Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-ray Diffraction (Gixd) View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1994

AUTHORS

B. L. Ballard , P. K. Predecki , D. N. Braski

ABSTRACT

N/A

PAGES

189-196

Book

TITLE

Advances in X-Ray Analysis

ISBN

978-1-4613-6077-3
978-1-4615-2528-8

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4615-2528-8_25

DOI

http://dx.doi.org/10.1007/978-1-4615-2528-8_25

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1089529090


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