbn": [
        "978-1-4613-7231-8", 
        "978-1-4615-4919-2"
      ], 
      "name": "Failure Analysis of Integrated Circuits", 
      "type": "Book"
    }, 
    "name": "Probing Technology for IC Diagnosis", 
    "pagination": "113-143", 
    "productId": [
      {
        "name": "doi", 
        "type": "PropertyValue", 
        "value": [
          "10.1007/978-1-4615-4919-2_7"
        ]
      }, 
      {
        "name": "readcube_id", 
        "type": "PropertyValue", 
        "value": [
          "a9c7845253fbddf1ae1864e431f30f50f4e05fc95df78ce60aa82085084429d2"
        ]
      }, 
      {
        "name": "dimensions_id", 
        "type": "PropertyValue", 
        "value": [
          "pub.1035640598"
        ]
      }
    ], 
    "publisher": {
      "location": "Boston, MA", 
      "name": "Springer US", 
      "type": "Organisation"
    }, 
    "sameAs": [
      "https://doi.org/10.1007/978-1-4615-4919-2_7", 
      "https://app.dimensions.ai/details/publication/pub.1035640598"
    ], 
    "sdDataset": "chapters", 
    "sdDatePublished": "2019-04-15T15:22", 
    "sdLicense": "https://scigraph.springernature.com/explorer/license/", 
    "sdPublisher": {
      "name": "Springer Nature - SN SciGraph project", 
      "type": "Organization"
    }, 
    "sdSource": "s3://com-uberresearch-data-dimensions-target-20181106-alternative/cleanup/v134/2549eaecd7973599484d7c17b260dba0a4ecb94b/merge/v9/a6c9fde33151104705d4d7ff012ea9563521a3ce/jats-lookup/v90/0000000001_0000000264/records_8672_00000265.jsonl", 
    "type": "Chapter", 
    "url": "http://link.springer.com/10.1007/978-1-4615-4919-2_7"
  }
]
 

Download the RDF metadata as:  json-ld nt turtle xml License info

HOW TO GET THIS DATA PROGRAMMATICALLY:

JSON-LD is a popular format for linked data which is fully compatible with JSON.

curl -H 'Accept: application/ld+json' 'https://scigraph.springernature.com/pub.10.1007/978-1-4615-4919-2_7'

N-Triples is a line-based linked data format ideal for batch operations.

curl -H 'Accept: application/n-triples' 'https://scigraph.springernature.com/pub.10.1007/978-1-4615-4919-2_7'

Turtle is a human-readable linked data format.

curl -H 'Accept: text/turtle' 'https://scigraph.springernature.com/pub.10.1007/978-1-4615-4919-2_7'

RDF/XML is a standard XML format for linked data.

curl -H 'Accept: application/rdf+xml' 'https://scigraph.springernature.com/pub.10.1007/978-1-4615-4919-2_7'


 

This table displays all metadata directly associated to this object as RDF triples.

