Measuring Nonlinear Refraction and Its Dispersion View Full Text


Ontology type: schema:Chapter     


Chapter Info

DATE

2009

AUTHORS

Eric W. Van Stryland , David J. Hagan

ABSTRACT

We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities. More... »

PAGES

573-591

Book

TITLE

Self-focusing: Past and Present

ISBN

978-0-387-32147-9
978-0-387-34727-1

Author Affiliations

Identifiers

URI

http://scigraph.springernature.com/pub.10.1007/978-0-387-34727-1_24

DOI

http://dx.doi.org/10.1007/978-0-387-34727-1_24

DIMENSIONS

https://app.dimensions.ai/details/publication/pub.1043470264


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