Nanostructural Characterization Of Amorphous Chalcogenides By X-Ray Diffraction And Positron Annihilation Techniques View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2009-01-01

AUTHORS

T. Kavetskyy , O. Shpotyuk , I. Kaban , W. Hoyer , J. Filipecki

ABSTRACT

Nanostructural features of binary As—Se(Te), pseudo-binary As2S(Se)3—Sb2S(Se)3, ternary stoichiometric As(Sb)2S3—GeS2 and non-stoichiometric As(Sb)2S3—Ge2S3 chalcogenide glasses are studied by using conventional X-ray diffraction, high-energy synchrotron X-ray diffraction and positron annihilation lifetime spectroscopy (PALS). Compositional trends of the position of the first sharp diffraction peak (FSDP) (size of nanovoids) are analyzed within the void-based model as well as cation-correlation approaches along with the PALS results. The dominant cation correlations responsible for the FSDP occurrence and sizes of nanovoids are established in dependence on the type of the glass structure. More... »

PAGES

365-370

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-1-4020-9916-8_41

DOI

http://dx.doi.org/10.1007/978-1-4020-9916-8_41

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1014091390


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