91 TRIPLES      23 PREDICATES      36 URIs      20 LITERALS      8 BLANK NODES

Subject Predicate Object
1 sg:pub.10.1007/978-1-4615-4919-2_7 schema:about anzsrc-for:08
2 anzsrc-for:0801
3 schema:author N106b3847a07c4a908226722811f2532c
4 schema:citation https://doi.org/10.1002/sca.4950050301
5 https://doi.org/10.1016/0168-583x(85)90461-6
6 https://doi.org/10.1063/1.99887
7 https://doi.org/10.1088/0022-3735/16/4/016
8 https://doi.org/10.1088/0022-3735/4/4/027
9 https://doi.org/10.1109/3.118
10 https://doi.org/10.1109/iedm.1996.554133
11 https://doi.org/10.1109/mdt.1985.294856
12 https://doi.org/10.1147/rd.342.0162
13 schema:datePublished 1999
14 schema:datePublishedReg 1999-01-01
15 schema:description During integrated circuit diagnosis, contact and non-contact probing serves two key functions, namely fault localization and electrical characterization. As a fault localization capability, probing is usually the technology of last resort. Systematic back-tracing through a circuit (probing from a failing output back into the circuit to isolate the origin of the failure), while inherently capable of localizing almost any failure, is tedious and often quite time consuming. Fault localization techniques such as liquid crystal, emission microscopy, electron beam and optical beam induced current or voltage alteration techniques are often easier and quicker to use (See chapters 5 and 6). While these techniques are easy to apply they do not address all types of problems. For example, in design debug applications no physical defect usually exists in the circuit and back-tracing is frequently the only practical option. The back-tracing process is often facilitated by some level of simulation, test-based pre-localization software or image-based fault localization.
16 schema:editor N77b3e260d65c405a826378990b773dce
17 schema:genre chapter
18 schema:inLanguage en
19 schema:isAccessibleForFree false
20 schema:isPartOf Ne8760239c82b4eb681cef0eb271ba341
21 schema:name Probing Technology for IC Diagnosis
22 schema:pagination 113-143
23 schema:productId N68d5e9424c9e4b35a68274ec6718c900
24 N8bd30e0cd5db49f2ac9ebfed27311a3c
25 Ncc321f05859349efbe1dc166272d9c86
26 schema:publisher N6eab64b28e0c4fc8a7cfa3269ef0414c
27 schema:sameAs https://app.dimensions.ai/details/publication/pub.1035640598
28 https://doi.org/10.1007/978-1-4615-4919-2_7
29 schema:sdDatePublished 2019-04-15T15:22
30 schema:sdLicense https://scigraph.springernature.com/explorer/license/
31 schema:sdPublisher N49329f11f385448cb5aa62c9142db753
32 schema:url http://link.springer.com/10.1007/978-1-4615-4919-2_7
33 sgo:license sg:explorer/license/
34 sgo:sdDataset chapters
35 rdf:type schema:Chapter
36 N106b3847a07c4a908226722811f2532c rdf:first N2d6973adbac0432d90f77f28a3dc5084
37 rdf:rest rdf:nil
38 N2d6973adbac0432d90f77f28a3dc5084 schema:affiliation https://www.grid.ac/institutes/grid.410410.0
39 schema:familyName Talbot
40 schema:givenName Christopher G.
41 rdf:type schema:Person
42 N49329f11f385448cb5aa62c9142db753 schema:name Springer Nature - SN SciGraph project
43 rdf:type schema:Organization
44 N68d5e9424c9e4b35a68274ec6718c900 schema:name doi
45 schema:value 10.1007/978-1-4615-4919-2_7
46 rdf:type schema:PropertyValue
47 N6eab64b28e0c4fc8a7cfa3269ef0414c schema:location Boston, MA
48 schema:name Springer US
49 rdf:type schema:Organisation
50 N77b3e260d65c405a826378990b773dce rdf:first N8981660fdc2e40448ac72ce2d0bd305c
51 rdf:rest rdf:nil
52 N8981660fdc2e40448ac72ce2d0bd305c schema:familyName Wagner
53 schema:givenName Lawrence C.
54 rdf:type schema:Person
55 N8bd30e0cd5db49f2ac9ebfed27311a3c schema:name readcube_id
56 schema:value a9c7845253fbddf1ae1864e431f30f50f4e05fc95df78ce60aa82085084429d2
57 rdf:type schema:PropertyValue
58 Ncc321f05859349efbe1dc166272d9c86 schema:name dimensions_id
59 schema:value pub.1035640598
60 rdf:type schema:PropertyValue
61 Ne8760239c82b4eb681cef0eb271ba341 schema:isbn 978-1-4613-7231-8
62 978-1-4615-4919-2
63 schema:name Failure Analysis of Integrated Circuits
64 rdf:type schema:Book
65 anzsrc-for:08 schema:inDefinedTermSet anzsrc-for:
66 schema:name Information and Computing Sciences
67 rdf:type schema:DefinedTerm
68 anzsrc-for:0801 schema:inDefinedTermSet anzsrc-for:
69 schema:name Artificial Intelligence and Image Processing
70 rdf:type schema:DefinedTerm
71 https://doi.org/10.1002/sca.4950050301 schema:sameAs https://app.dimensions.ai/details/publication/pub.1031370342
72 rdf:type schema:CreativeWork
73 https://doi.org/10.1016/0168-583x(85)90461-6 schema:sameAs https://app.dimensions.ai/details/publication/pub.1026304085
74 rdf:type schema:CreativeWork
75 https://doi.org/10.1063/1.99887 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058139961
76 rdf:type schema:CreativeWork
77 https://doi.org/10.1088/0022-3735/16/4/016 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058972201
78 rdf:type schema:CreativeWork
79 https://doi.org/10.1088/0022-3735/4/4/027 schema:sameAs https://app.dimensions.ai/details/publication/pub.1058974834
80 rdf:type schema:CreativeWork
81 https://doi.org/10.1109/3.118 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061146507
82 rdf:type schema:CreativeWork
83 https://doi.org/10.1109/iedm.1996.554133 schema:sameAs https://app.dimensions.ai/details/publication/pub.1094739828
84 rdf:type schema:CreativeWork
85 https://doi.org/10.1109/mdt.1985.294856 schema:sameAs https://app.dimensions.ai/details/publication/pub.1061399102
86 rdf:type schema:CreativeWork
87 https://doi.org/10.1147/rd.342.0162 schema:sameAs https://app.dimensions.ai/details/publication/pub.1063181770
88 rdf:type schema:CreativeWork
89 https://www.grid.ac/institutes/grid.410410.0 schema:alternateName Schlumberger (France)
90 schema:name Schlumberger, France
91 rdf:type schema:Organization
 




Preview window. Press ESC to close (or click here)


...