Diagnostics and Monitoring as tightly coupled to Identification View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

1998

AUTHORS

A. Benveniste , B. Delyon , M. Basseville

ABSTRACT

In this paper we give an overview of the apporach we have developed for diagnostics and model validation, based on the so-called “asymptotic local” approach in mathematical statistics. All algorithms we propose for diagnostics and model validation are tightly related to corresponding algorithms for system identification. In a first part of this paper, we analyze this relationship from the theoretical point of view: in particular we report new results to show how central limit theorems and diagnostics algorithms based on the local approach are related to each other. The second part is devoted to reporting how these results can be practically applied for real applications. More... »

PAGES

217-236

Book

TITLE

Perspectives in Control

ISBN

978-1-4471-1278-5
978-1-4471-1276-1

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4471-1276-1_16

DOI

http://dx.doi.org/10.1007/978-1-4471-1276-1_16

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1006094009


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